Nasuno; Hideki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nasuno; Hideki.The latest application filed is for "exposure apparatus and exposure method".

Company Profile

0.11.5

Nasuno; Hideki - Gunma JP
Nasuno; Hideki - Tokyo JP
Nasuno; Hideki - Kasugai JP
Nasuno, Hideki - Kasugai-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Exposure apparatus and exposure method Grant 9,859,099 - Yamada , et al. January 2, 2	2018-01-02
Exposure Apparatus And Exposure Method App 20160314934 - YAMADA; Akio ; et al.	2016-10-27
Electron beam detector, electron beam processing apparatus, and method of manufacturing electron beam detector Grant 8,779,378 - Abe , et al. July 15, 2	2014-07-15
Electron Beam Detector, Electron Beam Processing Apparatus, And Method Of Manufacturing Electron Beam Detector App 20140061465 - Abe; Kenji ; et al.	2014-03-06
Electron beam irradiation apparatus, electron beam exposure apparatus, and defect detection method Grant 6,784,426 - Sugiura , et al. August 31, 2	2004-08-31
Electron beam irradiation apparatus, electron beam exposure apparatus, and defect detection method App 20040079883 - Sugiura, Takayuki ; et al.	2004-04-29
Charged particle beam exposure system and method Grant 6,646,275 - Oae , et al. November 11, 2	2003-11-11
Charged particle beam exposure system and method App 20030025088 - Oae, Yoshihisa ; et al.	2003-02-06
Charged particle beam exposure system and method Grant 6,486,479 - Oae , et al. November 26, 2	2002-11-26
Charged-particle-beam exposure device and charged-particle-beam exposure method App 20010013581 - Takemoto, Akio ; et al.	2001-08-16
Charged-particle-beam exposure device and charged-particle-beam exposure method Grant 6,242,751 - Takemoto , et al. June 5, 2	2001-06-05
Method and system for exposing an exposure pattern on an object by a charged particle beam which is shaped into a plurality of beam elements Grant 6,118,129 - Oae , et al. September 12, 2	2000-09-12
Charged particle beam exposure system and method Grant 5,977,548 - Oae , et al. November 2, 1	1999-11-02
Charged-particle-beam exposure device and charged-particle-beam exposure method Grant 5,969,365 - Takemoto , et al. October 19, 1	1999-10-19
Charged particle beam exposure system and method Grant 5,614,725 - Oae , et al. March 25, 1	1997-03-25
Charged particle beam exposure system and method Grant 5,528,048 - Oae , et al. June 18, 1	1996-06-18

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