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Method for Detecting Information of an Electric Potential on a Sample and Charged Particle Beam Apparatus App 20130284921 - Yamazaki; Minoru ;   et al. | 2013-10-31 |
Method And Apparatus For Measuring Displacement Between Patterns And Scanning Electron Microscope Installing Unit For Measuring Displacement Between Patterns App 20130264479 - YAMAGUCHI; Atsuko ;   et al. | 2013-10-10 |
Motion Vector Detection Device, Motion Vector Detection Method, Frame Interpolation Device, And Frame Interpolation Method App 20130235274 - Nasu; Osamu ;   et al. | 2013-09-12 |
Method for detecting information of an electronic potential on a sample and charged particle beam apparatus Grant 8,487,250 - Yamazaki , et al. July 16, 2 | 2013-07-16 |
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Method for adjusting optical axis of charged particle radiation and charged particle radiation device Grant 8,294,118 - Kono , et al. October 23, 2 | 2012-10-23 |
Method for detecting information of an electric potential on a sample and charged particle beam apparatus Grant 8,263,934 - Yamazaki , et al. September 11, 2 | 2012-09-11 |
Frame Interpolation Apparatus And Method App 20120154675 - NASU; Osamu ;   et al. | 2012-06-21 |
Image processing apparatus for analysis of pattern matching failure Grant 8,200,006 - Ikeda , et al. June 12, 2 | 2012-06-12 |
Specimen Potential Measuring Method, And Charged Particle Beam Device App 20120119085 - Ishijima; Tatsuaki ;   et al. | 2012-05-17 |
Image Processing Apparatus And Method And Image Display Apparatus And Method App 20120099018 - Kubo; Toshiaki ;   et al. | 2012-04-26 |
Image Processing Device And Method, And Image Display Device And Method App 20120093225 - KUBO; Toshiaki ;   et al. | 2012-04-19 |
Frame Interpolation Device And Method App 20120008689 - NASU; Osamu ;   et al. | 2012-01-12 |
Sample dimension measuring method and scanning electron microscope Grant 8,080,789 - Nasu , et al. December 20, 2 | 2011-12-20 |
Image Processing Device And Method, And Image Display Device And Method App 20110298973 - KUBO; Toshiaki ;   et al. | 2011-12-08 |
Method For Adjusting Optical Axis Of Charged Particle Radiation And Charged Particle Radiation Device App 20110284759 - Kono; Akemi ;   et al. | 2011-11-24 |
Charged particle beam apparatus and control method therefor Grant 8,026,482 - Fukuda , et al. September 27, 2 | 2011-09-27 |
Charged Particle Beam System App 20110057101 - KOMURO; Osamu ;   et al. | 2011-03-10 |
Charged particle beam system Grant 7,851,754 - Komuro , et al. December 14, 2 | 2010-12-14 |
Charged particle beam apparatus Grant 7,714,288 - Yano , et al. May 11, 2 | 2010-05-11 |
Sample dimension measuring method and scanning electron microscope App 20100038535 - Nasu; Osamu ;   et al. | 2010-02-18 |
Method for measuring dimensions of sample and scanning electron microscope Grant 7,659,508 - Nasu , et al. February 9, 2 | 2010-02-09 |
Method for Detecting Information of an Electric Potential on a Sample and Charged Particle Beam Apparatus App 20090272899 - YAMAZAKI; Minoru ;   et al. | 2009-11-05 |
Image processing apparatus for analysis of pattern matching failure App 20090214122 - IKEDA; Mitsuji ;   et al. | 2009-08-27 |
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Charged Particle Beam Apparatus And Control Method Therefor App 20090140143 - FUKUDA; Muneyuki ;   et al. | 2009-06-04 |
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