Nassif; Sani R.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nassif; Sani R..The latest application filed is for "statistical design with importance sampling reuse".

Company Profile

4.82.73

Nassif; Sani R. - Austin TX
Nassif; Sani R - Austin TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Statistical design with importance sampling reuse Grant 11,372,701 - Joshi , et al. June 28, 2	2022-06-28
Translating different clinical protocols for particle therapy into a set of constraints Grant 10,737,114 - Gattiker , et al. A	2020-08-11
Statistical Design with Importance Sampling Reuse App 20190370100 - Joshi; Rajiv V. ; et al.	2019-12-05
Power and performance sorting of microprocessors from first interconnect layer to wafer final test Grant 10,474,774 - Acar , et al. Nov	2019-11-12
Statistical design with importance sampling reuse Grant 10,387,235 - Joshi , et al. A	2019-08-20
Fast and accurate proton therapy dose calculations Grant 9,999,788 - Gattiker , et al. June 19, 2	2018-06-19
Radiation Therapy Treatment Planning Using Regression App 20180154175 - GATTIKER; ANNE E. ; et al.	2018-06-07
Translating Different Clinical Protocols For Particle Therapy Into A Set Of Constraints App 20180154176 - GATTIKER; ANNE E. ; et al.	2018-06-07
Extracting Protobeams For Cancer Radiation Therapy App 20180154174 - GATTIKER; ANNE E. ; et al.	2018-06-07
Radiation therapy treatment planning using regression Grant 9,987,502 - Gattiker , et al. June 5, 2	2018-06-05
Extracting protobeams for cancer radiation therapy Grant 9,987,501 - Gattiker , et al. June 5, 2	2018-06-05
Efficient C.sub.eff model for gate output slew computation in early synthesis Grant 9,946,824 - Alpert , et al. April 17, 2	2018-04-17
Optical proximity correction for improved electrical characteristics Grant 9,507,250 - Agarwal , et al. November 29, 2	2016-11-29
Equivalent device statistical modeling for bitline leakage modeling Grant 9,471,732 - Joshi , et al. October 18, 2	2016-10-18
Statistical Design with Importance Sampling Reuse App 20160266950 - Joshi; Rajiv V. ; et al.	2016-09-15
Statistical design with importance sampling reuse Grant 9,348,680 - Joshi , et al. May 24, 2	2016-05-24
Fast And Accurate Proton Therapy Dose Calculations App 20150352374 - Gattiker; Anne E. ; et al.	2015-12-10
Statistical determination of power-circuit connectivity Grant 9,135,577 - El-Essawy , et al. September 15, 2	2015-09-15
Efficient Ceff Model For Gate Output Slew Computation In Early Synthesis App 20150143326 - Alpert; Charles J. ; et al.	2015-05-21
Power And Performance Sorting Of Microprocessors From First Interconnect Layer To Wafer Final Test App 20150066467 - Acar; Emrah ; et al.	2015-03-05
Method and test system for fast determination of parameter variation statistics Grant 8,862,426 - Agarwal , et al. October 14, 2	2014-10-14
Methodology for correlated memory fail estimations Grant 8,799,732 - Joshi , et al. August 5, 2	2014-08-05
Statistical Design with Importance Sampling Reuse App 20140215274 - Joshi; Rajiv V. ; et al.	2014-07-31
Calibration of non-contact current sensors Grant 8,742,748 - El-Essawy , et al. June 3, 2	2014-06-03
Statistical Determination of Power-Circuit Connectivity App 20140100804 - El-Essawy; Wael R. ; et al.	2014-04-10
Test circuit for bias temperature instability recovery measurements Grant 8,676,516 - Gebara , et al. March 18, 2	2014-03-18
Rapid estimation of temperature rise in wires due to Joule heating Grant 8,640,062 - Agarwal , et al. January 28, 2	2014-01-28
Compensating for variations in device characteristics in integrated circuit simulation Grant 8,594,989 - Acar , et al. November 26, 2	2013-11-26
Calibration Of Non-contact Current Sensors App 20130241529 - El-Essawy; Wael ; et al.	2013-09-19
Multiple patterning layout decomposition for ease of conflict removal Grant 8,516,403 - Abou Ghaida , et al. August 20, 2	2013-08-20
Methodology For Correlated Memory Fail Estimations App 20130212444 - Joshi; Rajiv V. ; et al.	2013-08-15
Calibration of non-contact current sensors Grant 8,508,212 - El-Essawy , et al. August 13, 2	2013-08-13
Gradient-based search mechanism for optimizing photolithograph masks Grant 8,495,524 - Liu , et al. July 23, 2	2013-07-23
Gradient-based search mechanism for optimizing photolithograph masks Grant 8,495,523 - Liu , et al. July 23, 2	2013-07-23
Calibration of non-contact voltage sensors Grant 8,493,054 - El-Essawy , et al. July 23, 2	2013-07-23
On-chip leakage current modeling and measurement circuit Grant 8,473,879 - Joshi , et al. June 25, 2	2013-06-25
Gradient-based search mechanism for optimizing photolithograph masks Grant 8,473,872 - Liu , et al. June 25, 2	2013-06-25
Gradient-based search mechanism for optimizing photolithograph masks Grant 8,458,620 - Liu , et al. June 4, 2	2013-06-04
Gradient based search mechanism for optimizing photolithograph masks Grant 8,453,074 - Liu , et al. May 28, 2	2013-05-28
Mask assignment for multiple patterning lithography Grant 8,434,033 - Abou Ghaida , et al. April 30, 2	2013-04-30
Reducing through process delay variation in metal wires Grant 8,402,398 - Agarwal , et al. March 19, 2	2013-03-19
Multiple Patterning Layout Decomposition for Ease of Conflict Removal App 20130061183 - Abou Ghaida; Rani S. ; et al.	2013-03-07
Mask Assignment For Multiple Patterning Lithography App 20130061185 - Abou Ghaida; Rani S. ; et al.	2013-03-07
Broken-spheres methodology for improved failure probability analysis in multi-fail regions Grant 8,365,118 - Joshi , et al. January 29, 2	2013-01-29
Equivalent Device Statistical Modeling for Bitline Leakage Modeling App 20130014069 - Joshi; Rajiv V. ; et al.	2013-01-10
Equivalent device statistical modeling for bitline leakage modeling Grant 8,346,528 - Joshi , et al. January 1, 2	2013-01-01
Split-layer design for double patterning lithography Grant 8,347,240 - Agarwal , et al. January 1, 2	2013-01-01
Calibration Of Non-contact Current Sensors App 20120319674 - El-Essawy; Wael ; et al.	2012-12-20
Calibration Of Non-contact Voltage Sensors App 20120319675 - El-Essawy; Wael ; et al.	2012-12-20
Reducing Through Process Delay Variation in Metal Wires App 20120317523 - Agarwal; Kanak B. ; et al.	2012-12-13
Rapid Estimation of Temperature Rise in Wires Due to Joule Heating App 20120317529 - Agarwal; Kanak B. ; et al.	2012-12-13
Model-based retargeting of layout patterns for sub-wavelength photolithography Grant 8,321,818 - Agarwal , et al. November 27, 2	2012-11-27
On-Chip Leakage Current Modeling and Measurement Circuit App 20120293197 - Joshi; Rajiv V. ; et al.	2012-11-22
Gradient-Based Search Mechanism for Optimizing Photolithograph Masks App 20120278769 - Liu; Ying ; et al.	2012-11-01
Test Circuit For Bias Temperature Instability Recovery Measurements App 20120262187 - Gebara; Fadi H. ; et al.	2012-10-18
Gradient-Based Search Mechanism for Optimizing Photolithograph Masks App 20120266111 - Liu; Ying ; et al.	2012-10-18
Gradient-Based Search Mechanism for Optimizing Photolithograph Masks App 20120266112 - Liu; Ying ; et al.	2012-10-18
Gradient-Based Search Mechanism for Optimizing Photolithograph Masks App 20120266114 - Liu; Ying ; et al.	2012-10-18
Gradient-Based Search Mechanism for Optimizing Photolithograph Masks App 20120266113 - Liu; Ying ; et al.	2012-10-18
Gradient-Based Search Mechanism for Optimizing Photolithograph Masks App 20120260221 - Liu; Ying ; et al.	2012-10-11
Gradient based search mechanism for optimizing photolithograph masks Grant 8,245,159 - Liu , et al. August 14, 2	2012-08-14
Test circuit for bias temperature instability recovery measurements Grant 8,229,683 - Gebara , et al. July 24, 2	2012-07-24
On-chip leakage current modeling and measurement circuit Grant 8,214,777 - Joshi , et al. July 3, 2	2012-07-03
Methodology for correlated memory fail estimations Grant 8,214,190 - Joshi , et al. July 3, 2	2012-07-03
Computer program product for controlling a storage device having per-element selectable power supply voltages Grant 8,208,339 - Joshi , et al. June 26, 2	2012-06-26
Split-Layer Design for Double Patterning Lithography App 20120110521 - Agarwal; Kanak B. ; et al.	2012-05-03
Blended model interpolation Grant 8,151,230 - Acar , et al. April 3, 2	2012-04-03
Statistical Design with Importance Sampling Reuse App 20120046929 - Joshi; Rajiv V. ; et al.	2012-02-23
Integrated circuit modeling based on empirical test data Grant 8,121,822 - Acar , et al. February 21, 2	2012-02-21
Computer Program Product For Controlling A Storage Device Having Per-element Selectable Power Supply Voltages App 20110225438 - Joshi; Rajiv V. ; et al.	2011-09-15
Method and computer program for controlling a storage device having per-element selectable power supply voltages Grant 7,995,418 - Joshi , et al. August 9, 2	2011-08-09
Optical Proximity Correction for Improved Electrical Characteristics App 20110154271 - Agarwal; Kanak B. ; et al.	2011-06-23
Delay-based bias temperature instability recovery measurements for characterizing stress degradation and recovery Grant 7,949,482 - Gebara , et al. May 24, 2	2011-05-24
Test Circuit For Bias Temperature Instability Recovery Measurements App 20110074394 - Gebara; Fadi H. ; et al.	2011-03-31
Test system and computer program for determining threshold voltage variation using a device array Grant 7,917,316 - Agarwal , et al. March 29, 2	2011-03-29
Equivalent Device Statistical Modeling for Bitline Leakage Modeling App 20110054856 - Joshi; Rajiv V. ; et al.	2011-03-03
Gradient-Based Search Mechanism for Optimizing Photolithograph Masks App 20110035709 - Liu; Ying ; et al.	2011-02-10
Closed-loop modeling of gate leakage for fast simulators Grant 7,885,798 - Joshi , et al. February 8, 2	2011-02-08
Model-Based Retargeting of Layout Patterns for Sub-Wavelength Photolithography App 20100333049 - Agarwal; Kanak B. ; et al.	2010-12-30
Broken-spheres Methodology For Improved Failure Probability Analysis In Multi-fail Regions App 20100313070 - Joshi; Rajiv V. ; et al.	2010-12-09
Method and computer program for selecting circuit repairs using redundant elements with consideration of aging effects Grant 7,827,018 - Adams , et al. November 2, 2	2010-11-02
Characterization circuit for fast determination of device capacitance variation Grant 7,818,137 - Agarwal , et al. October 19, 2	2010-10-19
Methodology For Correlated Memory Fail Estimations App 20100262414 - Joshi; Rajiv V. ; et al.	2010-10-14
Compensating For Variations In Device Characteristics In Integrated Circuit Simulation App 20100262413 - Acar; Emrah ; et al.	2010-10-14
Integrated Circuit Modeling Based On Empirical Test Data App 20100262412 - Acar; Emrah ; et al.	2010-10-14
Blended Model Interpolation App 20100262409 - Acar; Emrah ; et al.	2010-10-14
On-chip Leakage Current Modeling And Measurement Circuit App 20100257492 - Joshi; Rajiv V. ; et al.	2010-10-07
Method for determining threshold voltage variation using a device array Grant 7,759,963 - Agarwal , et al. July 20, 2	2010-07-20
Scannable virtual rail ring oscillator circuit and system for measuring variations in device characteristics Grant 7,759,991 - Agarwal , et al. July 20, 2	2010-07-20
Method and system for analyzing an integrated circuit based on sample windows selected using an open deterministic sequencing technique Grant 7,752,580 - Braasch , et al. July 6, 2	2010-07-06
Method and system for determining element voltage selection control values for a storage device Grant 7,733,720 - Joshi , et al. June 8, 2	2010-06-08
Delay-Based Bias Temperature Instability Recovery Measurements for Characterizing Stress Degradation and Recovery App 20090319202 - Gebara; Fadi H. ; et al.	2009-12-24
Method and apparatus for measuring device mismatches Grant 7,622,942 - Agarwal , et al. November 24, 2	2009-11-24
Techniques For Characterizing Performance Of Transistors In Integrated Circuit Devices App 20090251223 - NASSIF; SANI R. ; et al.	2009-10-08
Characterization array circuit Grant 7,560,951 - Agarwal , et al. July 14, 2	2009-07-14
Method And Computer Program For Controlling A Storage Device Having Per-element Selectable Power Supply Voltages App 20090172451 - Joshi; Rajiv V. ; et al.	2009-07-02
Method And System For Isolating Dopant Fluctuation And Device Length Variation From Statistical Measurements Of Threshold Voltage App 20090164155 - AGARWAL; KANAK B. ; et al.	2009-06-25
Method And Test System For Fast Determination Of Parameter Variation Statistics App 20090160477 - Agarwal; Kanak B. ; et al.	2009-06-25
Characterization Circuit For Fast Determination Of Device Capacitance Variation App 20090160463 - Agarwal; Kanak B. ; et al.	2009-06-25
Method and circuit for measuring operating and leakage current of individual blocks within an array of test circuit blocks Grant 7,550,987 - Acharyya , et al. June 23, 2	2009-06-23
Energy efficient storage device using per-element selectable power supply voltages Grant 7,551,508 - Joshi , et al. June 23, 2	2009-06-23
Method and Computer Program for Selecting Circuit Repairs Using Redundant Elements with Consideration of Aging Effects App 20090132849 - Adams; Chad A. ; et al.	2009-05-21
Method and System for Determining Element Voltage Selection Control Values for a Storage Device App 20090132873 - Joshi; Rajiv V. ; et al.	2009-05-21
Energy Efficient Storage Device Using Per-element Selectable Power Supply Voltages App 20090129193 - Joshi; Rajiv V. ; et al.	2009-05-21
Scannable Virtual Rail Ring Oscillator Circuit And System For Measuring Variations In Device Characteristics App 20090125258 - Agarwal; Kanak B. ; et al.	2009-05-14
Scannable virtual rail method and ring oscillator circuit for measuring variations in device characteristics Grant 7,532,078 - Agarwal , et al. May 12, 2	2009-05-12
Method And System For Analyzing An Integrated Circuit Based On Sample Windows Selected Using An Open Deterministic Sequencing Technique App 20090031263 - Braasch; Sarah C. ; et al.	2009-01-29
Method Of Separating The Process Variation In Threshold Voltage And Effective Channel Length By Electrical Measurements App 20080294410 - Agarwal; Kanak B. ; et al.	2008-11-27
Closed-Loop Modeling of Gate Leakage for Fast Simulators App 20080281570 - Joshi; Rajiv V. ; et al.	2008-11-13
Test Structure for Statistical Characterization of Metal and Contact/Via Resistances App 20080278182 - Agarwal; Kanak B. ; et al.	2008-11-13
Method of separating the process variation in threshold voltage and effective channel length by electrical measurements Grant 7,447,606 - Agarwal , et al. November 4, 2	2008-11-04
Method For Determining Threshold Voltage Variation Using A Device Array App 20080258750 - Agarwal; Kanak B. ; et al.	2008-10-23
Method And Apparatus For Measuring Device Mismatches App 20080258752 - Agarwal; Kanak B. ; et al.	2008-10-23
Test System And Computer Program For Determining Threshold Voltage Variation Using A Device Array App 20080255792 - Agarwal; Kanak B. ; et al.	2008-10-16
Characterization array and method for determining threshold voltage variation Grant 7,423,446 - Agarwal , et al. September 9, 2	2008-09-09
Method and Circuit for Measuring Operating and Leakage Current of Individual Blocks Within an Array of Test Circuit Blocks App 20080209285 - Acharyya; Dhruva J. ; et al.	2008-08-28
Scannable Virtual Rail Method and Ring Oscillator Circuit for Measuring Variations in Device Characteristics App 20080195337 - Agarwal; Kanak B. ; et al.	2008-08-14
System And Computer Program For Efficient Cell Failure Rate Estimation In Cell Arrays App 20080195325 - Joshi; Rajiv V. ; et al.	2008-08-14
Method and apparatus for measuring device mismatches Grant 7,408,372 - Agarwal , et al. August 5, 2	2008-08-05
System And Method For Memory Element Characterization App 20080155484 - Agrawal; Bhavna ; et al.	2008-06-26
Characterization Array Circuit App 20080129326 - Agarwal; Kanak B. ; et al.	2008-06-05
Method and computer program for efficient cell failure rate estimation in cell arrays Grant 7,380,225 - Joshi , et al. May 27, 2	2008-05-27
Method of separating the process variation in threshold voltage and effective channel length by electrical measurements App 20080097715 - Agarwal; Kanak B. ; et al.	2008-04-24
System and method for memory element characterization Grant 7,350,170 - Agrawal , et al. March 25, 2	2008-03-25
Characterization Array and Method for Determining Threshold Voltage Variation App 20080030220 - Agarwal; Kanak B. ; et al.	2008-02-07
Method and Apparatus for Measuring Device Mismatches App 20070296442 - Agarwal; Kanak B. ; et al.	2007-12-27
Method and computer program for efficient cell failure rate estimation in cell arrays App 20070220455 - Joshi; Rajiv V. ; et al.	2007-09-20
Circuit for computing moment pre-products for statistical analysis Grant 7,251,581 - Nassif July 31, 2	2007-07-31
System and method for memory element characterization App 20060277511 - Agrawal; Bhavna ; et al.	2006-12-07
Circuit For Computing Moment Pre-products For Statistical Analysis App 20060265189 - Nassif; Sani R.	2006-11-23
Method for determining and using leakage current sensitivities to optimize the design of an integrated circuit Grant 7,137,080 - Acar , et al. November 14, 2	2006-11-14
Method for determining and using leakage current sensitivities to optimize the design of an integrated circuit App 20050044515 - Acar, Emrah ; et al.	2005-02-24
Method for determining the leakage power for an integrated circuit Grant 6,842,714 - Acar , et al. January 11, 2	2005-01-11