Narizuka; Yasunori

Patent Applications and Registrations

Patent applications and USPTO patent grants for Narizuka; Yasunori.The latest application filed is for "probe card and method of manufacturing semiconductor integrated circuit device".

Company Profile

0.23.32

Narizuka; Yasunori - Yokohama N/A JP
Narizuka; Yasunori - Tokyo JP
NARIZUKA; Yasunori - Hiratsuka JP
Narizuka, Yasunori - Hiratsuka-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Manufacturing method of semiconductor integrated circuit device Grant 8,357,933 - Hasebe , et al. January 22, 2	2013-01-22
Method of manufacturing a semiconductor integrated circuit device and a method of manufacturing a thin film probe sheet for using the same Grant 8,206,997 - Hasebe , et al. June 26, 2	2012-06-26
Method of manufacturing a semiconductor integrated circuit device and a method of manufacturing a thin film probe sheet for using the same Grant 8,062,911 - Hasebe , et al. November 22, 2	2011-11-22
Probe Card And Method Of Manufacturing Semiconductor Integrated Circuit Device App 20110281380 - NARIZUKA; Yasunori ; et al.	2011-11-17
Fabrication Method Of Semiconductor Integrated Circuit Device App 20110175634 - Okamoto; Masayoshi ; et al.	2011-07-21
Fabrication Method Of Semiconductor Integrated Circuit Device App 20110136272 - OKAMOTO; Masayoshi ; et al.	2011-06-09
Fabrication method of semiconductor integrated circuit device Grant 7,901,958 - Okamoto , et al. March 8, 2	2011-03-08
Thin Film Probe Sheet And Semiconductor Chip Inspection System App 20110014727 - YABUSHITA; Akira ; et al.	2011-01-20
Thin-film Probe Sheet And Method Of Manufacturing The Same, Probe Card, And Semiconductor Chip Inspection Apparatus App 20100301884 - Takane; Etsuko ; et al.	2010-12-02
Fabrication Method Of Semiconductor Integrated Circuit Device App 20100304510 - OKAMOTO; Masayoshi ; et al.	2010-12-02
Manufactoring Method Of Semiconductor Integrated Circuit Device App 20100277192 - HASEBE; Akio ; et al.	2010-11-04
Method Of Manufacturing A Semiconductor Integrated Circuit Device And A Method Of Manufacturing A Thin Film Probe Sheet For Using The Same App 20100279502 - Hasebe; Akio ; et al.	2010-11-04
Manufacturing method of semiconductor integrated circuit device Grant 7,776,626 - Hasebe , et al. August 17, 2	2010-08-17
Probe card, manufacturing method of probe card, semiconductor inspection apparatus and manufacturing method of semiconductor device Grant 7,724,006 - Kasukabe , et al. May 25, 2	2010-05-25
Probe cassette, semiconductor inspection apparatus and manufacturing method of semiconductor device Grant 7,656,174 - Kasukabe , et al. February 2, 2	2010-02-02
Manufacturing method of semiconductor integrated circuit device Grant 7,598,100 - Matsumoto , et al. October 6, 2	2009-10-06
Probe Card, Manufacturing Method Of Probe Card, Semiconductor Inspection Apparatus And Manufacturing Method Of Semiconductor Device App 20090212798 - KASUKABE; Susumu ; et al.	2009-08-27
Method of manufacturing a semiconductor integrated circuit device Grant 7,537,943 - Hasebe , et al. May 26, 2	2009-05-26
Manufacturing Method Of Semiconductor Integrated Circuit Device App 20090130785 - Matsumoto; Hideyuki ; et al.	2009-05-21
Manufacturing method of semiconductor integrated circuit device Grant 7,534,629 - Shoji , et al. May 19, 2	2009-05-19
Manufacturing Method Of Semiconductor Integrated Circuit Device App 20090017565 - Hasebe; Akio ; et al.	2009-01-15
Probe sheet adhesion holder, probe card, semiconductor test device, and manufacturing method of semiconductor device Grant 7,423,439 - Kasukabe , et al. September 9, 2	2008-09-09
Manufacturing method of semiconductor integrated circuit device Grant 7,407,823 - Hasebe , et al. August 5, 2	2008-08-05
Method Of Manufacturing A Semiconductor Integrated Circuit Device And A Method Of Manufacturing A Thin Film Probe Sheet For Using The Same App 20080160657 - Hasebe; Akio ; et al.	2008-07-03
Method Of Manufacturing A Semiconductor Integrated Circuit Device App 20080096295 - HASEBE; Akio ; et al.	2008-04-24
Fabrication method of semiconductor integrated circuit device Grant 7,351,597 - Wada , et al. April 1, 2	2008-04-01
Transmission Circuit, Connecting Sheet, Probe Sheet, Probe Card, Semiconductor Inspection System and Method of Manufacturing Semiconductor Device App 20080029763 - Kasukabe; Susumu ; et al.	2008-02-07
Fabrication Method Of Semiconductor Integrated Circuit Device App 20080020498 - OKAMOTO; Masayoshi ; et al.	2008-01-24
Probe Cassette, Semiconductor Inspection Apparatus And Manufacturing Method Of Semiconductor Device App 20070279074 - Kasukabe; Susumu ; et al.	2007-12-06
Fabrication Method Of Semiconductor Integrated Circuit Device App 20070218572 - Wada; Yuji ; et al.	2007-09-20
Fabrication Method Of Semiconductor Integrated Circuit Device App 20070207559 - Hasebe; Akio ; et al.	2007-09-06
Fabrication method of semiconductor integrated circuit device Grant 7,235,413 - Hasebe , et al. June 26, 2	2007-06-26
Fabrication method of semiconductor integrated circuit device Grant 7,219,422 - Wada , et al. May 22, 2	2007-05-22
Probe sheet adhesion holder, probe card, semiconductor test device, and manufacturing method of semiconductor device App 20070103178 - Kasukabe; Susumu ; et al.	2007-05-10
Manufacturing method of semiconductor integrated circuit device App 20060286715 - Hasebe; Akio ; et al.	2006-12-21
Manufacturing method of semiconductor integrated circuit device App 20060281222 - Shoji; Teruo ; et al.	2006-12-14
Probe sheet, probe card, semiconductor test equipment and semiconductor device fabrication method Grant 7,049,837 - Kasukabe , et al. May 23, 2	2006-05-23
Wiring board and method for producing same App 20060091553 - Narizuka; Yasunori ; et al.	2006-05-04
Thin film probe sheet and semiconductor chip inspection system App 20060094162 - Yabushita; Akira ; et al.	2006-05-04
Connecting apparatus, semiconductor chip inspecting apparatus, and method for manufacturing semiconductor device App 20060043593 - Mori; Terutaka ; et al.	2006-03-02
Fabrication method of semiconductor integrated circuit device App 20050093565 - Okamoto, Masayoshi ; et al.	2005-05-05
Fabrication method of semiconductor integrated circuit device App 20050095734 - Hasebe, Akio ; et al.	2005-05-05
Wiring board and method for producing same App 20040201105 - Narizuka, Yasunori ; et al.	2004-10-14
Fabrication method of semiconductor integrated circuit device App 20040183556 - Wada, Yuji ; et al.	2004-09-23
Probe sheet, probe card, semiconductor test equipment and semiconductor device fabrication method App 20040070413 - Kasukabe, Susumu ; et al.	2004-04-15
Low-EMI electronic apparatus, low-EMI circuit board, and method of manufacturing the low-EMI circuit board Grant 6,707,682 - Akiba , et al. March 16, 2	2004-03-16
Wiring board and its production method, semiconductor device and its production method, and electronic apparatus App 20030104183 - Narizuka, Yasunori ; et al.	2003-06-05
Low-EMI electronic apparatus, low-EMI circuit board, and method of manufacturing the low-EMI circuit board. Grant 6,353,540 - Akiba , et al. March 5, 2	2002-03-05
Low-EMI electronic apparatus, low-EMI circuit board, and method of manufacturing the low-EMI circuit board App 20020015293 - Akiba, Yutaka ; et al.	2002-02-07
Electronic circuit board with built-in thin film capacitor and manufacturing method thereof App 20010026444 - Matsushima, Naoki ; et al.	2001-10-04
Multilayer wiring board having vent holes and method of making Grant 6,124,553 - Narizuka , et al. September 26, 2	2000-09-26
Wiring board provided with a heat bypass layer Grant 5,285,016 - Narizuka , et al. February 8, 1	1994-02-08
Thin film resistor and wiring board using the same Grant 5,235,313 - Narizuka , et al. August 10, 1	1993-08-10
Circuit substrate and thermal printing head using the same Grant 4,806,725 - Narizuka , et al. February 21, 1	1989-02-21

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