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Narazaki; Wataru Patent Filings

Narazaki; Wataru

Patent Applications and Registrations

Patent applications and USPTO patent grants for Narazaki; Wataru.The latest application filed is for "probe card, production method thereof and repairing method of probe card".

Company Profile
0.2.4
  • Narazaki; Wataru - Tokyo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Probe card, production method thereof and repairing method of probe card
App 20090039904 - Kitazume; Hidenori ;   et al.
2009-02-12
Method of connecting probe pin to circuit board and method of manufacturing probe card
Grant 7,325,304 - Narazaki , et al. February 5, 2
2008-02-05
Method of connecting probe pin to circuit board and method of manufacturing probe card
App 20050258847 - Narazaki, Wataru ;   et al.
2005-11-24
Method for manufacturing a probe pin and a probe card
App 20040154165 - Takoshima, Takehisa ;   et al.
2004-08-12
Probe card, probe card manufacturing method, and contact
App 20030224627 - Kitazume, Hidenori ;   et al.
2003-12-04
Sampler module, sampling waveform measurement device using the sample module, and sampling waveform measurement method
Grant 5,801,375 - Sasaki , et al. September 1, 1
1998-09-01

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