| Patent | Date |
|---|
Transistion Fault Testing Of Funtionally Asynchronous Paths In An Integrated Circuit
App 20220196738 - NARAYANAN; PRAKASH ; et al. | 2022-06-23 |
Transistion fault testing of funtionally asynchronous paths in an integrated circuit
Grant 11,300,615 - Narayanan , et al. April 12, 2 | 2022-04-12 |
Delay Fault Testing Of Pseudo Static Controls
App 20220091919 - Acharya; Aravinda ; et al. | 2022-03-24 |
Multiple input signature register analysis for digital circuitry
Grant 11,209,481 - Maheshwari , et al. December 28, 2 | 2021-12-28 |
Delay fault testing of pseudo static controls
Grant 11,194,645 - Acharya , et al. December 7, 2 | 2021-12-07 |
False path timing exception handler circuit
Grant 11,194,944 - Pradeep , et al. December 7, 2 | 2021-12-07 |
Compressed Scan Chain Diagnosis By Internal Chain Observation, Processes, Circuits, Devices And Systems
App 20210364569 - Narayanan; Prakash ; et al. | 2021-11-25 |
Dynamic Generation Of Atpg Mode Signals For Testing Multipath Memory Circuit
App 20210318378 - PRADEEP; WILSON ; et al. | 2021-10-14 |
Phase Controlled Codec Block Scan Of A Partitioned Circuit Device
App 20210311121 - NARAYANAN; Prakash ; et al. | 2021-10-07 |
Functional circuitry, decompressor circuitry, scan circuitry, masking circuitry, qualification circuitry
Grant 11,119,152 - Narayanan , et al. September 14, 2 | 2021-09-14 |
Path Based Controls For Ate Mode Testing Of Multicell Memory Circuit
App 20210278459 - PRADEEP; WILSON ; et al. | 2021-09-09 |
Dynamic generation of ATPG mode signals for testing multipath memory circuit
Grant 11,073,553 - Pradeep , et al. July 27, 2 | 2021-07-27 |
Phase controlled codec block scan of a partitioned circuit device
Grant 11,073,557 - Narayanan , et al. July 27, 2 | 2021-07-27 |
Full Pad Coverage Boundary Scan
App 20210215757 - Narayanan; Prakash ; et al. | 2021-07-15 |
Path based controls for ATE mode testing of multicell memory circuit
Grant 11,047,910 - Pradeep , et al. June 29, 2 | 2021-06-29 |
Full pad coverage boundary scan
Grant 10,983,161 - Narayanan , et al. April 20, 2 | 2021-04-20 |
Scan Chain Self-testing Of Lockstep Cores On Reset
App 20210055345 - NARAYANAN; Prakash ; et al. | 2021-02-25 |
Scan chain self-testing of lockstep cores on reset
Grant 10,866,280 - Narayanan , et al. December 15, 2 | 2020-12-15 |
Testing Read-only Memory Using Memory Built-in Self-test Controller
App 20200388346 - NARAYANAN; Prakash ; et al. | 2020-12-10 |
False Path Timing Exception Handler Circuit
App 20200372197 - PRADEEP; WILSON ; et al. | 2020-11-26 |
Phase Controlled Codec Block Scan Of A Partitioned Circuit Device
App 20200355744 - NARAYANAN; Prakash ; et al. | 2020-11-12 |
Testing read-only memory using memory built-in self-test controller
Grant 10,818,374 - Narayanan , et al. October 27, 2 | 2020-10-27 |
Scan Chain Self-testing Of Lockstep Cores On Reset
App 20200309851 - NARAYANAN; Prakash ; et al. | 2020-10-01 |
False path timing exception handler circuit
Grant 10,776,546 - Pradeep , et al. September 15, 2 | 2020-09-15 |
Compressed Scan Chain Diagnosis By Internal Chain Observation, Processes, Circuits, Devices And Systems
App 20200174069 - Narayanan; Prakash ; et al. | 2020-06-04 |
Delay Fault Testing Of Pseudo Static Controls
App 20200142768 - Acharya; Aravinda ; et al. | 2020-05-07 |
Testing Read-only Memory Using Memory Built-in Self-test Controller
App 20200135290 - NARAYANAN; Prakash ; et al. | 2020-04-30 |
Compressed scan chains with three input mask gates and registers
Grant 10,591,540 - Narayanan , et al. | 2020-03-17 |
Delay fault testing of pseudo static controls
Grant 10,579,454 - Acharya , et al. | 2020-03-03 |
Area efficient parallel test data path for embedded memories
Grant 10,460,821 - Narayanan , et al. Oc | 2019-10-29 |
False Path Timing Exception Handler Circuit
App 20190266303 - PRADEEP; WILSON ; et al. | 2019-08-29 |
Full Pad Coverage Boundary Scan
App 20190235020 - Narayanan; Prakash ; et al. | 2019-08-01 |
Path Based Controls For Ate Mode Testing Of Multicell Memory Circuit
App 20190204382 - PRADEEP; WILSON ; et al. | 2019-07-04 |
Transistion Fault Testing Of Funtionally Asynchronous Paths In An Integrated Circuit
App 20190204387 - NARAYANAN; PRAKASH ; et al. | 2019-07-04 |
Dynamic Generation Of Atpg Mode Signals For Testing Multipath Memory Circuit
App 20190206507 - PRADEEP; WILSON ; et al. | 2019-07-04 |
False path timing exception handler circuit
Grant 10,331,826 - Pradeep , et al. | 2019-06-25 |
Full pad coverage boundary scan
Grant 10,274,538 - Narayanan , et al. | 2019-04-30 |
Multiple Input Signature Register Analysis For Digital Circuitry
App 20190113566 - MAHESHWARI; NAMAN ; et al. | 2019-04-18 |
Multiple input signature register analysis for digital circuitry
Grant 10,184,980 - Maheshwari , et al. Ja | 2019-01-22 |
Delay Fault Testing Of Pseudo Static Controls
App 20180307553 - ACHARYA; ARAVINDA ; et al. | 2018-10-25 |
False Path Timing Exception Handler Circuit
App 20180307788 - PRADEEP; WILSON ; et al. | 2018-10-25 |
Compressed Scan Chain Diagnosis By Internal Chain Observation, Processes, Circuits, Devices And Systems
App 20180210030 - Narayanan; Prakash ; et al. | 2018-07-26 |
Area Efficient Parallel Test Data Path For Embedded Memories
App 20180174663 - Narayanan; Prakash ; et al. | 2018-06-21 |
Compressed scan chains with three input mask gates and registers
Grant 9,952,283 - Narayanan , et al. April 24, 2 | 2018-04-24 |
Multiple Input Signature Register Analysis For Digital Circuitry
App 20180067164 - MAHESHWARI; NAMAN ; et al. | 2018-03-08 |
Area efficient parallel test data path for embedded memories
Grant 9,899,103 - Narayanan , et al. February 20, 2 | 2018-02-20 |
Full Pad Coverage Boundary Scan
App 20180045778 - Narayanan; Prakash ; et al. | 2018-02-15 |
On-chip IR drop detectors for functional and test mode scenarios, circuits, processes and systems
Grant 9,823,282 - Narayanan , et al. November 21, 2 | 2017-11-21 |
Full Pad Coverage Boundary Scan
App 20170315174 - Narayanan; Prakash ; et al. | 2017-11-02 |
Full pad coverage boundary scan
Grant 9,791,505 - Narayanan , et al. October 17, 2 | 2017-10-17 |
Area Efficient Parallel Test Data Path For Embeded Memories
App 20170157524 - Narayanan; Prakash ; et al. | 2017-06-08 |
Area-efficient Parallel Test Data Path For Embedded Memories
App 20170125125 - Narayanan; Prakash ; et al. | 2017-05-04 |
Compressed Scan Chain Diagnosis By Internal Chain Observation, Processes, Circuits, Devices And Systems
App 20160069958 - Narayanan; Prakash ; et al. | 2016-03-10 |
Self-test Methods And Systems For Digital Circuits
App 20160003900 - Narayanan; Prakash ; et al. | 2016-01-07 |
Decompressed scan chain masking circuit shift register with log2(n/n) cells
Grant 9,229,055 - Narayanan , et al. January 5, 2 | 2016-01-05 |
Compressed Scan Chain Diagnosis By Internal Chain Observation, Processes, Circuits, Devices And Systems
App 20150285860 - Narayanan; Prakash ; et al. | 2015-10-08 |
On-chip Ir Drop Detectors For Functional And Test Mode Scenarios, Circuits, Processes And Systems
App 20150276824 - Narayanan; Prakash ; et al. | 2015-10-01 |
Scan chain masking qualification circuit shift register and bit-field decoders
Grant 9,091,729 - Narayanan , et al. July 28, 2 | 2015-07-28 |
On-chip IR drop detectors for functional and test mode scenarios, circuits, processes and systems
Grant 9,081,063 - Narayanan , et al. July 14, 2 | 2015-07-14 |
IC delaying flip-flop output partial clock cycle for equalizing current
Grant 9,053,273 - Poddutur , et al. June 9, 2 | 2015-06-09 |
Integrated circuits capable of generating test mode control signals for scan tests
Grant 8,972,807 - Mittal , et al. March 3, 2 | 2015-03-03 |
Compressed Scan Chain Diagnosis By Internal Chain Observation, Processes, Circuits, Devices And Systems
App 20150006987 - Narayanan; Prakash ; et al. | 2015-01-01 |
Masking circuit removing unknown bit from cell in scan chain
Grant 8,887,018 - Narayanan , et al. November 11, 2 | 2014-11-11 |
Circuits and methods for dynamic allocation of scan test resources
Grant 8,839,063 - Parekhji , et al. September 16, 2 | 2014-09-16 |
Circuits And Methods For Dynamic Allocation Of Scan Test Resources
App 20140208177 - Parekhji; Rubin Ajit ; et al. | 2014-07-24 |
Apparatuses And Methods To Suppress Power Supply Noise Harmonics In Integrated Circuits
App 20140021993 - PODDUTUR; SUMANTH REDDY ; et al. | 2014-01-23 |
Integrated Circuits Capable Of Generating Test Mode Control Signals For Scan Tests
App 20130305106 - Mittal; Rajesh ; et al. | 2013-11-14 |
On-chip Ir Drop Detectors For Functional And Test Mode Scenarios, Circuits, Processes And Systems
App 20120126781 - Narayanan; Prakash ; et al. | 2012-05-24 |
Flip-flop Architecture For Mitigating Hold Closure
App 20120062298 - PODDUTUR; Sumanth Reddy ; et al. | 2012-03-15 |
Compressed Scan Chain Diagnosis By Internal Chain Observation, Processes, Circuits, Devices And Systems
App 20110307750 - Narayanan; Prakash ; et al. | 2011-12-15 |
Rack Systems And Assemblies For Fuel Storage
App 20110051883 - McInnes; Ian ; et al. | 2011-03-03 |
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