Narayan; Kiran K.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Narayan; Kiran K..The latest application filed is for "built-in self-test (bist) engine configured to store a per pattern based fail status in a pattern mask register".

Company Profile

9.11.10

Narayan; Kiran K. - Hyderabad IN
Narayan; Kiran K. - New Delhi IN
Narayan; Kiran K. - Motinagar IN
Narayan; Kiran K. - Bangalore IN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register Grant 11,295,829 - Busi , et al. April 5, 2	2022-04-05
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register Grant 10,971,243 - Busi , et al. April 6, 2	2021-04-06
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register Grant 10,692,584 - Busi , et al.	2020-06-23
Arbitration for memory diagnostics Grant 10,622,090 - Busi , et al.	2020-04-14
Built-in Self-test (bist) Engine Configured To Store A Per Pattern Based Fail Status In A Pattern Mask Register App 20200075119 - BUSI; Aravindan J. ; et al.	2020-03-05
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register Grant 10,553,302 - Busi , et al. Fe	2020-02-04
Built-in Self-test (bist) Engine Configured To Store A Per Pattern Based Fail Status In A Pattern Mask Register App 20190378587 - BUSI; Aravindan J. ; et al.	2019-12-12
Memory built-in self-test (MBIST) test time reduction Grant 10,490,296 - Ouellette , et al. Nov	2019-11-26
Arbitration For Memory Diagnostics App 20190035486 - BUSI; Aravindan J. ; et al.	2019-01-31
Arbitration for memory diagnostics Grant 10,153,055 - Busi , et al. Dec	2018-12-11
Built-in Self-test (bist) Engine Configured To Store A Per Pattern Based Fail Status In A Pattern Mask Register App 20180061509 - BUSI; Aravindan J. ; et al.	2018-03-01
Built-in Self-test (bist) Engine Configured To Store A Per Pattern Based Fail Status In A Pattern Mask Register App 20180053566 - BUSI; Aravindan J. ; et al.	2018-02-22
Built-in-self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register Grant 9,881,694 - Busi , et al. January 30, 2	2018-01-30
Programmable counter to control memory built in self-test Grant 9,859,019 - Hanagandi , et al. January 2, 2	2018-01-02
Memory Built-in Self-test (mbist) Test Time Reduction App 20170229191 - Ouellette; Michael R. ; et al.	2017-08-10
Built-in Self-test (bist) Engine App 20170018313 - BUSI; Aravindan J. ; et al.	2017-01-19
Fast auto shift of failing memory diagnostics data using pattern detection Grant 9,514,844 - Busi , et al. December 6, 2	2016-12-06
Arbitration For Memory Diagnostics App 20160284426 - BUSI; Aravindan J. ; et al.	2016-09-29
Fast Auto Shift Of Failing Memory Diagnostics Data Using Pattern Detection App 20160064102 - BUSI; Aravindan J. ; et al.	2016-03-03
System and method of reducing test time via address aware BIST circuitry Grant 8,914,688 - Belansek , et al. December 16, 2	2014-12-16
System And Method Of Reducing Test Time Via Address Aware Bist Circuitry App 20140149810 - Belansek; George M. ; et al.	2014-05-29

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