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Patent applications and USPTO patent grants for Narasimhan; Niveditha Lakshmi.The latest application filed is for "semiconductor hot-spot and process-window discovery combining optical and electron-beam inspection".
Patent | Date |
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Methods and systems for inspection of semiconductor structures with automatically generated defect features Grant 11,379,967 - George , et al. July 5, 2 | 2022-07-05 |
Semiconductor hot-spot and process-window discovery combining optical and electron-beam inspection Grant 11,055,840 - Liang , et al. July 6, 2 | 2021-07-06 |
Semiconductor Hot-Spot and Process-Window Discovery Combining Optical and Electron-Beam Inspection App 20210042908 - Liang; Ardis ;   et al. | 2021-02-11 |
Methods And Systems For Inspection Of Semiconductor Structures With Automatically Generated Defect Features App 20200234428 - George; Jacob ;   et al. | 2020-07-23 |
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