loadpatents
name:-0.0095870494842529
name:-0.0089819431304932
name:-0.0022292137145996
Narasimhan; Murali K. Patent Filings

Narasimhan; Murali K.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Narasimhan; Murali K..The latest application filed is for "cobalt deposition on barrier surfaces".

Company Profile
2.11.9
  • Narasimhan; Murali K. - San Jose CA
  • - San Jose CA US
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Cobalt deposition on barrier surfaces
Grant 9,209,074 - Lu , et al. December 8, 2
2015-12-08
Cobalt Deposition On Barrier Surfaces
App 20150255333 - LU; Jiang ;   et al.
2015-09-10
Cobalt deposition on barrier surfaces
Grant 9,051,641 - Lu , et al. June 9, 2
2015-06-09
High temperature tungsten metallization process
Grant 8,835,311 - Collins , et al. September 16, 2
2014-09-16
High Temperature Tungsten Metallization Process
App 20140187038 - COLLINS; Joshua ;   et al.
2014-07-03
Cu surface plasma treatment to improve gapfill window
Grant 8,764,961 - Luo , et al. July 1, 2
2014-07-01
Apparatus For Providing Plasma To A Process Chamber
App 20140165911 - KAO; CHIEN-TEH ;   et al.
2014-06-19
Methods for contact clean
Grant 8,642,473 - Chang , et al. February 4, 2
2014-02-04
High temperature tungsten metallization process
Grant 8,617,985 - Collins , et al. December 31, 2
2013-12-31
High temperature tungsten metallization process
Grant 08617985 -
2013-12-31
High Temperature Tungsten Metallization Process
App 20130109172 - COLLINS; JOSHUA ;   et al.
2013-05-02
In-situ Clean Process For Metal Deposition Chambers
App 20120237693 - Jackson; Michael ;   et al.
2012-09-20
Pre-clean Chamber With Reduced Ion Current
App 20110315319 - FORSTER; JOHN C. ;   et al.
2011-12-29
Cu Surface Plasma Treatment To Improve Gapfill Window
App 20100096273 - Luo; Qian ;   et al.
2010-04-22
Cobalt Deposition On Barrier Surfaces
App 20090053426 - LU; JIANG ;   et al.
2009-02-26
Process and apparatus for integrating sheet resistance measurements and reflectance measurements of a thin film in a common apparatus
Grant 7,050,160 - Johnson , et al. May 23, 2
2006-05-23
Continuous process for forming improved titanium nitride barrier layers
Grant 5,972,178 - Narasimhan , et al. October 26, 1
1999-10-26

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