NAOI; Masaya

Patent Applications and Registrations

Patent applications and USPTO patent grants for NAOI; Masaya.The latest application filed is for "method for manufacturing doped electrode and method for manufacturing power storage device".

Company Profile

3.7.15

NAOI; Masaya - Minato-ku JP
Naoi; Masaya - Sayama-shi JP
Naoi; Masaya - Tokyo JP
Naoi; Masaya - Chuo-ku JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method For Manufacturing Doped Electrode And Method For Manufacturing Power Storage Device App 20220302434 - SUZUKI; Hirobumi ; et al.	2022-09-22
System For Manufacturing An Electrode, Cleaning Unit, And Electrode Manufacturing Method App 20220158156 - NAOI; Masaya ; et al.	2022-05-19
Electrode Manufacturing System And Electrode Manufacturing Method App 20220085350 - YAKUSHIJI; Hiroki ; et al.	2022-03-17
Doping System And Doping Method App 20220077448 - NAOI; Masaya ; et al.	2022-03-10
Electrode Manufacturing Apparatus App 20220037634 - AITA; Kazunari ; et al.	2022-02-03
Electrode Manufacturing Apparatus And Electrode Manufacturing Method App 20210384486 - IWAZAKI; Tomoya ; et al.	2021-12-09
Doping system, and method for manufacturing electrodes, batteries and capacitors Grant 11,170,947 - Naoi , et al. November 9, 2	2021-11-09
Lithium Ion Rechargeable Battery, Lithium Ion Capacitor, Andmethod Of Manufacturing Said Lithium-ion Rechargeablebattery And Lithium Ion Capacitor App 20210159484 - YAKUSHIJI; Hiroki ; et al.	2021-05-27
Power Storage Device, Power Storage Device Electrode, And A Method For Manufacturing Said Power Storage Device And Power Storage Device Electrode App 20210090818 - AITA; Kazunari ; et al.	2021-03-25
Doping System, And Method For Manufacturing Electrodes, Batteries And Capacitors App 20190074143 - NAOI; Masaya ; et al.	2019-03-07
Anisotropic conductive connector, probe member and wafer inspection system Grant 8,410,808 - Naoi , et al. April 2, 2	2013-04-02
Electrochemical Device App 20120288747 - Naoi; Masaya ; et al.	2012-11-15
Anisotropic Conductive Connector, Probe Member And Wafer Inspection System App 20100127724 - Naoi; Masaya ; et al.	2010-05-27
Method Of Positioning An Anisotropic Conductive Connector, Method Of Positioning The Anisotropic Conductive Connector And A Circuit Board For Inspection, Anisotropic Conductive Connector, And Probe Card App 20090015281 - Yoshioka; Mutsuhiko ; et al.	2009-01-15
Anisotropically conductive connector and production process thereof, and probe member Grant 7,323,712 - Kokubo , et al. January 29, 2	2008-01-29
Anisotropic conductive connector, probe member, wafer inspecting device, and wafer inspecting method Grant 7,095,241 - Setaka , et al. August 22, 2	2006-08-22
Anisotropic conductive connector and probe member and wafer inspecting device and wafer inspecting method App 20060148285 - Naoi; Masaya	2006-07-06
Anisotropic conductivity connector, probe member, wafer inspecting device, and wafer inspecting method App 20060043983 - Setaka; Ryoji ; et al.	2006-03-02
Anisotropically conductive connector and production process thereof, and probe member App 20060033100 - Kokubo; Terukazu ; et al.	2006-02-16
Anisotropically conductive connector, its manufacture method and probe member Grant 6,969,622 - Kokubo , et al. November 29, 2	2005-11-29
Anisotropic conductivity sheet with positioning portion Grant 6,168,442 - Naoi January 2, 2	2001-01-02

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