Patent | Date |
---|
Critical dimension measurement system and method of measuring critical dimensions using same Grant 11,397,380 - Park , et al. July 26, 2 | 2022-07-26 |
Critical Dimension Measurement System And Method Of Measuring Critical Dimensions Using Same App 20210055648 - PARK; WON JOO ;   et al. | 2021-02-25 |
Critical dimension measurement system and method of measuring critical dimensions using same Grant 10,831,095 - Park , et al. November 10, 2 | 2020-11-10 |
Phase shift masks and methods of forming phase shift masks Grant 8,968,970 - Moon , et al. March 3, 2 | 2015-03-03 |
Halftone phase shift blank photomasks and halftone phase shift photomasks Grant 8,865,375 - Jang , et al. October 21, 2 | 2014-10-21 |
Phase Shift Masks And Methods Of Forming Phase Shift Masks App 20140170534 - MOON; Se-Gun ;   et al. | 2014-06-19 |
Electron Beam Exposure Apparatus App 20140145091 - Nam; Dong-Seok | 2014-05-29 |
Reflective extreme ultraviolet mask and method of manufacturing the same Grant 8,568,944 - Kim , et al. October 29, 2 | 2013-10-29 |
Method of manufacturing a photomask Grant 8,524,426 - Choi , et al. September 3, 2 | 2013-09-03 |
Methods of correcting optical parameters in photomasks Grant 8,435,705 - Han , et al. May 7, 2 | 2013-05-07 |
Halftone Phase Shift Blank Photomasks and Halftone Phase Shift Photomasks App 20130101926 - Jang; Il-Yong ;   et al. | 2013-04-25 |
Phase shift masks Grant 8,361,679 - Moon , et al. January 29, 2 | 2013-01-29 |
Methods of fabricating halftone phase shift blank photomasks and halftone phase shift photomasks Grant 8,329,363 - Jang , et al. December 11, 2 | 2012-12-11 |
Reflective Extreme Ultraviolet Mask And Method Of Manufacturing The Same App 20120237860 - KIM; Hoon ;   et al. | 2012-09-20 |
Method Of Manufacturing A Photomask App 20120214092 - CHOI; Jin ;   et al. | 2012-08-23 |
Method for correcting a position error of lithography apparatus Grant 8,187,778 - Choi , et al. May 29, 2 | 2012-05-29 |
Methods of Correcting Optical Parameters in Photomasks App 20110244374 - Han; Haek-seung ;   et al. | 2011-10-06 |
Exposure equipment having auxiliary photo mask and exposure method using the same Grant 7,956,983 - Nam June 7, 2 | 2011-06-07 |
Methods of Fabricating Halftone Phase Shift Blank Photomasks and Halftone Phase Shift Photomasks App 20110104591 - Jang; Il-Yong ;   et al. | 2011-05-05 |
Phase Shift Masks App 20110086296 - Moon; Se-Gun ;   et al. | 2011-04-14 |
Method for correcting a position error of lithography apparatus App 20100209831 - Choi; Jin ;   et al. | 2010-08-19 |
Method of maintaining mask for semiconductor process App 20090239158 - Woo; Sang-Gyun ;   et al. | 2009-09-24 |
Exposure apparatus and method of exposing a semiconductor substrate App 20090059197 - Nam; Dong-seok ;   et al. | 2009-03-05 |
Photolithography Apparatus Having Mirror for Correcting Aberrations in Optical Illumination System and Mirror Having Aberration Correcting Part App 20080062397 - Nam; Dong-seok ;   et al. | 2008-03-13 |
Exposure equipment having auxiliary photo mask and exposure method using the same App 20070148561 - Nam; Dong-Seok | 2007-06-28 |
Methods of forming patterns using phase change material and methods for removing the same App 20070054493 - Nam; Dong-seok | 2007-03-08 |
Optical system for providing a hexapole illumination and method of forming a photoresist pattern on a substrate using the same Grant 7,139,064 - Nam , et al. November 21, 2 | 2006-11-21 |
Template, method of forming the template and method of forming a pattern on a semiconductor device using the template App 20050158637 - Kim, Jin-Ah ;   et al. | 2005-07-21 |
Optical system for providing a hexapole illumination and method of forming a photoresist pattern on a substrate using the same App 20050105072 - Nam, Dong-Seok ;   et al. | 2005-05-19 |
Semiconductor device having self-aligned contact pads and method for manufacturing the same Grant 6,835,970 - Nam , et al. December 28, 2 | 2004-12-28 |
Method of forming fine patterns of semiconductor device Grant 6,723,607 - Nam , et al. April 20, 2 | 2004-04-20 |
Method of forming fine patterns of semiconductor device App 20030230234 - Nam, Dong-Seok ;   et al. | 2003-12-18 |
Semiconductor device having self-aligned contact pads and method for manufacturing the same App 20030032219 - Nam, Dong-Seok ;   et al. | 2003-02-13 |