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Patent applications and USPTO patent grants for Nam; Chang Hee.The latest application filed is for "apparatus and method for measuring waveform of light wave".
Patent | Date |
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Tumbler holder Grant D891,877 - Nam | 2020-08-04 |
Tumbler holder Grant D891,878 - Nam | 2020-08-04 |
Apparatus and method for measuring waveform of light wave based on ionization yield modulation Grant 10,564,043 - Kim , et al. Feb | 2020-02-18 |
Apparatus And Method For Measuring Waveform Of Light Wave App 20180266891 - KIM; Kyung-Taec ;   et al. | 2018-09-20 |
Apparatus and method for generating high-order harmonic X-ray, and point-diffraction interferometer using high-order harmonic X-ray Grant 6,968,038 - Nam , et al. November 22, 2 | 2005-11-22 |
Apparatus and method for generating high-order harmonic X-ray, and point-diffraction interferometer using high-order harmonic X-ray App 20040174955 - Nam, Chang Hee ;   et al. | 2004-09-09 |
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