Nakazawa; Eiko
Patent Applications and Registrations
Patent applications and USPTO patent grants for Nakazawa; Eiko.The latest application filed is for "method of preparing biological tissue sample and method of observing biological tissue section sample".
- Nakazawa; Eiko - Tokyo JP
- Nakazawa; Eiko - Hitachinaka JP
- NAKAZAWA; Eiko - Mito JP
- NAKAZAWA; Eiko - Hitachinaka-shi JP
| Patent | Date |
|---|---|
| Method of preparing biological tissue sample and method of observing biological tissue section sample Grant 11,221,280 - Sawaguchi , et al. January 11, 2 | 2022-01-11 |
| Specimen observation method Grant 10,852,253 - Nakano , et al. December 1, 2 | 2020-12-01 |
| Charged particle device and wiring method Grant 10,808,312 - Hashimoto , et al. October 20, 2 | 2020-10-20 |
| Method of Preparing Biological Tissue Sample and Method of Observing Biological Tissue Section Sample App 20200232891 - SAWAGUCHI; Akira ; et al. | 2020-07-23 |
| Specimen Observation Method App 20190051489 - Nakano; Kiyotaka ; et al. | 2019-02-14 |
| Charged Particle Device And Wiring Method App 20180216223 - Hashimoto; Yoichiro ; et al. | 2018-08-02 |
| Charged particle device and wiring method Grant 9,963,776 - Hashimoto , et al. May 8, 2 | 2018-05-08 |
| Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen Grant 9,202,668 - Miwa , et al. December 1, 2 | 2015-12-01 |
| Charged Particle Device And Wiring Method App 20150299842 - Hashimoto; Yoichiro ; et al. | 2015-10-22 |
| Transmission electron microscope, and method of observing specimen Grant 9,129,772 - Nakazawa , et al. September 8, 2 | 2015-09-08 |
| Method For Observing Sample And Electronic Microscope App 20150185455 - FUJISAWA; Akiko ; et al. | 2015-07-02 |
| Method for observing sample and electronic microscope Grant 9,013,572 - Fujisawa , et al. April 21, 2 | 2015-04-21 |
| Observation Specimen For Use In Electron Microscopy, Electron Microscopy, Electron Microscope, And Device For Producing Observation Specimen App 20140264018 - Miwa; Takafumi ; et al. | 2014-09-18 |
| Transmission Electron Microscope, and Method of Observing Specimen App 20140264017 - NAKAZAWA; Eiko ; et al. | 2014-09-18 |
| Transmission electron microscope, and method of observing specimen Grant 8,785,883 - Nakazawa , et al. July 22, 2 | 2014-07-22 |
| Charged particle beam device and sample observation method Grant 8,546,770 - Morikawa , et al. October 1, 2 | 2013-10-01 |
| Specimen observation method Grant 8,410,440 - Nakazawa , et al. April 2, 2 | 2013-04-02 |
| Charged Particle Beam Device and Sample Observation Method App 20120292507 - Morikawa; Akinari ; et al. | 2012-11-22 |
| Charged particle beam device Grant 8,288,725 - Fujisawa , et al. October 16, 2 | 2012-10-16 |
| Charged particle beam device Grant 8,212,224 - Fujisawa , et al. July 3, 2 | 2012-07-03 |
| Specimen Observation Method App 20120138795 - NAKAZAWA; Eiko ; et al. | 2012-06-07 |
| Specimen observation method Grant 8,164,058 - Nakazawa , et al. April 24, 2 | 2012-04-24 |
| Method For Observing Sample And Electronic Microscope App 20110205353 - Fujisawa; Akiko ; et al. | 2011-08-25 |
| Charged Particle Beam Device App 20110062327 - FUJISAWA; Akiko ; et al. | 2011-03-17 |
| Transmission Electron Microscope, and Method of Observing Specimen App 20110057100 - Nakazawa; Eiko ; et al. | 2011-03-10 |
| Charged particle beam device Grant 7,838,829 - Fujisawa , et al. November 23, 2 | 2010-11-23 |
| Sample observation method and transmission electron microscope Grant 7,705,305 - Nakazawa , et al. April 27, 2 | 2010-04-27 |
| Specimen Observation Method App 20090274359 - NAKAZAWA; Eiko ; et al. | 2009-11-05 |
| Charged Particle Beam Device App 20090218507 - Fujisawa; Akiko ; et al. | 2009-09-03 |
| Specimen observation method Grant 7,573,030 - Nakazawa , et al. August 11, 2 | 2009-08-11 |
| Sample Observation Method and Transmission Electron Microscope App 20080283750 - NAKAZAWA; Eiko ; et al. | 2008-11-20 |
| Charged Particle Beam Device App 20080224037 - FUJISAWA; Akiko ; et al. | 2008-09-18 |
| Specimen observation method App 20080073527 - Nakazawa; Eiko ; et al. | 2008-03-27 |
| Sample observation method and transmission electron microscope Grant 7,214,938 - Nakazawa , et al. May 8, 2 | 2007-05-08 |
| Electron microscope Grant 7,041,977 - Nakazawa , et al. May 9, 2 | 2006-05-09 |
| Sample observation method and transmission electron microscope App 20060011838 - Nakazawa; Eiko ; et al. | 2006-01-19 |
| Sample observation method and transmission electron microscope Grant 6,982,420 - Nakazawa , et al. January 3, 2 | 2006-01-03 |
| Electron microscope App 20050145792 - Nakazawa, Eiko ; et al. | 2005-07-07 |
| Electron microscope and means to set observation conditions Grant 6,875,983 - Nakazawa , et al. April 5, 2 | 2005-04-05 |
| Sample observation method and transmission electron microscope App 20040114788 - Nakazawa, Eiko ; et al. | 2004-06-17 |
| Electron microscope App 20020175282 - Nakazawa, Eiko ; et al. | 2002-11-28 |
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