Nakayama; Tomonobu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nakayama; Tomonobu.The latest application filed is for "double-side-coated surface stress sensor".

Company Profile

0.14.11

Nakayama; Tomonobu - Ibaraki JP
Nakayama; Tomonobu - Tsukuba JP
Nakayama; Tomonobu - Saitama JP
Nakayama; Tomonobu - Soka JP
Nakayama; Tomonobu - Tsukuba-shi JP
Nakayama; Tomonobu - Wako JP
Nakayama, Tomonobu - Soka-shi JP
Nakayama; Tomonobu - Souka JP
Nakayama, Tomonobu - Wako-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Double-side-coated surface stress sensor Grant 9,506,822 - Yoshikawa , et al. November 29, 2	2016-11-29
Double-side-coated Surface Stress Sensor App 20140352447 - Yoshikawa; Genki ; et al.	2014-12-04
Optical electric field enhancement element and probe using the same Grant 8,601,610 - Shingaya , et al. December 3, 2	2013-12-03
Surface enhanced infrared absorption sensor and method for producing the same Grant 8,193,499 - Nagao , et al. June 5, 2	2012-06-05
Scanning probe microscope and a method to measure relative-position between probes Grant 8,141,168 - Nakayama , et al. March 20, 2	2012-03-20
Electric device using solid electrolyte Grant 7,875,883 - Sakamoto , et al. January 25, 2	2011-01-25
Optical Electric Field Enhancement Element And Probe Using The Same App 20100281587 - Shingaya; Yoshitaka ; et al.	2010-11-04
Surface Enhanced Infrared Absorption Sensor And Method For Producing The Same App 20100239821 - Nagao; Tadaaki ; et al.	2010-09-23
Solid electrolyte switching device, FPGA using same, memory device, and method for manufacturing solid electrolyte switching device Grant 7,750,332 - Sakamoto , et al. July 6, 2	2010-07-06
Scanning Probe Microscope And A Method To Measure Relative Position Between Probes App 20100005552 - Nakayama; Tomonobu ; et al.	2010-01-07
Point contact array, not circuit, and electronic circuit using the same Grant 7,525,410 - Aono , et al. April 28, 2	2009-04-28
Point contact array, not circuit, and electronic circuit comprising the same Grant 7,473,982 - Aono , et al. January 6, 2	2009-01-06
Scanning probe microscope and specimen surface structure measuring method Grant 7,241,994 - Hasegawa , et al. July 10, 2	2007-07-10
Point contact array, not circuit, and electronic circuit comprising the same Grant 7,026,911 - Aono , et al. April 11, 2	2006-04-11
Scanning probe microscope and specimen surface structure measuring method App 20050242283 - Hasegawa, Tsuyoshi ; et al.	2005-11-03
Point contact array, not circuit, and electronic circuit using the same App 20050243844 - Aono, Masakazu ; et al.	2005-11-03
Solid electrolyte switching device, fpga using same, memory device, and method for manufacturing solid electrolyte switching device App 20050127524 - Sakamoto, Toshitsugu ; et al.	2005-06-16
Electronic device having controllable conductance Grant 6,891,186 - Aono , et al. May 10, 2	2005-05-10
Point contact array, not circuit, and electronic circuit comprising the same App 20050014325 - Aono, Masakazu ; et al.	2005-01-20
Apparatus for evaluating electrical characteristics Grant 6,833,719 - Hasegawa , et al. December 21, 2	2004-12-21
Electronic device having controllable conductance App 20040089882 - Aono, Masakazu ; et al.	2004-05-13
Point contact array, not circuit, and electronic circuit comprising the same App 20030174042 - Aono, Masakazu ; et al.	2003-09-18
Scanning tunneling microscope, its probe, processing method for the probe and production method for fine structure Grant 6,608,306 - Aono , et al. August 19, 2	2003-08-19
Apparatus for evaluating electrical characteristics App 20020178800 - Hasegawa, Tsuyoshi ; et al.	2002-12-05

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