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name:-0.016942024230957
name:-0.013034105300903
name:-0.0037789344787598
Nakayama; Tatsuki Patent Filings

Nakayama; Tatsuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nakayama; Tatsuki.The latest application filed is for "surface property measuring method and surface property measuring device".

Company Profile
3.16.14
  • Nakayama; Tatsuki - Hiroshima JP
  • Nakayama; Tatsuki - Kure JP
  • Nakayama; Tatsuki - Kure-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Surface property measuring method and surface property measuring device
Grant 11,193,749 - Nakayama December 7, 2
2021-12-07
Surface property measuring device and control method for same
Grant 11,085,752 - Nakayama August 10, 2
2021-08-10
Surface Property Measuring Method And Surface Property Measuring Device
App 20200132429 - NAKAYAMA; Tatsuki
2020-04-30
Surface Property Measuring Device And Control Method For Same
App 20200132428 - NAKAYAMA; Tatsuki
2020-04-30
Surface texture measuring apparatus
Grant 10,584,981 - Kajihara , et al.
2020-03-10
Roundness measuring machine
Grant 10,514,244 - Nakayama , et al. Dec
2019-12-24
Roundness measuring apparatus
Grant 10,323,921 - Nakayama , et al.
2019-06-18
Surface Texture Measuring Apparatus
App 20180340798 - Kajihara; Toshihiko ;   et al.
2018-11-29
Measuring probe and measuring probe system
Grant 10,001,358 - Hidaka , et al. June 19, 2
2018-06-19
Surface property measuring apparatus and method for controlling the same
Grant 9,921,044 - Nakayama March 20, 2
2018-03-20
Roundness Measuring Machine
App 20180073852 - NAKAYAMA; Tatsuki ;   et al.
2018-03-15
Roundness Measuring Apparatus
App 20180058836 - NAKAYAMA; Tatsuki ;   et al.
2018-03-01
Roundness measurement device and control method
Grant 9,803,968 - Nakayama October 31, 2
2017-10-31
Measuring Probe And Measuring Probe System
App 20170097221 - HIDAKA; Kazuhiko ;   et al.
2017-04-06
Roundness Measurement Device And Control Method
App 20160084631 - NAKAYAMA; Tatsuki
2016-03-24
Surface texture measuring apparatus
Grant 9,091,521 - Nakayama , et al. July 28, 2
2015-07-28
Surface texture measuring apparatus
Grant 8,915,124 - Nakayama December 23, 2
2014-12-23
Surface Property Measuring Apparatus And Method For Controlling The Same
App 20140326057 - Nakayama; Tatsuki
2014-11-06
Surface texture measuring instrument
Grant 8,701,301 - Nakayama , et al. April 22, 2
2014-04-22
Surface Texture Measuring Apparatus
App 20130133409 - NAKAYAMA; Tatsuki ;   et al.
2013-05-30
Roundness measuring apparatus
Grant 8,336,223 - Nakayama , et al. December 25, 2
2012-12-25
Surface Texture Measuring Instrument
App 20120266475 - NAKAYAMA; Tatsuki ;   et al.
2012-10-25
Surface Texture Measuring Apparatus
App 20120227476 - NAKAYAMA; Tatsuki
2012-09-13
Circularity measuring apparatus
Grant 8,020,309 - Nakayama , et al. September 20, 2
2011-09-20
Surface texture measurement apparatus and roundness measuring apparatus
Grant 7,950,164 - Nakayama , et al. May 31, 2
2011-05-31
Surface Texture Measurement Apparatus And Roundness Measuring Apparatus
App 20110005095 - Nakayama; Tatsuki ;   et al.
2011-01-13
Circularity Measuring Apparatus
App 20100313436 - Nakayama; Tatsuki ;   et al.
2010-12-16
Roundness Measuring Apparatus
App 20100293800 - Nakayama; Tatsuki ;   et al.
2010-11-25

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