| Patent | Date |
|---|
Negative-electrode Active Material For Secondary Battery, And Secondary Battery
App 20220231282 - Nakayama; Takahito ; et al. | 2022-07-21 |
Electron Beam Writing Apparatus And Cathode Life Span Prediction Method
App 20220230834 - NAKAHASHI; Satoshi ; et al. | 2022-07-21 |
Secondary battery
Grant 11,394,030 - Furusawa , et al. July 19, 2 | 2022-07-19 |
Double pipe icemaker
Grant 11,306,956 - Nakayama , et al. April 19, 2 | 2022-04-19 |
Charged Particle Beam Adjustment Method, Charged Particle Beam Drawing Method, And Charged Particle Beam Irradiation Apparatus
App 20220068591 - KAKEHI; Ryoichi ; et al. | 2022-03-03 |
Secondary battery
Grant 11,145,938 - Shiozaki , et al. October 12, 2 | 2021-10-12 |
Charged particle beam writing apparatus, method of adjusting beam incident angle to target object surface, and charged particle beam writing method
Grant 11,145,483 - Nakayama , et al. October 12, 2 | 2021-10-12 |
Ice making system
Grant 11,118,825 - Kondou , et al. September 14, 2 | 2021-09-14 |
Refrigeration apparatus
Grant 11,041,666 - Sakae , et al. June 22, 2 | 2021-06-22 |
Charged particle beam writing apparatus and charged particle beam writing method
Grant 11,037,757 - Nakayama , et al. June 15, 2 | 2021-06-15 |
Positive Electrode And Secondary Battery
App 20210075002 - Nakayama; Takahito ; et al. | 2021-03-11 |
Charged particle beam writing apparatus and charged particle beam writing method
Grant 10,930,469 - Nakayama February 23, 2 | 2021-02-23 |
Double Pipe Icemaker
App 20200386461 - NAKAYAMA; Takahito ; et al. | 2020-12-10 |
Ice Making System
App 20200386463 - KONDOU; Azuma ; et al. | 2020-12-10 |
Icemaking System And A Method Of Controlling Evaporation Temperature Referred To By The Icemaking System
App 20200386462 - Kondou; Azuma ; et al. | 2020-12-10 |
Charged particle beam writing method and charged particle beam writing apparatus
Grant 10,755,893 - Nishimura , et al. A | 2020-08-25 |
Charged Particle Beam Writing Apparatus And Charged Particle Beam Writing Method
App 20200258715 - A1 | 2020-08-13 |
Secondary Battery Positive Electrode, And Secondary Battery
App 20200099057 - Nakayama; Takahito ; et al. | 2020-03-26 |
Secondary Battery
App 20200052303 - Takahashi; Takahiro ; et al. | 2020-02-13 |
Secondary Battery Positive Electrode And Secondary Battery
App 20200052348 - Oura; Yuji ; et al. | 2020-02-13 |
Charged particle beam writing apparatus and charged particle beam writing method
Grant 10,553,396 - Nakayama Fe | 2020-02-04 |
Secondary Battery
App 20200020951 - Furusawa; Daisuke ; et al. | 2020-01-16 |
Secondary Battery
App 20200020924 - Takezawa; Hideharu ; et al. | 2020-01-16 |
Secondary Battery
App 20200020921 - Shiozaki; Tomoki ; et al. | 2020-01-16 |
Secondary Battery
App 20200020950 - Nakayama; Takahito ; et al. | 2020-01-16 |
Charged particle beam writing apparatus and method for diagnosing failure of blanking circuit
Grant 10,460,902 - Nakayama Oc | 2019-10-29 |
Refrigeration Apparatus
App 20190242632 - SAKAE; Satoru ; et al. | 2019-08-08 |
Charged Particle Beam Writing Method And Charged Particle Beam Writing Apparatus
App 20190237297 - NISHIMURA; Rieko ; et al. | 2019-08-01 |
Charged Particle Beam Writing Apparatus And Charged Particle Beam Writing Method
App 20190122858 - NAKAYAMA; Takahito | 2019-04-25 |
Charged Particle Beam Writing Apparatus And Charged Particle Beam Writing Method
App 20190122859 - NAKAYAMA; Takahito | 2019-04-25 |
Charged Particle Beam Writing Apparatus, Method Of Adjusting Beam Incident Angle To Target Object Surface, And Charged Particle Beam Writing Method
App 20190115185 - NAKAYAMA; Takahito ; et al. | 2019-04-18 |
Charged Particle Beam Writing Apparatus And Method For Diagnosing Failure Of Blanking Circuit
App 20190080877 - NAKAYAMA; Takahito | 2019-03-14 |
Charged particle beam writing apparatus, method of adjusting beam incident angle to target object surface, and charged particle beam writing method
Grant 10,192,712 - Nakayama , et al. Ja | 2019-01-29 |
Charged Particle Beam Writing Apparatus, Method Of Adjusting Beam Incident Angle To Target Object Surface, And Charged Particle Beam Writing Method
App 20180076002 - NAKAYAMA; Takahito ; et al. | 2018-03-15 |
Charged particle beam writing apparatus, method of adjusting beam incident angle to target object surface, and charged particle beam writing method
Grant 9,824,849 - Nakayama , et al. November 21, 2 | 2017-11-21 |
Input device and display device
Grant 9,417,748 - Tokai , et al. August 16, 2 | 2016-08-16 |
Electron beam writing apparatus and electron beam writing method
Grant 9,373,424 - Touya , et al. June 21, 2 | 2016-06-21 |
Charged Particle Beam Writing Apparatus, Method Of Adjusting Beam Incident Angle To Target Object Surface, And Charged Particle Beam Writing Method
App 20160071682 - NAKAYAMA; Takahito ; et al. | 2016-03-10 |
Charged particle beam writing apparatus, method of adjusting beam incident angle to target object surface, and charged particle beam writing method
Grant 9,236,223 - Nakayama , et al. January 12, 2 | 2016-01-12 |
Input Device
App 20150331531 - AOYAMA; Toshiyuki ; et al. | 2015-11-19 |
Input Device And Display Device Having Touch Sensor Function
App 20150268765 - NAKAYAMA; Takahito ; et al. | 2015-09-24 |
Input Device
App 20150193053 - TAKAGI; Kazushige ; et al. | 2015-07-09 |
Display Device
App 20150193057 - KOSUGI; Naoki ; et al. | 2015-07-09 |
Liquid Crystal Display Device
App 20150192814 - KOSUGI; Naoki ; et al. | 2015-07-09 |
Input Device And Liquid Crystal Display Device
App 20150185927 - INOUE; Manabu ; et al. | 2015-07-02 |
Input Device And Liquid Crystal Display Device
App 20150160763 - NAKAYAMA; Takahito ; et al. | 2015-06-11 |
Display Device
App 20150153767 - NAKAYAMA; Takahito ; et al. | 2015-06-04 |
Input Device And Display Device
App 20150116266 - INOUE; Manabu ; et al. | 2015-04-30 |
Input Device And Display Device
App 20150116247 - INOUE; Manabu ; et al. | 2015-04-30 |
Input Device For Touch Operation And Display Device
App 20150116267 - INOUE; Shuji ; et al. | 2015-04-30 |
Input Device And Display Device
App 20150109248 - TOKAI; Akira ; et al. | 2015-04-23 |
Display Device
App 20150103048 - NAKAYAMA; Takahito ; et al. | 2015-04-16 |
Liquid Crystal Display Device
App 20150103278 - INOUE; Manabu ; et al. | 2015-04-16 |
Input Device And Liquid Crystal Display Apparatus
App 20150049061 - TAKAGI; Kazushige ; et al. | 2015-02-19 |
Input Device And Liquid Crystal Display Apparatus
App 20150042616 - TAKAGI; Kazushige ; et al. | 2015-02-12 |
Electron beam writing apparatus and electron beam writing method
Grant 8,816,276 - Touya , et al. August 26, 2 | 2014-08-26 |
Charged Particle Beam Writing Apparatus, Method Of Adjusting Beam Incident Angle To Target Object Surface, And Charged Particle Beam Writing Method
App 20140203185 - NAKAYAMA; Takahito ; et al. | 2014-07-24 |
Shaping Offset Adjustment Method And Charged Particle Beam Drawing Apparatus
App 20130256555 - NAKAYAMA; Takahito | 2013-10-03 |
Electron Beam Writing Apparatus And Electron Beam Writing Method
App 20130216953 - TOUYA; Takanao ; et al. | 2013-08-22 |
Electron Beam Writing Apparatus And Electron Beam Writing Method
App 20130214172 - Touya; Takanao ; et al. | 2013-08-22 |
Focusing method of charged particle beam and astigmatism adjusting method of charged particle
Grant 8,188,443 - Ohtoshi , et al. May 29, 2 | 2012-05-29 |
Method of acquiring offset deflection amount for shaped beam and lithography apparatus
Grant 8,008,631 - Nakayama , et al. August 30, 2 | 2011-08-30 |
Method Of Acquiring Offset Deflection Amount For Shaped Beam And Lithography Apparatus
App 20100001203 - Nakayama; Takahito ; et al. | 2010-01-07 |
Focusing Method Of Charged Particle Beam And Astigmatism Adjusting Method Of Charged Particle
App 20080217553 - Ohtoshi; Kenji ; et al. | 2008-09-11 |
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