Nakayama; Haruo
Patent Applications and Registrations
Patent applications and USPTO patent grants for Nakayama; Haruo.The latest application filed is for "failure diagnostic method and apparatus for manifold pressure sensors".
- Nakayama; Haruo - Saitama JP
- Nakayama; Haruo - Kawanishi JP
- Nakayama; Haruo - Osaka JP
- Nakayama; Haruo - Tokyo JP
| Patent | Date |
|---|---|
| Failure diagnostic method and apparatus for manifold pressure sensors Grant 7,263,427 - Hasegawa , et al. August 28, 2 | 2007-08-28 |
| Failure diagnostic method and apparatus for manifold pressure sensors App 20060184308 - Hasegawa; Shumpei ; et al. | 2006-08-17 |
| Semiconductor structure having island forming grooves Grant 5,565,697 - Asakawa , et al. October 15, 1 | 1996-10-15 |
| Semiconductor substrate with electrical contact in groove Grant 5,459,346 - Asakawa , et al. October 17, 1 | 1995-10-17 |
| Integrated silicon-software compiler Grant 5,197,016 - Sugimoto , et al. March 23, 1 | 1993-03-23 |
| Multi-plate optical signal processing apparatus with inter-plate optical communication Grant 5,008,554 - Asakawa , et al. April 16, 1 | 1991-04-16 |
| Single transmission line bidirectional optical communication system Grant 4,825,113 - Sato , et al. April 25, 1 | 1989-04-25 |
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