loadpatents
Patent applications and USPTO patent grants for NAKAYA; Michiko.The latest application filed is for "etching method and plasma processing apparatus".
Patent | Date |
---|---|
Etching Method And Plasma Processing Apparatus App 20220059361 - NAKAYA; Michiko ;   et al. | 2022-02-24 |
Etching Method And Plasma Processing Apparatus App 20220059360 - Gohira; Taku ;   et al. | 2022-02-24 |
Treatment Method App 20210313187 - ITO; Kiyohito ;   et al. | 2021-10-07 |
Plasma Processing Method App 20210265135 - NAKAYA; Michiko ;   et al. | 2021-08-26 |
Substrate processing method and substrate processing apparatus Grant 10,886,138 - Yang , et al. January 5, 2 | 2021-01-05 |
Processing method and plasma processing apparatus Grant 10,651,044 - Nakaya , et al. | 2020-05-12 |
Plasma Processing Method And Plasma Processing Apparatus App 20200032395 - NAKAYA; Michiko ;   et al. | 2020-01-30 |
Semiconductor manufacturing method and plasma processing apparatus Grant 10,504,741 - Nakaya , et al. Dec | 2019-12-10 |
Substrate Processing Method And Substrate Processing Apparatus App 20190355588 - Yang; Timothy Tianshyun ;   et al. | 2019-11-21 |
Processing Method And Plasma Processing Apparatus App 20180247826 - NAKAYA; Michiko ;   et al. | 2018-08-30 |
Semiconductor Manufacturing Method And Plasma Processing Apparatus App 20180247827 - NAKAYA; Michiko ;   et al. | 2018-08-30 |
Film Deposition Method And Plasma Processing Apparatus App 20180247858 - NAKAYA; Michiko ;   et al. | 2018-08-30 |
Abnormality detection system, abnormality detection method, recording medium, and substrate processing apparatus Grant 8,751,196 - Moriya , et al. June 10, 2 | 2014-06-10 |
Abnormality Detecting Unit And Abnormality Detecting Method App 20130056154 - NAKAYA; Michiko ;   et al. | 2013-03-07 |
Plasma processing method and computer readable storage medium Grant 8,263,499 - Honda , et al. September 11, 2 | 2012-09-11 |
Plasma processing apparatus Grant 8,251,011 - Yamazawa , et al. August 28, 2 | 2012-08-28 |
Abnormality Detection System, Abnormality Detection Method, And Recording Medium App 20120109582 - Moriya; Tsuyoshi ;   et al. | 2012-05-03 |
Processing method and plasma etching method Grant 7,902,078 - Nakaya March 8, 2 | 2011-03-08 |
Plasma Etching Apparatus And Method App 20100144157 - NAKAYA; Michiko ;   et al. | 2010-06-10 |
Plasma Processing Method And Computer Readable Storage Medium App 20090275207 - HONDA; Masanobu ;   et al. | 2009-11-05 |
Plasma processing apparatus Grant 7,527,016 - Yamazawa , et al. May 5, 2 | 2009-05-05 |
Plasma Processing Apparatus App 20070236148 - Yamazawa; Yohei ;   et al. | 2007-10-11 |
Plasma Etching Apparatus And Method App 20070202701 - Nakaya; Michiko ;   et al. | 2007-08-30 |
Processing Method And Plasma Etching Method App 20070197041 - NAKAYA; Michiko | 2007-08-23 |
Plasma processing apparatus App 20040035365 - Yamazawa, Yohei ;   et al. | 2004-02-26 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.