Nakao; Toshiyuki
Patent Applications and Registrations
Patent applications and USPTO patent grants for Nakao; Toshiyuki.The latest application filed is for "defect determining method and x-ray inspection device".
Company Profile
2.53.46
- Nakao; Toshiyuki - Tokyo JP
- Nakao; Toshiyuki - Yokohama JP
- Nakao; Toshiyuki - Nishio-shi JP
- Nakao, Toshiyuki - Yokohama-shi JP
- Nakao; Toshiyuki - Hadano JP
- Nakao; Toshiyuki - Chiryu JP
- Nakao; Toshiyuki - Toyota JP
Patent Activity
| Patent | Date |
|---|---|
| X-ray inspection method and device Grant 10,352,879 - Nakao , et al. July 16, 2 | 2019-07-16 |
| Defect inspecting method and defect inspecting apparatus Grant 10,254,235 - Nakao , et al. | 2019-04-09 |
| Defect Determining Method and X-Ray Inspection Device App 20180209924 - SASAZAWA; Hideaki ; et al. | 2018-07-26 |
| Defect Inspecting Method And Defect Inspecting Apparatus App 20180067060 - Nakao; Toshiyuki ; et al. | 2018-03-08 |
| Defect inspecting method and defect inspecting apparatus Grant 9,841,384 - Nakao , et al. December 12, 2 | 2017-12-12 |
| X-ray Inspection Method And Device App 20170261441 - Nakao; Toshiyuki ; et al. | 2017-09-14 |
| Inspection apparatus Grant 9,506,872 - Oshima , et al. November 29, 2 | 2016-11-29 |
| Method and Apparatus for Reviewing Defects App 20160211112 - NAKAO; Toshiyuki ; et al. | 2016-07-21 |
| Defect Inspecting Method And Defect Inspecting Apparatus App 20160116421 - Nakao; Toshiyuki ; et al. | 2016-04-28 |
| Defect inspecting method and defect inspecting apparatus Grant 9,228,960 - Nakao , et al. January 5, 2 | 2016-01-05 |
| Defect inspection device and defect inspection method Grant 9,041,921 - Nakao , et al. May 26, 2 | 2015-05-26 |
| Defect inspection method and device using same Grant 8,958,062 - Shibata , et al. February 17, 2 | 2015-02-17 |
| Surface defect inspection method and apparatus Grant 8,934,092 - Oshima , et al. January 13, 2 | 2015-01-13 |
| Fault inspection device and fault inspection method Grant 8,804,110 - Urano , et al. August 12, 2 | 2014-08-12 |
| Inspection Apparatus App 20140192353 - OSHIMA; Yoshimasa ; et al. | 2014-07-10 |
| Surface Defect Inspection Method And Apparatus App 20140176943 - OSHIMA; Yoshimasa ; et al. | 2014-06-26 |
| Defect Inspecting Method and Defect Inspecting Apparatus App 20140125980 - Nakao; Toshiyuki ; et al. | 2014-05-08 |
| Defect inspection method and device therefor Grant 8,711,347 - Honda , et al. April 29, 2 | 2014-04-29 |
| Inspection apparatus Grant 8,705,026 - Oshima , et al. April 22, 2 | 2014-04-22 |
| Method and device for inspecting for defects Grant 8,670,116 - Nakao , et al. March 11, 2 | 2014-03-11 |
| Inspecting method and inspecting apparatus for substrate surface Grant 8,654,350 - Hamamatsu , et al. February 18, 2 | 2014-02-18 |
| Defect inspecting method and defect inspecting apparatus Grant 8,638,429 - Nakao , et al. January 28, 2 | 2014-01-28 |
| Defect Inspection Method And Device Using Same App 20140009755 - Shibata; Yukihiro ; et al. | 2014-01-09 |
| Defect inspection device and inspection method Grant 8,599,369 - Urano , et al. December 3, 2 | 2013-12-03 |
| Flaw inspecting method and device therefor Grant 8,514,388 - Maruyama , et al. August 20, 2 | 2013-08-20 |
| Surface Defect Inspection Method And Apparatus App 20130208271 - OSHIMA; Yoshimasa ; et al. | 2013-08-15 |
| Defect inspection method Grant 8,482,727 - Nakao , et al. July 9, 2 | 2013-07-09 |
| Defect inspection apparatus Grant 8,477,302 - Urano , et al. July 2, 2 | 2013-07-02 |
| Method And Device For Inspecting For Defects App 20130155400 - Nakao; Toshiyuki ; et al. | 2013-06-20 |
| Fault Inspection Device And Fault Inspection Method App 20130141715 - Urano; Yuta ; et al. | 2013-06-06 |
| Defect Inspection Method And Device Therefor App 20130114078 - Honda; Toshifumi ; et al. | 2013-05-09 |
| Inspecting Method and Inspecting Apparatus For Substrate Surface App 20130107247 - Hamamatsu; Akira ; et al. | 2013-05-02 |
| Surface defect inspection method and apparatus Grant 8,400,629 - Oshima , et al. March 19, 2 | 2013-03-19 |
| Defect Inspection Device And Defect Inspection Method App 20130003052 - Nakao; Toshiyuki ; et al. | 2013-01-03 |
| Inspection Apparatus App 20120320373 - Oshima; Yoshimasa ; et al. | 2012-12-20 |
| Method and its apparatus for inspecting defects Grant 8,314,929 - Urano , et al. November 20, 2 | 2012-11-20 |
| Inspecting method and inspecting apparatus for substrate surface Grant 8,310,665 - Hamamatsu , et al. November 13, 2 | 2012-11-13 |
| Inspection apparatus Grant 8,264,679 - Oshima , et al. September 11, 2 | 2012-09-11 |
| Flaw Inspecting Method And Device Therefor App 20120194807 - Maruyama; Shigenobu ; et al. | 2012-08-02 |
| Inspecting Method and Inspecting Apparatus for Substrate Surface App 20120162665 - Hamamatsu; Akira ; et al. | 2012-06-28 |
| Inspection Apparatus App 20120140211 - OSHIMA; Yoshimasa ; et al. | 2012-06-07 |
| Defect Inspection Method App 20120133926 - Nakao; Toshiyuki ; et al. | 2012-05-31 |
| Defect Inspection Device And Inspection Method App 20120133928 - Urano; Yuta ; et al. | 2012-05-31 |
| Defect Inspection Method and Defect Inspection Apparatus App 20120092656 - Nakao; Toshiyuki ; et al. | 2012-04-19 |
| Inspecting method and inspecting apparatus for substrate surface Grant 8,144,337 - Hamamatsu , et al. March 27, 2 | 2012-03-27 |
| Inspection apparatus Grant 8,120,766 - Oshima , et al. February 21, 2 | 2012-02-21 |
| Defect inspection method and apparatus Grant 8,115,915 - Nakao , et al. February 14, 2 | 2012-02-14 |
| Defect Inspecting Method And Defect Inspecting Apparatus App 20120019835 - Nakao; Toshiyuki ; et al. | 2012-01-26 |
| Surface Defect Inspection Method And Apparatus App 20120008138 - OSHIMA; Yoshimasa ; et al. | 2012-01-12 |
| Surface defect inspection method and apparatus Grant 8,035,808 - Oshima , et al. October 11, 2 | 2011-10-11 |
| Flat Surface Inspection Apparatus App 20110242524 - SHIMIZU; YUKI ; et al. | 2011-10-06 |
| Method And Its Apparatus For Inspecting Defects App 20110211191 - Urano; Yuta ; et al. | 2011-09-01 |
| Method and its apparatus for inspecting defects Grant 7,965,386 - Urano , et al. June 21, 2 | 2011-06-21 |
| Defect Inspection Method App 20110128534 - NAKAO; Toshiyuki ; et al. | 2011-06-02 |
| Method and Its Apparatus For Inspecting Defects App 20110080578 - Urano; Yuta ; et al. | 2011-04-07 |
| Defect inspection method Grant 7,916,288 - Nakao , et al. March 29, 2 | 2011-03-29 |
| Method and its apparatus for inspecting defects Grant 7,869,024 - Urano , et al. January 11, 2 | 2011-01-11 |
| Surface Defect Inspection Method And Apparatus App 20100265494 - Oshima; Yoshimasa ; et al. | 2010-10-21 |
| Defect Inspection Tool For Sample Surface And Defect Detection Method Therefor App 20100225904 - Oshima; Yoshimasa ; et al. | 2010-09-09 |
| Defect Inspection Method App 20100149528 - Nakao; Toshiyuki ; et al. | 2010-06-17 |
| Defect inspecting device for sample surface and defect detection method therefor Grant 7,719,673 - Oshima , et al. May 18, 2 | 2010-05-18 |
| Surface defect inspection method and apparatus Grant 7,710,557 - Oshima , et al. May 4, 2 | 2010-05-04 |
| Inspection Apparatus App 20100060895 - OSHIMA; Yoshimasa ; et al. | 2010-03-11 |
| Defect inspection method Grant 7,675,613 - Nakao , et al. March 9, 2 | 2010-03-09 |
| Defect Inspection Apparatus App 20090279081 - Urano; Yuta ; et al. | 2009-11-12 |
| Method and Its Apparatus for Inspecting Defects App 20090257058 - URANO; Yuta ; et al. | 2009-10-15 |
| Defect Inspection Method App 20090195775 - Nakao; Toshiyuki ; et al. | 2009-08-06 |
| Surface Defect Inspection Method And Apparatus App 20080304055 - OSHIMA; Yoshimasa ; et al. | 2008-12-11 |
| Defect Inspection Tool For Sample Surface And Defect Detection Method Therefor App 20080151235 - Oshima; Yoshimasa ; et al. | 2008-06-26 |
| Device management system, management client, controller server, method for managing usage context of device, and recording medium which records the method Grant 7,216,360 - Nakao , et al. May 8, 2 | 2007-05-08 |
| Shift operating apparatus for a vehicle App 20060016285 - Ogami; Shiro ; et al. | 2006-01-26 |
| Device management system, management client, controller server, method for managing usage context of device, and recording medium which records the method App 20050273863 - Nakao, Toshiyuki ; et al. | 2005-12-08 |
| Device management system, management client, controller server, method for managing usage context of device, and recording medium which records the method App 20010054152 - Nakao, Toshiyuki ; et al. | 2001-12-20 |
| Semiconductor memory Grant 5,515,333 - Fujita , et al. May 7, 1 | 1996-05-07 |
| Semiconductor memory Grant 5,359,569 - Fujita , et al. October 25, 1 | 1994-10-25 |
| Differential gear apparatus with worm gears Grant 4,954,122 - Nakao , et al. September 4, 1 | 1990-09-04 |
| Soldering method Grant 4,821,946 - Abe , et al. April 18, 1 | 1989-04-18 |
| Automatic transmission system for automobiles having hydraulic and electronic control systems Grant 4,653,352 - Nakao , et al. March 31, 1 | 1987-03-31 |
| Control apparatus of a transfer mechanism Grant 4,188,838 - Nakao , et al. February 19, 1 | 1980-02-19 |
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