Nakano; Rikizo
Patent Applications and Registrations
Patent applications and USPTO patent grants for Nakano; Rikizo.The latest application filed is for "memory module and semiconductor storage device".
- Nakano; Rikizo - Kawasaki JP
- NAKANO; Rikizo - Kawasaki-shi JP
| Patent | Date |
|---|---|
| Memory module and semiconductor storage device Grant 8,972,822 - Nakano , et al. March 3, 2 | 2015-03-03 |
| Semiconductor memory device and information processing apparatus including the same Grant 8,868,990 - Nakano , et al. October 21, 2 | 2014-10-21 |
| Memory error detecting apparatus and method Grant 8,738,976 - Nakano , et al. May 27, 2 | 2014-05-27 |
| Memory controlling apparatus and method Grant 8,495,463 - Miyazaki , et al. July 23, 2 | 2013-07-23 |
| Memory system and information processing device Grant 8,473,675 - Miyazaki , et al. June 25, 2 | 2013-06-25 |
| Memory Module And Semiconductor Storage Device App 20130145233 - NAKANO; Rikizo ; et al. | 2013-06-06 |
| Test apparatus and test method for testing a memory device Grant 8,423,842 - Nakano , et al. April 16, 2 | 2013-04-16 |
| Semiconductor Memory Device And Information Processing Apparatus Including The Same App 20120254663 - Nakano; Rikizo ; et al. | 2012-10-04 |
| Data processing apparatus Grant 8,135,971 - Miyazaki , et al. March 13, 2 | 2012-03-13 |
| Memory Error Detecting Apparatus And Method App 20110314347 - NAKANO; Rikizo ; et al. | 2011-12-22 |
| Method and apparatus for testing electronic device Grant 7,990,172 - Nakano August 2, 2 | 2011-08-02 |
| Memory system and information processing device App 20110010508 - Miyazaki; Sadao ; et al. | 2011-01-13 |
| Test Apparatus And Test Method App 20100313086 - Nakano; Rikizo ; et al. | 2010-12-09 |
| Memory Controlling Apparatus And Method App 20100251041 - MIYAZAKI; Sadao ; et al. | 2010-09-30 |
| Data Processing Apparatus App 20100058094 - Miyazaki; Sadao ; et al. | 2010-03-04 |
| Method And Apparatus For Testing Electronic Device App 20090322344 - Nakano; Rikizo | 2009-12-31 |
| Memory module App 20070201282 - Nakano; Rikizo | 2007-08-30 |
| Semiconductor integrated circuit and noise-reduction method thereof App 20060208772 - Nakano; Rikizo | 2006-09-21 |
| IC element testing device Grant 5,481,551 - Nakano , et al. January 2, 1 | 1996-01-02 |
| Method of testing bit lines of a memory unit Grant 5,396,466 - Nakano , et al. March 7, 1 | 1995-03-07 |
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