Nakano; Akihiko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nakano; Akihiko.The latest application filed is for "supercontinuum source, method for generating and emitting a supercontinuum, multiphoton excitation fluorescence microscope, and multiphoton excitation method".

Company Profile

1.7.5

Nakano; Akihiko - Wako JP
NAKANO; Akihiko - Wako-shi JP
Nakano; Akihiko - Nara JP
Nakano, Akihiko - Nara-shi JP
Nakano; Akihiko - Komatsu JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Supercontinuum source, method for generating and emitting a supercontinuum, multiphoton excitation fluorescence microscope, and multiphoton excitation method Grant 11,079,656 - Ichihara , et al. August 3, 2	2021-08-03
Supercontinuum Source, Method For Generating And Emitting A Supercontinuum, Multiphoton Excitation Fluorescence Microscope, And Multiphoton Excitation Method App 20210191229 - ICHIHARA; Akira ; et al.	2021-06-24
Data recovery device, microscope system, and data recovery method Grant 10,866,400 - Miyashiro , et al. December 15, 2	2020-12-15
Supercontinuum Source, Method For Generating And Emitting A Supercontinuum, Multiphoton Excitation Fluorescence Microscope, And Multiphoton Excitation Method App 20190129278 - ICHIHARA; Akira ; et al.	2019-05-02
Data Recovery Device, Microscope System, And Data Recovery Method App 20190113733 - MIYASHIRO; Daisuke ; et al.	2019-04-18
Drive control method for objective lens and fluorescence microscope system Grant 9,921,398 - Nakano , et al. March 20, 2	2018-03-20
Drive Control Method For Objective Lens And Fluorescence Microscope System App 20160252715 - NAKANO; Akihiko ; et al.	2016-09-01
Semiconductor device and method of manufacturing the same Grant 6,759,722 - Yanagawa , et al. July 6, 2	2004-07-06
semiconductor device and method of manufacturing the same App 20010028115 - Yanagawa, Eiji ; et al.	2001-10-11
Method for observing a reaction process by transmission electron microscopy Grant 6,005,248 - Mori , et al. December 21, 1	1999-12-21
Apparatus and a method for checking a semiconductor Grant 5,089,774 - Nakano February 18, 1	1992-02-18
Failure detecting apparatus for a dual valve Grant 4,261,450 - Matsushima , et al. April 14, 1	1981-04-14

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.