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Patent applications and USPTO patent grants for NAKAMURA; Tomoji.The latest application filed is for "semiconductor device and scan test method of the same".
Patent | Date |
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Semiconductor Device And Scan Test Method Of The Same App 20220163584 - TSUKUDA; Masayuki ;   et al. | 2022-05-26 |
Semiconductor integrated circuit Grant 9,291,671 - Sunaga , et al. March 22, 2 | 2016-03-22 |
Semiconductor device having a multilayer interconnection structure Grant 9,209,111 - Watanabe , et al. December 8, 2 | 2015-12-08 |
Semiconductor Device Having A Multilayer Interconnection Structure App 20140312507 - WATANABE; Kenichi ;   et al. | 2014-10-23 |
Semiconductor device having a multilayer interconnection structure Grant 8,791,570 - Watanabe , et al. July 29, 2 | 2014-07-29 |
Semiconductor Integrated Circuit App 20140070863 - Sunaga; Yasuyoshi ;   et al. | 2014-03-13 |
Semiconductor device having a multilayer interconnection structure Grant 8,299,619 - Watanabe , et al. October 30, 2 | 2012-10-30 |
Semiconductor Device Having A Multilayer Interconnection Structure App 20120261833 - WATANABE; Kenichi ;   et al. | 2012-10-18 |
Semiconductor device having a multilayer interconnection structure Grant 8,207,610 - Watanabe , et al. June 26, 2 | 2012-06-26 |
Semiconductor device Grant 8,037,384 - Hasegawa , et al. October 11, 2 | 2011-10-11 |
Semiconductor Device Having A Multilayer Interconnection Structure App 20110121460 - WATANABE; Kenichi ;   et al. | 2011-05-26 |
Semiconductor Integrated Circuit App 20110074385 - Sunaga; Yasuyoshi ;   et al. | 2011-03-31 |
Semiconductor device with semiconductor chips mounted on mounting board via conductive anaotubes Grant 7,633,148 - Awano , et al. December 15, 2 | 2009-12-15 |
Semiconductor Device App 20090172488 - Hasegawa; Takumi ;   et al. | 2009-07-02 |
Semiconductor Device Having A Multilayer Interconnection Structure App 20080142977 - WATANABE; Kenichi ;   et al. | 2008-06-19 |
Semiconductor device with semiconductor chips mounted on mounting board App 20070267735 - Awano; Yuji ;   et al. | 2007-11-22 |
Engine crank angle detecting device Grant 7,069,774 - Nakamura , et al. July 4, 2 | 2006-07-04 |
Acceleration control method for engine Grant 6,978,768 - Yamashita , et al. December 27, 2 | 2005-12-27 |
Test method of semiconductor intergrated circuit and test pattern generator Grant 6,922,803 - Nakao , et al. July 26, 2 | 2005-07-26 |
Fuel cut control method Grant 6,830,038 - Yamashita , et al. December 14, 2 | 2004-12-14 |
Fuel cut control method App 20040187843 - Yamashita, Toshihiko ;   et al. | 2004-09-30 |
Engine crank angle detecting device App 20040182142 - Nakamura, Tomoji ;   et al. | 2004-09-23 |
Method and device for controlling acceleration of engine App 20040168676 - Yamashita, Toshihiko ;   et al. | 2004-09-02 |
Test method of semiconductor intergrated circuit and test pattern generator App 20020073373 - Nakao, Michinobu ;   et al. | 2002-06-13 |
Battery voltage warning device Grant 4,943,777 - Nakamura , et al. July 24, 1 | 1990-07-24 |
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