Nakamura; Hisato
Patent Applications and Registrations
Patent applications and USPTO patent grants for Nakamura; Hisato.The latest application filed is for "detection device and detection method".
- Nakamura; Hisato - Gunma JP
- Nakamura; Hisato - Kamisato-machi JP
- Nakamura; Hisato - Kodama-gun JP
- Nakamura; Hisato - Saitama-ken JP
- Nakamura; Hisato - Kodama JP
- Nakamura; Hisato - Saitama JP
| Patent | Date |
|---|---|
| Detection device and detection method Grant 10,365,227 - Kondo , et al. July 30, 2 | 2019-07-30 |
| Detection Device And Detection Method App 20190041340 - KONDO; Tadao ; et al. | 2019-02-07 |
| Method of detecting defects on an object Grant 7,940,383 - Noguchi , et al. May 10, 2 | 2011-05-10 |
| Apparatus And Method For Testing Defects App 20100088042 - NOGUCHI; Minori ; et al. | 2010-04-08 |
| Apparatus and method for testing defects Grant 7,692,779 - Noguchi , et al. April 6, 2 | 2010-04-06 |
| Apparatus and method for testing defects Grant 7,639,350 - Noguchi , et al. December 29, 2 | 2009-12-29 |
| Apparatus and method for testing defects Grant 7,443,496 - Noguchi , et al. October 28, 2 | 2008-10-28 |
| Apparatus And Method For Testing Defects App 20070146697 - Noguchi; Minori ; et al. | 2007-06-28 |
| Apparatus And Method For Testing Defects App 20070146696 - Noguchi; Minori ; et al. | 2007-06-28 |
| Apparatus and method for testing defects Grant 7,098,055 - Noguchi , et al. August 29, 2 | 2006-08-29 |
| Apparatus and method for testing defects Grant 7,037,735 - Noguchi , et al. May 2, 2 | 2006-05-02 |
| Apparatus and method for testing defects App 20060030060 - Noguchi; Minori ; et al. | 2006-02-09 |
| Apparatus and method for testing defects App 20060030059 - Noguchi; Minori ; et al. | 2006-02-09 |
| Apparatus and method of inspecting foreign particle or defect on a sample Grant 6,597,448 - Nishiyama , et al. July 22, 2 | 2003-07-22 |
| Optical apparatus for defect and particle size inspection Grant 6,411,377 - Noguchi , et al. June 25, 2 | 2002-06-25 |
| Extraneous substance inspection apparatus for patterned wafer Grant 5,818,576 - Morishige , et al. October 6, 1 | 1998-10-06 |
| Extraneous substance inspection apparatus for patterned wafer Grant 5,724,132 - Morishige , et al. March 3, 1 | 1998-03-03 |
| Surface inspection method and apparatus Grant 5,694,214 - Watanabe , et al. December 2, 1 | 1997-12-02 |
| Extraneous substance inspection method and apparatus Grant 5,644,393 - Nakamura , et al. July 1, 1 | 1997-07-01 |
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