Nakamichi; Masaru

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nakamichi; Masaru.The latest application filed is for "method for producing beryllium solution, method for producing beryllium, method for producing beryllium hydroxide, method for producing beryllium oxide, and beryllium oxide".

Company Profile

0.19.20

Nakamichi; Masaru - Chiba-shi JP
Nakamichi; Masaru - Hitachinaka JP
Nakamichi; Masaru - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method For Producing Beryllium Solution, Method For Producing Beryllium, Method For Producing Beryllium Hydroxide, Method For Producing Beryllium Oxide, And Beryllium Oxide App 20220298021 - Nakamichi; Masaru ; et al.	2022-09-22
Semiconductor integrated circuit device with reduced leakage current Grant 9,530,485 - Osada , et al. December 27, 2	2016-12-27
Semiconductor Integrated Circuit Device With Reduced Leakage Current App 20150357026 - OSADA; Kenichi ; et al.	2015-12-10
Semiconductor integrated circuit device with reduced leakage current Grant 9,111,636 - Osada , et al. August 18, 2	2015-08-18
Semiconductor Integrated Circuit Device with Reduced Leakage Current App 20150155031 - OSADA; Kenichi ; et al.	2015-06-04
Semiconductor integrated circuit device with reduced leakage current Grant 8,797,791 - Osada , et al. August 5, 2	2014-08-05
Semiconductor Integrated Circuit Device With Reduced Leakage Current App 20130229860 - Osada; Kenichi ; et al.	2013-09-05
Semiconductor integrated circuit device with reduced leakage current Grant 8,437,179 - Osada , et al. May 7, 2	2013-05-07
Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device Grant 8,390,048 - Sakai , et al. March 5, 2	2013-03-05
Semiconductor Integrated Circuit Device With Reduced Leakage Current App 20120257443 - Osada; Kenichi ; et al.	2012-10-11
Semiconductor integrated circuit device with reduced leakage current Grant 8,232,589 - Osada , et al. July 31, 2	2012-07-31
Semiconductor Integrated Circuit Device with Reduced Leakage Current App 20120113709 - Osada; Kenichi ; et al.	2012-05-10
Semiconductor integrated circuit device with reduced leakage current Grant 8,125,017 - Osada , et al. February 28, 2	2012-02-28
Semiconductor integrated circuit device with reduced leakage current App 20110215414 - Osada; Kenichi ; et al.	2011-09-08
Semiconductor integrated circuit device with reduced leakage current Grant 7,964,484 - Osada , et al. June 21, 2	2011-06-21
Method Of Manufacturing A Nonvolatile Semiconductor Memory Device, And A Nonvolatile Semiconductor Memory Device App 20110024820 - SAKAI; Takeshi ; et al.	2011-02-03
Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device Grant 7,863,135 - Sakai , et al. January 4, 2	2011-01-04
Method Of Manufacturing A Nonvolatile Semiconductor Memory Device, And A Nonvolatile Semiconductor Memory Device App 20100144108 - SAKAI; Takeshi ; et al.	2010-06-10
Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device Grant 7,663,176 - Sakai , et al. February 16, 2	2010-02-16
Semiconductor integrated circuit device with reduced leakage current App 20090269899 - OSADA; Kenichi ; et al.	2009-10-29
Semiconductor integrated circuit device with reduced leakage current Grant 7,569,881 - Osada , et al. August 4, 2	2009-08-04
Semiconductor integrated circuit device with reduced leakage current App 20080203437 - Osada; Kenichi ; et al.	2008-08-28
Method Of Manufacturing A Nonvolatile Semiconductor Memory Device, And A Nonvolatile Semiconductor Memory Device App 20080203466 - SAKAI; Takeshi ; et al.	2008-08-28
Method Of Manufacturing A Nonvolatile Semiconductor Memory Device, And A Nonvolatile Semiconductor Memory Device App 20080206975 - SAKAI; Takeshi ; et al.	2008-08-28
Semiconductor integrated circuit device with reduced leakage current Grant 7,388,238 - Osada , et al. June 17, 2	2008-06-17
Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device Grant 7,371,631 - Sakai , et al. May 13, 2	2008-05-13
Semiconductor device and method of manufacturing the same App 20080029825 - Saito; Kentaro ; et al.	2008-02-07
Semiconductor integrated circuit device with reduced leakage current App 20060226449 - Osada; Kenichi ; et al.	2006-10-12
Semiconductor integrated circuit device with reduced leakage current Grant 7,087,942 - Osada , et al. August 8, 2	2006-08-08
Semiconductor integrated circuit device Grant 7,045,864 - Funayama , et al. May 16, 2	2006-05-16
Semiconductor integrated circuit device with reduced leakage current App 20060076610 - Osada; Kenichi ; et al.	2006-04-13
Semiconductor integrated circuit device with reduced leakage current Grant 6,998,674 - Osada , et al. February 14, 2	2006-02-14
Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device App 20060003508 - Sakai; Takeshi ; et al.	2006-01-05
Semiconductor integrated circuit device with reduced leakage current App 20050174141 - Osada, Kenichi ; et al.	2005-08-11
Semiconductor integrated circuit device with reduced leakage current Grant 6,885,057 - Osada , et al. April 26, 2	2005-04-26
Semiconductor integrated circuit device App 20030006433 - Funayama, Kota ; et al.	2003-01-09
Semiconductor integrated circuit device with reduced leakage current App 20020179940 - Osada, Kenichi ; et al.	2002-12-05

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.