Nakaie; Toshiyuki
Patent Applications and Registrations
Patent applications and USPTO patent grants for Nakaie; Toshiyuki.The latest application filed is for "integral value measuring circuit".
- Nakaie; Toshiyuki - Wakayama N/A JP
- Nakaie; Toshiyuki - Osaka JP
- Nakaie; Toshiyuki - Wakayama-shi JP
| Patent | Date |
|---|---|
| Integral value measuring circuit Grant 8,829,972 - Nakaie , et al. September 9, 2 | 2014-09-09 |
| Impulse immunity test apparatus Grant 8,410,791 - Tsukagoshi , et al. April 2, 2 | 2013-04-02 |
| Integral Value Measuring Circuit App 20130009628 - Nakaie; Toshiyuki ; et al. | 2013-01-10 |
| Receptacle, printed wiring board, and electronic device Grant 8,267,728 - Nakaie , et al. September 18, 2 | 2012-09-18 |
| Receptacle structure, printed wiring board structure, and electronic device Grant 8,162,671 - Matsubara , et al. April 24, 2 | 2012-04-24 |
| Plasma display device Grant 8,072,778 - Kunimoto , et al. December 6, 2 | 2011-12-06 |
| Receptacle, Printed Wiring Board, And Electronic Device App 20110256739 - Nakaie; Toshiyuki ; et al. | 2011-10-20 |
| Receptacle, Printed Wiring Board, And Electronic Device App 20110201215 - Matsubara; Ryo ; et al. | 2011-08-18 |
| Receptacle Structure, Printed Wiring Board Structure, And Electronic Device App 20110201214 - MATSUBARA; Ryou ; et al. | 2011-08-18 |
| Impulse Immunity Test Apparatus App 20100090710 - Tsukagoshi; Tsuneo ; et al. | 2010-04-15 |
| Method of measuring characteristic impedance of electrostatic discharge protecting circuit and apparatus for realizing the same Grant 7,609,076 - Nakaie , et al. October 27, 2 | 2009-10-27 |
| Plasma Display Device App 20090251390 - Kumoi; Masafumi ; et al. | 2009-10-08 |
| Plasma display device App 20090237907 - Kunimoto; Hiroshi ; et al. | 2009-09-24 |
| Plasma display device App 20090231238 - Fusayasu; Hirotsugu ; et al. | 2009-09-17 |
| Method Of Measuring Characteristic Impedance Of Electrostatic Discharge Protecting Circuit And Apparatus For Realizing The Same App 20080004820 - NAKAIE; Toshiyuki ; et al. | 2008-01-03 |
| Apparatus for testing integrated circuit Grant 4,677,375 - Nakaie , et al. June 30, 1 | 1987-06-30 |
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