loadpatents
name:-0.01006007194519
name:-0.014188051223755
name:-0.002025842666626
NAKAGAWA; Yoshitomo Patent Filings

NAKAGAWA; Yoshitomo

Patent Applications and Registrations

Patent applications and USPTO patent grants for NAKAGAWA; Yoshitomo.The latest application filed is for "focused ion beam processing apparatus".

Company Profile
1.12.7
  • NAKAGAWA; Yoshitomo - Tokyo JP
  • Nakagawa; Yoshitomo - Chiba JP
  • Nakagawa; Yoshitomo - Mihama-ku JP
  • Nakagawa; Yoshitomo - Chiba-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Focused Ion Beam Processing Apparatus
App 20210296080 - OBA; Hiroshi ;   et al.
2021-09-23
Mask Defect Repair Apparatus And Mask Defect Repair Method
App 20200310246 - NAKAGAWA; Yoshitomo ;   et al.
2020-10-01
Heat transfer system for an inductively coupled plasma device
Grant 9,820,370 - Nakagawa , et al. November 14, 2
2017-11-14
Stabilized ICP emission spectrometer and method of using
Grant 9,726,611 - Nakagawa August 8, 2
2017-08-08
Inductively Coupled Plasma Generating Device and Inductively Coupled Plasma Analysis Device
App 20160270201 - Nakagawa; Yoshitomo ;   et al.
2016-09-15
ICP Emission Spectrometer
App 20150276611 - Nakagawa; Yoshitomo
2015-10-01
Composite focused ion beam device, process observation method using the same, and processing method
Grant 8,274,063 - Kaito , et al. September 25, 2
2012-09-25
Composite Focused Ion Beam Device, Process Observation Method Using The Same,and Processing Method
App 20100288924 - Kaito; Takashi ;   et al.
2010-11-18
Focused ion beam apparatus
Grant 7,755,065 - Nakagawa , et al. July 13, 2
2010-07-13
Focused Ion Beam Apparatus
App 20080308741 - Nakagawa; Yoshitomo ;   et al.
2008-12-18
ICP analyzer
App 20020001540 - Nakagawa, Yoshitomo ;   et al.
2002-01-03
Inductively coupled plasma mass spectrometer
Grant 5,477,048 - Nakagawa , et al. December 19, 1
1995-12-19
Inductively coupled plasma mass spectrometry device
Grant 5,334,834 - Ito , et al. August 2, 1
1994-08-02
Inductively coupled plasma mass spectrometry apparatus
Grant 4,999,492 - Nakagawa March 12, 1
1991-03-12
Mask-repairing device
Grant 4,930,439 - Sato , et al. June 5, 1
1990-06-05
Method of correcting a pattern film
Grant 4,902,530 - Yasaka , et al. February 20, 1
1990-02-20
Process for forming pattern film
Grant 4,874,632 - Nakagawa , et al. October 17, 1
1989-10-17
Method and apparatus for modifying patterned film
Grant 4,874,460 - Nakagawa , et al. October 17, 1
1989-10-17
Apparatus for repairing a pattern film
Grant 4,851,097 - Hattori , et al. July 25, 1
1989-07-25

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