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name:-0.0063540935516357
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Nakada; Hyakka Patent Filings

Nakada; Hyakka

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nakada; Hyakka.The latest application filed is for "additive manufacturing condition search apparatus, additive manufacturing condition search method, and reference sample".

Company Profile
8.6.11
  • Nakada; Hyakka - Tokyo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Processing recipe generation device
Grant 11,393,084 - Ishikawa , et al. July 19, 2
2022-07-19
Additive Manufacturing Condition Search Apparatus, Additive Manufacturing Condition Search Method, and Reference Sample
App 20220203455 - KAWANAKA; Hirotsugu ;   et al.
2022-06-30
Computer, method for determining processing control parameter, substitute sample, measurement system, and measurement method
Grant 11,287,782 - Ohmori , et al. March 29, 2
2022-03-29
Processing Condition Determination System And Processing Condition Searching Method
App 20210372943 - Nakada; Hyakka ;   et al.
2021-12-02
Search device, search method and plasma processing apparatus
Grant 11,189,470 - Ohmori , et al. November 30, 2
2021-11-30
Processing Condition Search Device And Processing Condition Search Method
App 20210357810 - Takano; Naoto ;   et al.
2021-11-18
Substitute sample, method for determining control parameter of processing, and measurement system
Grant 11,152,237 - Nakada , et al. October 19, 2
2021-10-19
System and method of determining processing condition
Grant 11,112,775 - Nakada , et al. September 7, 2
2021-09-07
Search Device, Searching Method, And Plasma Processing Apparatus
App 20210263922 - Okuyama; Yutaka ;   et al.
2021-08-26
Processing Recipe Generation Device
App 20210035277 - ISHIKAWA; Masayoshi ;   et al.
2021-02-04
Substitute Sample, Method for Determining Control Parameter of Processing, and Measurement System
App 20200273732 - NAKADA; Hyakka ;   et al.
2020-08-27
Retrieval apparatus and retrieval method for semiconductor device processing
Grant 10,627,788 - Ohmori , et al.
2020-04-21
System And Method Of Determining Processing Condition
App 20190369605 - NAKADA; Hyakka ;   et al.
2019-12-05
Search Device, Search Method And Plasma Processing Apparatus
App 20190295827 - OHMORI; Takeshi ;   et al.
2019-09-26
Search Device, Searching Method, And Plasma Processing Apparatus
App 20190286632 - Okuyama; Yutaka ;   et al.
2019-09-19
Retrieval Apparatus And Retrieval Method
App 20190064751 - OHMORI; Takeshi ;   et al.
2019-02-28
Computer, Method for Determining Processing Control Parameter, Substitute Sample, Measurement System, and Measurement Method
App 20190064755 - OHMORI; Takeshi ;   et al.
2019-02-28

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