Naito; Yoshihiko
Patent Applications and Registrations
Patent applications and USPTO patent grants for Naito; Yoshihiko.The latest application filed is for "inspection device".
Company Profile
0.26.22
- Naito; Yoshihiko - Machida JP
- Naito; Yoshihiko - Tokyo JP
- Naito; Yoshihiko - Ohta-ku N/A JP
- Naito; Yoshihiko - Stow OH US
- Naito; Yoshihiko - Fujisawa JP
- Naito, Yoshihiko - Fujisawa-shi JP
- Naito; Yoshihiko - Nerima JP
Patent Activity
| Patent | Date |
|---|---|
| Locking device for opening and closing lid Grant 10,370,880 - Masuda , et al. | 2019-08-06 |
| Inspection device Grant 10,157,722 - Hatakeyama , et al. Dec | 2018-12-18 |
| Specimen observation method and device using secondary emission electron and mirror electron detection Grant 9,966,227 - Hatakeyama , et al. May 8, 2 | 2018-05-08 |
| Wireless microphone with antenna therein Grant 9,749,725 - Naito , et al. August 29, 2 | 2017-08-29 |
| Microphone Grant 9,615,157 - Naito , et al. April 4, 2 | 2017-04-04 |
| Inspection Device App 20160307726 - Hatakeyama; Masahiro ; et al. | 2016-10-20 |
| Microphone App 20160142804 - NAITO; Yoshihiko ; et al. | 2016-05-19 |
| Locking Device For Opening And Closing Lid App 20160143166 - MASUDA; Akira ; et al. | 2016-05-19 |
| Wireless Microphone App 20160142802 - NAITO; Yoshihiko ; et al. | 2016-05-19 |
| Electron beam apparatus and sample observation method using the same Grant 9,194,826 - Kaga , et al. November 24, 2 | 2015-11-24 |
| Electro-optical inspection apparatus and method with dust or particle collection function Grant 9,105,444 - Watanabe , et al. August 11, 2 | 2015-08-11 |
| Specimen Observation Method And Device Using Secondary Emission Electron And Mirror Electron Detection App 20150060666 - Hatakeyama; Masahiro ; et al. | 2015-03-05 |
| Specimen observation method and device using secondary emission electron and mirror electron detection Grant 8,937,283 - Hatakeyama , et al. January 20, 2 | 2015-01-20 |
| Method and apparatus for inspecting sample surface Grant 8,859,984 - Noji , et al. October 14, 2 | 2014-10-14 |
| Electro-optical Inspection Apparatus And Method With Dust Or Particle Collection Function App 20140091215 - WATANABE; Kenji ; et al. | 2014-04-03 |
| Inspection Device App 20140014848 - Hatakeyama; Masahiro ; et al. | 2014-01-16 |
| Electro-optical inspection apparatus and method with dust or particle collection function Grant 8,624,182 - Watanabe , et al. January 7, 2 | 2014-01-07 |
| Method And Apparatus For Inspecting Sample Surface App 20130313429 - Noji; Nobuharu ; et al. | 2013-11-28 |
| Method and apparatus for inspecting sample surface Grant 8,525,127 - Noji , et al. September 3, 2 | 2013-09-03 |
| High density wireless system Grant 8,497,940 - Green , et al. July 30, 2 | 2013-07-30 |
| Inspection device Grant 8,497,476 - Hatakeyama , et al. July 30, 2 | 2013-07-30 |
| Substrate surface inspection method and inspection apparatus Grant 8,274,047 - Naito , et al. September 25, 2 | 2012-09-25 |
| Inspection Device App 20120235036 - Hatakeyama; Masahiro ; et al. | 2012-09-20 |
| Method And Apparatus For Inspecting Sample Surface App 20120145921 - Noji; Nobuharu ; et al. | 2012-06-14 |
| High Density Wireless System App 20120120313 - Green; Robert ; et al. | 2012-05-17 |
| Electro-optical Inspection Apparatus And Method With Dust Or Particle Collection Function App 20120074316 - WATANABE; Kenji ; et al. | 2012-03-29 |
| Specimen Observation Method And Device, And Inspection Method And Device Using The Method And Device App 20110155905 - Hatakeyama; Masahiro ; et al. | 2011-06-30 |
| Apparatus and method for inspecting sample surface Grant 7,952,071 - Noji , et al. May 31, 2 | 2011-05-31 |
| Sample surface observation method Grant 7,829,853 - Watanabe , et al. November 9, 2 | 2010-11-09 |
| Substrate Surface Inspection Method And Inspection Apparatus App 20100032566 - Naito; Yoshihiko ; et al. | 2010-02-11 |
| Semiconductor Devices And Method Of Testing Same App 20090152595 - Kaga; Toru ; et al. | 2009-06-18 |
| Sample Surface Observation Method App 20090090863 - WATANABE; Kenji ; et al. | 2009-04-09 |
| Method And Apparatus For Inspecting Sample Surface App 20090050802 - Noji; Nobuharu ; et al. | 2009-02-26 |
| Apparatus And Method For Inspecting Sample Surface App 20090026368 - Noji; Nobuharu ; et al. | 2009-01-29 |
| Electron Beam Apparatus And Sample Observation Method Using The Same App 20080251718 - KAGA; Toru ; et al. | 2008-10-16 |
| Optical disk producing device and producing method Grant 6,960,270 - Matsumoto , et al. November 1, 2 | 2005-11-01 |
| Electron beam irradiating apparatus Grant 6,614,037 - Naito September 2, 2 | 2003-09-02 |
| Optical disk producing device and producing method App 20030104097 - Matsumoto, Yutaka ; et al. | 2003-06-05 |
| Electron beam irradiating apparatus App 20010011710 - Naito, Yoshihiko | 2001-08-09 |
| Disk coating system Grant 5,743,965 - Nishimura , et al. April 28, 1 | 1998-04-28 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 