NAIKI; Hiroshi
Patent Applications and Registrations
Patent applications and USPTO patent grants for NAIKI; Hiroshi.The latest application filed is for "microscope".
- NAIKI; Hiroshi - Tokyo JP
- NAIKI; Hiroshi - Ina-shi JP
- Naiki; Hiroshi - Ina JP
| Patent | Date |
|---|---|
| Microscope App 20110169936 - NAIKI; Hiroshi | 2011-07-14 |
| Visual Inspection Apparatus App 20090097737 - HASHIMOTO; Katsuyuki ; et al. | 2009-04-16 |
| Pattern Alignment Method, Pattern Inspection Apparatus, And Pattern Inspection System App 20080144922 - Naiki; Hiroshi | 2008-06-19 |
| Visual inspection apparatus App 20060238753 - Tsuji; Haruyuki ; et al. | 2006-10-26 |
| Defect inspection apparatus Grant 6,954,268 - Naiki , et al. October 11, 2 | 2005-10-11 |
| Defect inspection apparatus App 20040174518 - Naiki, Hiroshi ; et al. | 2004-09-09 |
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