loadpatents
name:-0.0073120594024658
name:-0.0042421817779541
name:-0.0014181137084961
Nagura; Yoshihiro Patent Filings

Nagura; Yoshihiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nagura; Yoshihiro.The latest application filed is for "vortex pattern wet processing tool and etching method".

Company Profile
1.4.6
  • Nagura; Yoshihiro - Yokkaichi JP
  • Nagura; Yoshihiro - Tokyo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Vortex pattern wet processing tool and etching method
Grant 10,283,385 - Watanabe , et al.
2019-05-07
Vortex Pattern Wet Processing Tool And Etching Method
App 20180277378 - WATANABE; Takeshi ;   et al.
2018-09-27
Semiconductor device with process monitor circuit and test method thereof
Grant 6,853,177 - Shibayama , et al. February 8, 2
2005-02-08
Semiconductor integrated circuit
App 20040260975 - Nagura, Yoshihiro
2004-12-23
Test pattern generation circuit and method for use with self-diagnostic circuit
Grant 6,802,034 - Matsuo , et al. October 5, 2
2004-10-05
Semiconductor testing device
Grant 6,784,686 - Nishida , et al. August 31, 2
2004-08-31
Semiconductor testing device
App 20040103357 - Nishida, Hiroki ;   et al.
2004-05-27
Testing device of semiconductor integrated circuit and test method therefor
App 20030023913 - Matsuo, Yukikazu ;   et al.
2003-01-30
Test pattern generation circuit and method for use with self-diagnostic circuit
App 20030018938 - Matsuo, Yukikazu ;   et al.
2003-01-23
Semiconductor device with process monitor circuit and test method thereof
App 20020153525 - Shibayama, Mari ;   et al.
2002-10-24

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