Nagumo; Yuzo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nagumo; Yuzo.The latest application filed is for "surface processing progress monitoring system".

Company Profile

0.6.7

Nagumo; Yuzo - Kizugawa JP
Nagumo; Yuzo - Kyoto JP
NAGUMO; Yuzo - Kizugawa-shi JP
NAGUMO; Yuzo - Kyoto-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Surface processing progress monitoring system Grant 9,460,973 - Kato , et al. October 4, 2	2016-10-04
Thickness monitoring device, etching depth monitoring device and thickness monitoring method Grant 9,228,828 - Goto , et al. January 5, 2	2016-01-05
Depth of hole measurement by subtracting area of two spectra separated by time Grant 9,007,599 - Goto , et al. April 14, 2	2015-04-14
Etching monitor device Grant 9,001,337 - Goto , et al. April 7, 2	2015-04-07
Surface Processing Progress Monitoring System App 20140307262 - KATO; Rui ; et al.	2014-10-16
Thickness Monitoring Device, Etching Depth Monitoring Device And Thickness Monitoring Method App 20130334422 - GOTO; Hiroomi ; et al.	2013-12-19
Etching Monitor Device App 20130314692 - GOTO; Hiroomi ; et al.	2013-11-28
Surface Treatment Status Monitoring Device App 20130265587 - GOTO; Hiroomi ; et al.	2013-10-10
Surface Processing Progress Monitoring System App 20130169958 - GOTO; Hiroomi ; et al.	2013-07-04
Optical measuring device Grant 7,911,610 - Moriya , et al. March 22, 2	2011-03-22
Optical measuring device and method, and nanoparticle measuring method and device Grant 7,760,356 - Moriya , et al. July 20, 2	2010-07-20
Optical Measuring Device App 20090251695 - Moriya; Naoji ; et al.	2009-10-08
Optical Measuring Device and Method, and Nanoparticle Measuring Method and Device App 20080192252 - Moriya; Naoji ; et al.	2008-08-14

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