Nagoya; Takatoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nagoya; Takatoshi.The latest application filed is for "silicon single crystal wafer and method for manufacturing silicon single crystal wafer, and method for evaluating silicon single crystal wafer".

Company Profile

0.12.8

Nagoya; Takatoshi - Annaka N/A JP
Nagoya; Takatoshi - Gunma JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for evaluating oxide dielectric breakdown voltage of a silicon single crystal wafer Grant 8,551,246 - Tahara , et al. October 8, 2	2013-10-08
Silicon Single Crystal Wafer And Method For Manufacturing Silicon Single Crystal Wafer, And Method For Evaluating Silicon Single Crystal Wafer App 20110045246 - Tahara; Fumio ; et al.	2011-02-24
Method for producing annealed wafer and annealed wafer Grant 7,659,216 - Nagoya February 9, 2	2010-02-09
Method for evaluating dopant contamination of semiconductor wafer Grant 7,622,312 - Nagoya November 24, 2	2009-11-24
Method for producing annealed wafer and annealed wafer App 20090011613 - Nagoya; Takatoshi	2009-01-08
Method For Evaluating Dopant Contamination Of Semiconductor Wafer App 20080108155 - Nagoya; Takatoshi	2008-05-08
Method of producing annealed wafer and annealed wafer Grant 7,189,293 - Kobayashi , et al. March 13, 2	2007-03-13
Method of producing annealed wafer and annealed wafer Grant 7,153,785 - Kobayashi , et al. December 26, 2	2006-12-26
Annealed wafer manufacturing method and annealed wafer Grant 6,841,450 - Kobayashi , et al. January 11, 2	2005-01-11
Production method for anneal wafer and anneal wafer App 20040231759 - Kobayashi, Norihiro ; et al.	2004-11-25
Method for manufacturing single-crystal-silicon wafers Grant 6,805,743 - Kobayashi , et al. October 19, 2	2004-10-19
Production method for anneal wafer and anneal wafer App 20040192071 - Kobayashi, Norihiro ; et al.	2004-09-30
Production method for annealed wafer Grant 6,670,261 - Akiyama , et al. December 30, 2	2003-12-30
Method for manufacturing single-crystal-silicon wafers App 20030164139 - Kobayashi, Norihiro ; et al.	2003-09-04
Method of producing anneal wafer and anneal wafer App 20020173173 - Kobayashi, Norihiro ; et al.	2002-11-21
Production method for annealed wafer App 20020160591 - Akiyama, Shoji ; et al.	2002-10-31
Apparatus for growing silicon epitaxial layer Grant 5,487,358 - Ohta , et al. January 30, 1	1996-01-30
Process for growing silicon epitaxial layer Grant 5,421,288 - Ohta , et al. June 6, 1	1995-06-06
Pattern shift measuring method Grant 5,156,982 - Nagoya October 20, 1	1992-10-20

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