loadpatents
name:-0.028371810913086
name:-0.017491102218628
name:-0.0030968189239502
Nagatsuma; Tadao Patent Filings

Nagatsuma; Tadao

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nagatsuma; Tadao.The latest application filed is for "transmission device, and system including the transmission device".

Company Profile
2.14.22
  • Nagatsuma; Tadao - Suita-shi JP
  • Nagatsuma; Tadao - Osaka JP
  • Nagatsuma; Tadao - Atsugi JP
  • Nagatsuma; Tadao - Tokyo JP
  • Nagatsuma; Tadao - Atsugi-shi JP
  • Nagatsuma; Tadao - Sagamihara JP
  • Nagatsuma, Tadao - Sagamihara-shi JP
  • NAGATSUMA, TADAO - KANAGAWA-KEN JP
  • Nagatsuma, Tadao - Kanagawa JP
  • Nagatsuma; Tadao - Isehara JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Transmission Device, And System Including The Transmission Device
App 20210271099 - Kukutsu; Naoya ;   et al.
2021-09-02
Electro-optic probe, electromagnetic wave measuring apparatus, and electromagnetic wave measuring method
Grant 10,761,126 - Hisatake , et al. Sep
2020-09-01
Method for measuring electromagnetic field, electromagnetic field measurement device, and phase imaging device
Grant 10,451,663 - Hisatake , et al. Oc
2019-10-22
Terahertz device and terahertz integrated circuit
Grant 10,276,919 - Diebold , et al.
2019-04-30
Method For Measuring Electromagnetic Field, Electromagnetic Field Measurement Device, And Phase Imaging Device
App 20180238948 - HISATAKE; Shintarou ;   et al.
2018-08-23
Electro-Optic Probe, Electromagnetic Wave Measuring Apparatus, and Electromagnetic Wave Measuring Method
App 20180188305 - Hisatake; Shintarou ;   et al.
2018-07-05
Terahertz Device And Terahertz Integrated Circuit
App 20170250458 - DIEBOLD; Sebastian ;   et al.
2017-08-31
Terahertz-wave device and terahetz-wave integrated circuits
Grant 9,632,247 - Fujita , et al. April 25, 2
2017-04-25
Photonic-crystal slab absorber and high-frequency circuit and electronic components, and transmitter, receiver and proximity wireless communication system
Grant 9,496,622 - Fujita , et al. November 15, 2
2016-11-15
Terahertz-wave Device And Terahetz-wave Integrated Circuits
App 20160178843 - FUJITA; Masayuki ;   et al.
2016-06-23
Teraherz-wave connector and teraherz-wave integrated circuits, and wave guide and antenna structure
Grant 9,188,742 - Fujita , et al. November 17, 2
2015-11-17
Directional Coupler, And Multiplexer And Demultiplexer
App 20150241630 - FUJITA; Masayuki ;   et al.
2015-08-27
Photonic-crystal Slab Absorber And High-frequency Circuit And Electronic Components, And Transmitter, Receiver And Proximity Wireless Communication System
App 20140255040 - FUJITA; Masayuki ;   et al.
2014-09-11
Teraherz-wave Connector And Teraherz-wave Integrated Circuits, And Wave Guide And Antenna Structure
App 20140248020 - FUJITA; Masayuki ;   et al.
2014-09-04
Antenna Module
App 20140132466 - INOUE; Masami ;   et al.
2014-05-15
Specific absorption rate measuring system, and a method thereof
Grant 7,511,511 - Onishi , et al. March 31, 2
2009-03-31
OPTICAL DEVICE FOR GENERATING AND MODULATING THz AND OTHER HIGH FREQUENCY SIGNALS
App 20080199124 - Nagatsuma; Tadao ;   et al.
2008-08-21
Specific Absorption Rate Measuring System, And A Method Thereof
App 20070236229 - Onishi; Teruo ;   et al.
2007-10-11
Specific absorption rate measuring system, and a method thereof
App 20060114003 - Onishi; Teruo ;   et al.
2006-06-01
Electro-optic apparatus for measuring signal potentials
Grant 6,683,447 - Yanagisawa , et al. January 27, 2
2004-01-27
Electro-optic probe and magneto-optic probe
Grant 6,624,644 - Ito , et al. September 23, 2
2003-09-23
Electro-optic sampling probe and measuring method using the same
Grant 6,469,528 - Akikuni , et al. October 22, 2
2002-10-22
Probe For Electro-optic Sampling Oscilloscope
App 20020140416 - Toriyama, Noriyuki ;   et al.
2002-10-03
Electro-optic probe
App 20020092975 - Ito, Akishige ;   et al.
2002-07-18
Electro-optic Sampling Probe And Measuring Method Using The Same
App 20020030500 - AKIKUNI, FUMIO ;   et al.
2002-03-14
Electro-optic sampling probe
App 20020017913 - Yagi, Toshiyuki ;   et al.
2002-02-14
Electro-optical Probe For Oscilloscope Measuring Signal Waveform
App 20020011830 - ITO, AKISHIGE ;   et al.
2002-01-31
Electro-optic probe and magneto-optic probe
App 20020008533 - Ito, Akishige ;   et al.
2002-01-24
Pattern forming method
App 20010027019 - Ishii, Hiromu ;   et al.
2001-10-04
Probe signal outputting apparatus
App 20010022338 - Yanagisawa, Yoshiki ;   et al.
2001-09-20
Electro-optic probe
App 20010022340 - Ito, Akishige ;   et al.
2001-09-20
Probe signal outputting apparatus
App 20010022339 - Yanagisawa, Yoshiki ;   et al.
2001-09-20
Electro-optic sampling oscilloscope
Grant 6,201,235 - Takeuchi , et al. March 13, 2
2001-03-13
Electro-optic probe
Grant 6,166,845 - Ito , et al. December 26, 2
2000-12-26
Electric signal measurement apparatus using electro-optic sampling by one point contact
Grant 5,808,473 - Shinagawa , et al. September 15, 1
1998-09-15
Method and apparatus for electro-optic sampling measurement of electrical signals in integrated circuits
Grant 5,274,325 - Shinagawa , et al. December 28, 1
1993-12-28

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