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Patent applications and USPTO patent grants for Nagatomo; Hiroto.The latest application filed is for "production line constructing system".
Patent | Date |
---|---|
Inspection data analyzing system Grant 6,628,817 - Ishikawa , et al. September 30, 2 | 2003-09-30 |
Production line constructing system App 20020064440 - Ikeda, Minoru ;   et al. | 2002-05-30 |
Inspection data analyzing system App 20020034326 - Ishikawa, Seiji ;   et al. | 2002-03-21 |
Inspection data analyzing system App 20010038708 - Ishikawa, Seiji ;   et al. | 2001-11-08 |
Inspection data analyzing system App 20010001015 - Ishikawa, Seiji ;   et al. | 2001-05-10 |
Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic device Grant 6,185,322 - Ishikawa , et al. February 6, 2 | 2001-02-06 |
Method and apparatus for carrying a variety of products Grant 5,536,128 - Shimoyashiro , et al. July 16, 1 | 1996-07-16 |
Pattern defect inspection apparatus Grant 4,731,855 - Suda , et al. March 15, 1 | 1988-03-15 |
Manufacturing system Grant 4,544,318 - Nagatomo , et al. October 1, 1 | 1985-10-01 |
Method of inspecting the surface of an object and apparatus therefor Grant 4,342,515 - Akiba , et al. August 3, 1 | 1982-08-03 |
Surface treatment device Grant 4,282,825 - Nagatomo , et al. August 11, 1 | 1981-08-11 |
Apparatus For Forming Films Grant 3,641,974 - Yamada , et al. February 15, 1 | 1972-02-15 |
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