Nagaoki; Isao
Patent Applications and Registrations
Patent applications and USPTO patent grants for Nagaoki; Isao.The latest application filed is for "charged particle beam apparatus, electron microscope and sample observation method".
Company Profile
0.26.32
- Nagaoki; Isao - Tokyo JP
- Nagaoki; Isao - Hitachinaka N/A JP
- NAGAOKI, ISAO - HITACHINAKA-SHI JP
Patent Activity
| Patent | Date |
|---|---|
| Electron microscope and sample observation method Grant 10,083,814 - Nagaoki , et al. September 25, 2 | 2018-09-25 |
| Charged Particle Beam Apparatus, Electron Microscope And Sample Observation Method App 20170323762 - OOYAGI; Toshiyuki ; et al. | 2017-11-09 |
| Sample holder and charged particle device Grant 9,721,752 - Nagakubo , et al. August 1, 2 | 2017-08-01 |
| Sample Holder For Charged Particle Beam Device, And Charged Particle Beam Device App 20170018397 - SUZUKI; Yuya ; et al. | 2017-01-19 |
| Sample Holder and Charged Particle Device App 20160211109 - NAGAKUBO; Yasuhira ; et al. | 2016-07-21 |
| Electron Microscope and Sample Observation Method App 20160064183 - NAGAOKI; Isao ; et al. | 2016-03-03 |
| Soundproof Cover For Charged-particle Beam Device, And Charged-particle Beam Device App 20150041676 - Muto; Daisuke ; et al. | 2015-02-12 |
| Charged corpuscular ray apparatus Grant 8,928,485 - Kikuchi , et al. January 6, 2 | 2015-01-06 |
| Electron Microscope App 20140103208 - Noda; Hiroyuki ; et al. | 2014-04-17 |
| Transmission electron microscope and sample observation method Grant 8,586,922 - Nagaoki , et al. November 19, 2 | 2013-11-19 |
| Transmission Interference Microscope App 20130163076 - Nagaoki; Isao ; et al. | 2013-06-27 |
| Electron microscope Grant 8,426,811 - Nagaoki , et al. April 23, 2 | 2013-04-23 |
| Electron Microscope, And Method For Adjustng Optical Axis Of Electron Microscope App 20130062519 - Oyagi; Toshiyuki ; et al. | 2013-03-14 |
| Charged particle beam device Grant 8,288,725 - Fujisawa , et al. October 16, 2 | 2012-10-16 |
| Transmission Electron Microscope and Sample Observation Method App 20120235035 - Nagaoki; Isao ; et al. | 2012-09-20 |
| Electron microscopy Grant 8,044,352 - Hosoya , et al. October 25, 2 | 2011-10-25 |
| Scanning Charged Particle Microscope App 20110254944 - Ishitani; Tohru ; et al. | 2011-10-20 |
| Electron Microscope App 20110133084 - Nagaoki; Isao ; et al. | 2011-06-09 |
| Charged Corpuscular Ray Apparatus App 20110115637 - Kikuchi; Hideki ; et al. | 2011-05-19 |
| Electron microscope Grant D636,005 - Oonuma , et al. April 12, 2 | 2011-04-12 |
| Charged Particle Beam Device App 20110062327 - FUJISAWA; Akiko ; et al. | 2011-03-17 |
| Image forming method and electron microscope Grant 7,838,834 - Nagaoki , et al. November 23, 2 | 2010-11-23 |
| Charged particle beam device Grant 7,838,829 - Fujisawa , et al. November 23, 2 | 2010-11-23 |
| Electron Microscopy App 20090242792 - HOSOYA; KOTARO ; et al. | 2009-10-01 |
| Method and device for observing a specimen in a field of view of an electron microscope Grant 7,544,936 - Inada , et al. June 9, 2 | 2009-06-09 |
| Charged Particle Beam Device App 20080224037 - FUJISAWA; Akiko ; et al. | 2008-09-18 |
| Image Forming Method and Electron Microscope App 20080224040 - NAGAOKI; Isao ; et al. | 2008-09-18 |
| Scanning Transmission Charged Particle Beam Device App 20080197282 - Nakayama; Yoshihiko ; et al. | 2008-08-21 |
| Method and device for observing a specimen in a field of view of an electron microscope App 20070176103 - Inada; Hiromi ; et al. | 2007-08-02 |
| Sample observation method and transmission electron microscope Grant 7,214,938 - Nakazawa , et al. May 8, 2 | 2007-05-08 |
| Method and device for observing a specimen in a field of view of an electron microscope Grant 7,164,129 - Inada , et al. January 16, 2 | 2007-01-16 |
| Method and device for observing a specimen in a field of view of an electron microscope App 20060097169 - Inada; Hiromi ; et al. | 2006-05-11 |
| Electron microscope Grant 7,041,977 - Nakazawa , et al. May 9, 2 | 2006-05-09 |
| Method and device for observing a specimen in a field of view of an electron microscope Grant 7,022,989 - Inada , et al. April 4, 2 | 2006-04-04 |
| Method and device for observing a specimen in a field of view of an electron microscope Grant 7,012,254 - Inada , et al. March 14, 2 | 2006-03-14 |
| Sample observation method and transmission electron microscope App 20060011838 - Nakazawa; Eiko ; et al. | 2006-01-19 |
| Sample observation method and transmission electron microscope Grant 6,982,420 - Nakazawa , et al. January 3, 2 | 2006-01-03 |
| Electron microscope App 20050145792 - Nakazawa, Eiko ; et al. | 2005-07-07 |
| Electron microscope Grant 6,888,139 - Tsuneta , et al. May 3, 2 | 2005-05-03 |
| Method and device for observing a specimen in a field of view of an electron Grant 6,878,934 - Inada , et al. April 12, 2 | 2005-04-12 |
| Electron microscope and means to set observation conditions Grant 6,875,983 - Nakazawa , et al. April 5, 2 | 2005-04-05 |
| Method and device for observing a specimen in a field of view of an electron microscope App 20050035293 - Inada, Hiromi ; et al. | 2005-02-17 |
| Method and device for observing a specimen in a field of view of an electron microscope App 20040173749 - Inada, Hiromi ; et al. | 2004-09-09 |
| Method of observing a sample by a transmission electron microscope Grant 6,777,679 - Nagaoki , et al. August 17, 2 | 2004-08-17 |
| Sample observation method and transmission electron microscope App 20040114788 - Nakazawa, Eiko ; et al. | 2004-06-17 |
| Electron microscope App 20030201393 - Tsuneta, Ruriko ; et al. | 2003-10-30 |
| Method of observing a sample by a transmission electron microscope App 20030183762 - Nagaoki, Isao ; et al. | 2003-10-02 |
| Autoadjusting electron microscope Grant 6,570,156 - Tsuneta , et al. May 27, 2 | 2003-05-27 |
| Electron microscope App 20020175282 - Nakazawa, Eiko ; et al. | 2002-11-28 |
| Electron microscope Grant 6,472,663 - Nagaoki , et al. October 29, 2 | 2002-10-29 |
| Electron Microscope App 20020033451 - NAGAOKI, ISAO ; et al. | 2002-03-21 |
| Method and device for observing a specimen in a field of view of an electron microscope App 20020027199 - Inada, Hiromi ; et al. | 2002-03-07 |
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