NAGAO; Takuro
Patent Applications and Registrations
Patent applications and USPTO patent grants for NAGAO; Takuro.The latest application filed is for "electron beam inspection apparatus and electron beam inspection method".
- NAGAO; Takuro - Kawasaki-shi JP
- Nagao; Takuro - Kawasaki JP
| Patent | Date |
|---|---|
| Electron Beam Inspection Apparatus And Electron Beam Inspection Method App 20220270845 - NAGAO; Takuro | 2022-08-25 |
| Pattern inspecting method and pattern inspecting apparatus Grant 7,359,043 - Tsuchiya , et al. April 15, 2 | 2008-04-15 |
| Pattern inspecting method and pattern inspecting apparatus App 20040184652 - Tsuchiya, Hideo ; et al. | 2004-09-23 |
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