Nagakubo; Yasuhira

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nagakubo; Yasuhira.The latest application filed is for "specimen holder and charged particle beam device provided with same".

Company Profile

3.25.18

Nagakubo; Yasuhira - Tokyo JP
Nagakubo; Yasuhira - Hitachinaka JP
Nagakubo; Yasuhira - Hitahinaka JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Specimen holder and charged particle beam device provided with same Grant 11,177,109 - Yaguchi , et al. November 16, 2	2021-11-16
Specimen holder and charged particle beam device provided with same Grant 11,133,150 - Yaguchi , et al. September 28, 2	2021-09-28
Cryostation system Grant 10,658,150 - Nagakubo , et al.	2020-05-19
Specimen Holder and Charged Particle Beam Device Provided with Same App 20190180978 - YAGUCHI; Toshie ; et al.	2019-06-13
Charged particle beam device, electron microscope and sample observation method Grant 10,204,761 - Sunaoshi , et al. Feb	2019-02-12
Electron microscope and sample observation method Grant 10,083,814 - Nagaoki , et al. September 25, 2	2018-09-25
Charged particle beam device and sample holder for charged particle beam device Grant 10,068,745 - Yaguchi , et al. September 4, 2	2018-09-04
Charged Particle Beam Device, Electron Microscope and Sample Observation Method App 20170221676 - SUNAOSHI; Takeshi ; et al.	2017-08-03
Sample holder and charged particle device Grant 9,721,752 - Nagakubo , et al. August 1, 2	2017-08-01
Cryostation System App 20170213693 - NAGAKUBO; Yasuhira ; et al.	2017-07-27
Sample holder for electron microscope Grant 9,558,910 - Terada , et al. January 31, 2	2017-01-31
Specimen cryo holder and dewar Grant 9,543,112 - Nagakubo , et al. January 10, 2	2017-01-10
Charged particle radiation device and specimen preparation method using said device Grant 9,449,786 - Tsuchiya , et al. September 20, 2	2016-09-20
Charged Particle Beam Device and Sample Holder for Charged Particle Beam Device App 20160217971 - YAGUCHI; Toshie ; et al.	2016-07-28
Sample Holder and Charged Particle Device App 20160211109 - NAGAKUBO; Yasuhira ; et al.	2016-07-21
Electron microscope and electron microscope sample retaining device Grant 9,378,922 - Yaguchi , et al. June 28, 2	2016-06-28
Charged Particle Radiation Device and Specimen Preparation Method Using Said Device App 20160071687 - TSUCHIYA; Miki ; et al.	2016-03-10
Electron Microscope and Sample Observation Method App 20160064183 - NAGAOKI; Isao ; et al.	2016-03-03
Specimen Cryo Holder and Dewar App 20150340199 - NAGAKUBO; Yasuhira ; et al.	2015-11-26
Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatus Grant 9,099,281 - Yaguchi , et al. August 4, 2	2015-08-04
Electron Microscope And Electron Microscope Sample Retaining Device App 20150179396 - Yaguchi; Toshie ; et al.	2015-06-25
Sample Holder For Electron Microscope App 20140353499 - Terada; Shohei ; et al.	2014-12-04
Electron microscope and sample holder Grant 8,878,144 - Yaguchi , et al. November 4, 2	2014-11-04
Sample holder, method for use of the sample holder, and charged particle device Grant 8,853,648 - Nagakubo , et al. October 7, 2	2014-10-07
Sample device for charged particle beam Grant 8,729,497 - Nagakubo , et al. May 20, 2	2014-05-20
Electron beam device and sample holding device for electron beam device Grant 8,604,429 - Yaguchi , et al. December 10, 2	2013-12-10
Sample Device For Charged Particle Beam App 20130193343 - Nagakubo; Yasuhira ; et al.	2013-08-01
Electron Microscope And Sample Holder App 20120305769 - Yaguchi; Toshie ; et al.	2012-12-06
Charged Particle Radiation Apparatus, and Method for Displaying Three-Dimensional Information in Charged Particle Radiation Apparatus App 20120212583 - Yaguchi; Toshie ; et al.	2012-08-23
Fixation device for a sample case for an electron microscope Grant D660,335 - Nagakubo , et al. May 22, 2	2012-05-22
Sample Holder, Method For Use Of The Sample Holder, And Charged Particle Device App 20120112064 - Nagakubo; Yasuhira ; et al.	2012-05-10
Sample case for an electron microscope Grant D651,226 - Nagakubo , et al. December 27, 2	2011-12-27
Electron Beam Device And Sample Holding Device For Electron Beam Device App 20110303845 - Yaguchi; Toshie ; et al.	2011-12-15
Heating stage for a micro-sample Grant 7,700,927 - Nagakubo , et al. April 20, 2	2010-04-20
Heating Stage For A Micro-sample App 20080290290 - NAGAKUBO; Yasuhira ; et al.	2008-11-27
Nanoscale standard sample and its manufacturing method Grant 6,972,405 - Nagakubo , et al. December 6, 2	2005-12-06
Nanoscale standard sample and its manufacturing method App 20050017162 - Nagakubo, Yasuhira ; et al.	2005-01-27

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