NAGAI; Takamitsu

Patent Applications and Registrations

Patent applications and USPTO patent grants for NAGAI; Takamitsu.The latest application filed is for "electron microscope and beam irradiation method".

Company Profile

0.20.16

NAGAI; Takamitsu - Yokkaichi Mie JP
Nagai; Takamitsu - Yokohama JP
Nagai; Takamitsu - Yokohama-shi JP
Nagai; Takamitsu - Kanagawa JP
Nagai; Takamitsu - Tokyo JP
Nagai; Takamitsu - Machida JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Electron Microscope And Beam Irradiation Method App 20200411278 - NAGAI; Takamitsu	2020-12-31
Inspection system by charged particle beam and method of manufacturing devices using the system Grant 9,368,314 - Nakasuji , et al. June 14, 2	2016-06-14
Inspection System By Charged Particle Beam And Method Of Manufacturing Devices Using The System App 20140319346 - Nakasuji; Mamoru ; et al.	2014-10-30
Inspection system by charged particle beam and method of manufacturing devices using the system Grant 8,803,103 - Nakasuji , et al. August 12, 2	2014-08-12
Inspection System By Charged Particle Beam And Method Of Manufacturing Devices Using The System App 20140034831 - Nakasuji; Mamoru ; et al.	2014-02-06
Inspection system by charged particle beam and method of manufacturing devices using the system Grant 8,368,031 - Nakasuji , et al. February 5, 2	2013-02-05
Inspection System By Charged Particle Beam And Method Of Manufacturing Devices Using The System App 20120032079 - Nakasuji; Mamoru ; et al.	2012-02-09
Inspection system by charged particle beam and method of manufacturing devices using the system Grant 8,053,726 - Nakasuji , et al. November 8, 2	2011-11-08
Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus Grant 7,973,281 - Hayashi , et al. July 5, 2	2011-07-05
Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device Grant 7,847,250 - Nagahama , et al. December 7, 2	2010-12-07
Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus App 20090272901 - Hayashi; Hiroyuki ; et al.	2009-11-05
Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus Grant 7,573,066 - Hayashi , et al. August 11, 2	2009-08-11
Electron beam inspection system and inspection method and method of manufacturing devices using the system Grant 7,569,838 - Watanabe , et al. August 4, 2	2009-08-04
Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device App 20090072139 - Nagahama; Ichirota ; et al.	2009-03-19
Inspection system by charged particle beam and method of manufacturing devices using the system App 20090032708 - Nakasuji; Mamoru ; et al.	2009-02-05
Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device Grant 7,462,829 - Nagahama , et al. December 9, 2	2008-12-09
Inspection system by charged particle beam and method of manufacturing devices using the system Grant 7,411,191 - Nakasuji , et al. August 12, 2	2008-08-12
Electron beam inspection system and inspection method and method of manufacturing devices using the system App 20080173814 - Watanabe; Kenji ; et al.	2008-07-24
Electron beam inspection system and inspection method and method of manufacturing devices using the system Grant 7,351,969 - Watanabe , et al. April 1, 2	2008-04-01
Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus App 20080011947 - Hayashi; Hiroyuki ; et al.	2008-01-17
Method and apparatus for determining defect detection sensitivity data, control method of defect detection apparatus, and method and apparatus for detecting defect of semiconductor devices Grant 7,302,091 - Hamaguchi , et al. November 27, 2	2007-11-27
Inspection system by charged particle beam and method of manufacturing devices using the same App 20070235644 - Nakasuji; Mamoru ; et al.	2007-10-11
Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device App 20070187600 - Nagahama; Ichirota ; et al.	2007-08-16
Inspection system by charged particle beam and method of manufacturing devices using the system Grant 7,241,993 - Nakasuji , et al. July 10, 2	2007-07-10
Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device Grant 7,211,796 - Nagahama , et al. May 1, 2	2007-05-01
Electron beam inspection system and inspection method and method of manufacturing devices using the system App 20060118719 - Watanabe; Kenji ; et al.	2006-06-08
Electron beam inspection system and inspection method and method of manufacturing devices using the system Grant 6,992,290 - Watanabe , et al. January 31, 2	2006-01-31
Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device App 20050029451 - Nagahama, Ichirota ; et al.	2005-02-10
Method and apparatus for determining defect detection sensitivity data, control method of defect detection apparatus, and method and apparatus for detecting defect of semiconductor devices App 20040151362 - Hamaguchi, Akira ; et al.	2004-08-05
Substrate inspecting system using electron beam and substrate inspecting method using electron beam Grant 6,563,114 - Nagahama , et al. May 13, 2	2003-05-13
Electron beam inspection system and inspection method and method of manufacturing devices using the system App 20020088940 - Watanabe, Kenji ; et al.	2002-07-11
Inspection system by charged particle beam and method of manufacturing devices using the system App 20020028399 - Nakasuji, Mamoru ; et al.	2002-03-07
Inspection method and apparatus using electron beam Grant 6,265,719 - Yamazaki , et al. July 24, 2	2001-07-24
Electron beam inspection method and apparatus Grant 6,259,094 - Nagai , et al. July 10, 2	2001-07-10
Electrostatic lens and method for producing the same Grant 5,444,256 - Nagai , et al. August 22, 1	1995-08-22

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.