loadpatents
Patent applications and USPTO patent grants for Nadeau; Douglas P..The latest application filed is for "stop motion imaging detection system and method".
Patent | Date |
---|---|
Design structure for facilitating engineering changes in integrated circuits Grant 7,480,888 - Ogilvie , et al. January 20, 2 | 2009-01-20 |
Stop Motion Imaging Detection System And Method App 20050244047 - Kern, Frederick W. Jr. ;   et al. | 2005-11-03 |
Brush pressure control system for chemical and mechanical treatment of semiconductor surfaces Grant 6,647,579 - Manfredi , et al. November 18, 2 | 2003-11-18 |
Off-concentric polishing system design App 20020182866 - Huynh, Cuc K. ;   et al. | 2002-12-05 |
Off-concentric polishing system design Grant 6,432,823 - Huynh , et al. August 13, 2 | 2002-08-13 |
Brush pressure control system for chemical and mechanical treatment of semiconductor surfaces App 20020073495 - Manfredi, Paul A. ;   et al. | 2002-06-20 |
Method for chemical mechanical polishing of semiconductor wafer Grant 6,300,246 - Huynh , et al. October 9, 2 | 2001-10-09 |
Wafer carrier rinsing mechanism App 20010023166 - Huynh, Cuc Kim ;   et al. | 2001-09-20 |
Wafer carrier rinsing mechanism Grant 6,287,178 - Huynh , et al. September 11, 2 | 2001-09-11 |
CMP polishing pad backside modifications for advantageous polishing results Grant 5,913,713 - Cheek , et al. June 22, 1 | 1999-06-22 |
Silicon wafer cleaning and polishing pads Grant 5,778,481 - Amsden , et al. July 14, 1 | 1998-07-14 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.