Nada; Hiroshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nada; Hiroshi.The latest application filed is for "current supply device and test system including the same".

Company Profile

0.4.6

Nada; Hiroshi - Tokyo JP
Nada; Hiroshi - Hachioji JP
Nada; Hiroshi - Loveland CO

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Current Supply Device And Test System Including The Same App 20220236319 - Yawata; Ken ; et al.	2022-07-28
Current supply device and test system including the same Grant 11,333,701 - Yawata , et al. May 17, 2	2022-05-17
Current Supply Device And Test System Including The Same App 20210231728 - Yawata; Ken ; et al.	2021-07-29
System and apparatus for measuring capacitance Grant 9,651,596 - Takano , et al. May 16, 2	2017-05-16
System And Apparatus For Measuring Capacitance App 20150061720 - Takano; Kenichi ; et al.	2015-03-05
Capacitance measuring apparatus and capacitance measuring method Grant 7,812,619 - Tanida , et al. October 12, 2	2010-10-12
Switch Module for Semiconductor Characteristic Measurement and Measurement Method of Semiconductor Characteristics App 20090267634 - Nada; Hiroshi ; et al.	2009-10-29
Capacitance measuring apparatus and capacitance measuring method App 20080068029 - Tanida; Shinichi ; et al.	2008-03-20
Method and apparatus for a reliability testing App 20060208754 - Takeuchi; Yasuhiro ; et al.	2006-09-21
Method and apparatus for measuring the breakdown voltage of semiconductor devices Grant 5,285,151 - Akama , et al. February 8, 1	1994-02-08

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