loadpatents
name:-0.031013965606689
name:-0.025867938995361
name:-0.0082850456237793
Nackaerts; Axel Patent Filings

Nackaerts; Axel

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nackaerts; Axel.The latest application filed is for "communications device".

Company Profile
6.25.27
  • Nackaerts; Axel - Haasrode BE
  • Nackaerts; Axel - Heverlee BE
  • Nackaerts; Axel - Leuven BE
  • Nackaerts; Axel - Haarsrode BE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Device for electromagnetic structural characterization
Grant 11,293,963 - Kerselaers , et al. April 5, 2
2022-04-05
Communications Device
App 20200382153 - Nackaerts; Axel
2020-12-03
Segmented platform for items
Grant 10,747,851 - Nackaerts A
2020-08-18
Liquid exposure sensing device and controller
Grant 10,712,303 - Nackaerts
2020-07-14
Liquid Exposure Sensing Device And Controller
App 20200049650 - Nackaerts; Axel
2020-02-13
Wireless device
Grant 10,498,397 - Nackaerts , et al. De
2019-12-03
Buffer device, an electronic system, and a method for operating a buffer device
Grant 10,417,147 - Nackaerts Sept
2019-09-17
Fluid flow device
Grant 10,384,001 - Nackaerts , et al. A
2019-08-20
Device For Electromagnetic Structural Characterization
App 20190162766 - Kerselaers; Anthony ;   et al.
2019-05-30
Segmented Platform For Items
App 20180357388 - Nackaerts; Axel
2018-12-13
Integrated circuit with a pressure sensor
Grant 10,060,817 - Nackaerts , et al. August 28, 2
2018-08-28
Fluid Flow Device
App 20180200431 - Nackaerts; Axel ;   et al.
2018-07-19
Buffer Device, An Electronic System, And A Method For Operating A Buffer Device
App 20180046590 - Nackaerts; Axel
2018-02-15
Substance detection device
Grant 9,739,774 - Nackaerts , et al. August 22, 2
2017-08-22
Analyte detection methods and devices
Grant 9,606,115 - Nguyen , et al. March 28, 2
2017-03-28
Substance Detection Device
App 20170067891 - Nackaerts; Axel ;   et al.
2017-03-09
Integrated Circuit With A Pressure Sensor
App 20160377497 - NACKAERTS; Axel ;   et al.
2016-12-29
Method of manufacturing an integrated circuit comprising a pressure sensor
Grant 9,481,570 - Nackaerts , et al. November 1, 2
2016-11-01
Wound Monitoring
App 20160228049 - Nackaerts; Axel ;   et al.
2016-08-11
Method Of Manufacturing An Integrated Circuit Comprising A Pressure Sensor
App 20160167957 - NACKAERTS; Axel ;   et al.
2016-06-16
Integrated circuit with pressure sensor having a pair of electrodes
Grant 9,269,832 - Nackaerts , et al. February 23, 2
2016-02-23
Lighting system
Grant 9,210,761 - Nackaerts , et al. December 8, 2
2015-12-08
Analyte Detection Methods And Devices
App 20150226736 - Nguyen; Viet Hoang ;   et al.
2015-08-13
Integrated circuit with ion sensitive sensor and manufacturing method
Grant 9,099,486 - Merz , et al. August 4, 2
2015-08-04
Sensor
Grant 8,957,687 - Nackaerts , et al. February 17, 2
2015-02-17
Sensor and measurement method
Grant 8,872,520 - Nackaerts , et al. October 28, 2
2014-10-28
Capacitive sensor, integrated circuit, electronic device and method
Grant 8,779,781 - Nguyen , et al. July 15, 2
2014-07-15
Integrated Circuit With Ion Sensitive Sensor And Manufacturing Method
App 20130334619 - Merz; Matthias ;   et al.
2013-12-19
Integrated Circuit With Pressure Sensor And Manufacturing Method
App 20130328142 - Nackaerts; Axel ;   et al.
2013-12-12
Temperature Sensor, Electronic Device and Temperature Measurement Method
App 20130070807 - Ponomarev; Youri Victorovitch ;   et al.
2013-03-21
Lighting System
App 20130057157 - Nackaerts; Axel ;   et al.
2013-03-07
Sensor
App 20120286803 - Nackaerts; Axel ;   et al.
2012-11-15
Capacitive Sensor, Integrated Circuit, Electronic Device And Method
App 20120256645 - Nguyen; Viet Hoang ;   et al.
2012-10-11
Optimization
Grant 8,136,078 - Nackaerts , et al. March 13, 2
2012-03-13
Method for high topography patterning
Grant 8,021,989 - Verhaegen , et al. September 20, 2
2011-09-20
Sensor And Measurement Method
App 20110175595 - NACKAERTS; Axel ;   et al.
2011-07-21
Methods for Manufacturing Dense Integrated Circuits
App 20110084313 - Witters; Liesbeth ;   et al.
2011-04-14
Semiconductor device for measuring an overlay error, method for measuring an overlay error, lithographic apparatus and device manufacturing method
Grant 7,786,477 - Dusa , et al. August 31, 2
2010-08-31
Method for making quantum dots
Grant 7,737,008 - Rooyackers , et al. June 15, 2
2010-06-15
Semiconductor device for measuring an overlay error, method for measuring an overlay error, lithographic apparatus and device manufacturing method
Grant 7,704,850 - Dusa , et al. April 27, 2
2010-04-27
Method For Making Quantum Dots
App 20090137102 - Rooyackers; Rita ;   et al.
2009-05-28
Design Optimization
App 20090112344 - Nackaerts; Axel ;   et al.
2009-04-30
Semiconductor device for measuring an overlay error, method for measuring an overlay error, lithographic apparatus and device manufacturing method
App 20080149925 - Dusa; Mircea ;   et al.
2008-06-26
Semiconductor device for measuring an overlay error, method for measuring an overlay error, lithographic apparatus and device manufacturing method
App 20080061291 - Dusa; Mircea ;   et al.
2008-03-13
Methods for manufacturing dense integrated circuits
App 20070172770 - Witters; Liesbeth ;   et al.
2007-07-26
Method for high topography patterning
App 20070140637 - Verhaegen; Staf ;   et al.
2007-06-21

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed