Nabatova-Gabain; Nataliya

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nabatova-Gabain; Nataliya.The latest application filed is for "sample analyzing method, sample analyzing apparatus, manufacturing method of organic el element, manufacturing equipment, and recording medium".

Company Profile

0.9.9

Nabatova-Gabain; Nataliya - Manimi-ku JP
Nabatova-Gabain; Nataliya - Kyoto JP
Nabatova-Gabain; Nataliya - Tokyo JP
Nabatova-Gabain; Nataliya - Kyoto-shi JP
Nabatova-Gabain, Nataliya - Suginami-ku JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical measurement apparatus, spectroscopic ellipsometer, recording medium, and measurement method Grant 8,199,336 - Nabatova-Gabain , et al. June 12, 2	2012-06-12
Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording medium Grant 8,013,997 - Nabatova-Gabain , et al. September 6, 2	2011-09-06
Sample Analyzing Method, Sample Analyzing Apparatus, Manufacturing Method Of Organic El Element, Manufacturing Equipment, And Recording Medium App 20100136217 - Nabatova-Gabain; Nataliya ; et al.	2010-06-03
Optical Measurement Apparatus, Spectroscopic Ellipsometer, Recording Medium, And Measurement Method App 20100121607 - Nabatova-Gabain; Nataliya ; et al.	2010-05-13
Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording medium Grant 7,688,446 - Nabatova-Gabain , et al. March 30, 2	2010-03-30
Film forming condition determination method, film forming method, and film structure manufacturing method Grant 7,567,872 - Funakubo , et al. July 28, 2	2009-07-28
Optical characteristic analysis method, sample measuring apparatus and spectroscopic ellipsometer Grant 7,280,208 - Funakubo , et al. October 9, 2	2007-10-09
Measuring method, analyzing method, measuring apparatus, analyzing apparatus, ellipsometer, and computer program Grant 7,280,210 - Nabatova-Gabain , et al. October 9, 2	2007-10-09
Thin-film characteristic measuring method using spectroellipsometer Grant 7,271,901 - Nabatova-Gabain , et al. September 18, 2	2007-09-18
Sample analyzing method, sample analyzing apparatus, manufacturing method of organic EL element, manufacturing equipment, and recording medium App 20070121124 - Nabatova-Gabain; Nataliya ; et al.	2007-05-31
Method for analyzing thin-film layer structure using spectroscopic ellipsometer Grant 7,196,793 - Nabatova-Gabain , et al. March 27, 2	2007-03-27
Sample analysis method Grant 7,167,242 - Nabatova-Gabain , et al. January 23, 2	2007-01-23
Film forming condition determination method, film forming method, and film structure manufacturing method App 20060068513 - Funakubo; Hiroshi ; et al.	2006-03-30
Optical characteristic analysis method, sample measuring apparatus and spectroscopic ellipsometer App 20060023213 - Funakubo; Hiroshi ; et al.	2006-02-02
Sample analysis method App 20050219529 - Nabatova-Gabain, Nataliya ; et al.	2005-10-06
Measuring method, analyzing method, measuring apparatus, analyzing apparatus, ellipsometer, and computer program App 20050200845 - Nabatova-Gabain, Nataliya ; et al.	2005-09-15
Method for analyzing thin-film layer structure using spectroscopic ellipsometer App 20040265477 - Nabatova-Gabain, Nataliya ; et al.	2004-12-30
Thin-flim characteristic measuring method using spectroellipsometer App 20040207844 - Nabatova-Gabain, Nataliya ; et al.	2004-10-21

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.