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Patent applications and USPTO patent grants for Muris; Mathias N. M..The latest application filed is for "circuit with interconnect test unit".
Patent | Date |
---|---|
Circuit with interconnect test unit Grant 6,807,505 - De Jong , et al. October 19, 2 | 2004-10-19 |
Circuit with interconnect test unit App 20040059535 - De Jong, Franciscus G.M. ;   et al. | 2004-03-25 |
Circuit with interconnect test unit and a method of testing interconnects between a first and a second electronic circuit Grant 6,622,108 - De Jong , et al. September 16, 2 | 2003-09-16 |
Connection Test Method App 20010013781 - DE JONG, FRANCISCUS G.M. ;   et al. | 2001-08-16 |
Method for generating test patterns to detect an electric shortcircuit, a method for testing electric circuitry while using test patterns so generated, and a tester device for testing electric circuitry with such test patterns Grant 5,636,229 - Eerenstein , et al. June 3, 1 | 1997-06-03 |
Sequential finite-state machine circuit and integrated circuit Grant 5,097,151 - Eerenstein , et al. March 17, 1 | 1992-03-17 |
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