loadpatents
name:-0.0095009803771973
name:-0.014019966125488
name:-0.00047922134399414
Muray; Lawrence P. Patent Filings

Muray; Lawrence P.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Muray; Lawrence P..The latest application filed is for "arrayed column detector".

Company Profile
0.13.10
  • Muray; Lawrence P. - Milpitas CA
  • Muray; Lawrence P. - Moraga CA
  • Muray; Lawrence P - Moraga CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Arrayed column detector
Grant 11,239,048 - Brodie , et al. February 1, 2
2022-02-01
Arrayed Column Detector
App 20210280386 - Brodie; Alan D. ;   et al.
2021-09-09
Imaging apparatus having a plurality of movable beam columns, and method of inspecting a plurality of regions of a substrate intended to be substantially identical
Grant 10,026,588 - Werder , et al. July 17, 2
2018-07-17
Imaging Apparatus Having A Plurality Of Movable Beam Columns, And Method Of Inspecting A Plurality Of Regions Of A Substrate Intended To Be Substantially Identical
App 20160064185 - Werder; Kurt Stephen ;   et al.
2016-03-03
High-voltage energy-dispersive spectroscopy using a low-voltage scanning electron microscope
Grant 9,099,276 - Muray , et al. August 4, 2
2015-08-04
High-voltage Energy-dispersive Spectroscopy Using A Low-voltage Scanning Electron Microscope
App 20150213995 - Muray; Lawrence P. ;   et al.
2015-07-30
Layered scanning charged particle apparatus package having an embedded heater
Grant 8,115,168 - Muray , et al. February 14, 2
2012-02-14
Layered scanning charged particle microscope package for a charged particle and radiation detector
Grant 8,110,801 - Indermuehle , et al. February 7, 2
2012-02-07
Layered scanning charged particle microscope with differential pumping aperture
Grant 8,106,358 - Spallas , et al. January 31, 2
2012-01-31
Integrated deflectors for beam alignment and blanking in charged particle columns
Grant 8,003,952 - Muray , et al. August 23, 2
2011-08-23
Layered Scanning Charged Particle Apparatus Package Having An Embedded Heater
App 20100224778 - Muray; Lawrence P. ;   et al.
2010-09-09
Layered Scanning Charged Particle Microscope Package For A Charged Particle And Radiation Detector
App 20100224779 - Indermuehle; Scott W. ;   et al.
2010-09-09
Layered Scanning Charged Particle Microscope With Differential Pumping Aperture
App 20100224777 - Spallas; James P. ;   et al.
2010-09-09
Integrated Deflectors For Beam Alignment And Blanking In Charged Particle Columns
App 20080217531 - Muray; Lawrence P. ;   et al.
2008-09-11
MEMS structure with mechanical overdeflection limiter
Grant 6,805,454 - Staker , et al. October 19, 2
2004-10-19
MEMS structure with raised electrodes
Grant 6,791,742 - Staker , et al. September 14, 2
2004-09-14
MEMS structure with raised electrodes
App 20040095629 - Staker, Bryan P. ;   et al.
2004-05-20
MEMS structure with surface potential control
Grant 6,693,735 - Muray , et al. February 17, 2
2004-02-17
MEMS structure with mechanical overdeflection limiter
App 20040001263 - Staker, Bryan P. ;   et al.
2004-01-01
MEMS structure with mechanical overdeflection limiter
Grant 6,641,273 - Staker , et al. November 4, 2
2003-11-04
Silicon on insulator standoff and method for manufacture thereof
App 20030197176 - Spallas, James P. ;   et al.
2003-10-23
Integrated microcolumn and scanning probe microscope arrays
Grant 6,369,385 - Muray , et al. April 9, 2
2002-04-09
Electrostatic alignment of a charged particle beam
Grant 6,288,401 - Chang , et al. September 11, 2
2001-09-11

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