Muray; Lawrence

Patent Applications and Registrations

Patent applications and USPTO patent grants for Muray; Lawrence.The latest application filed is for "apparatus and method of detecting secondary electrons".

Company Profile

1.7.2

Muray; Lawrence - Milpitas CA
Muray; Lawrence - Moraga CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Defect inspection and review using transmissive current image of charged particle beam system Grant 11,410,830 - Xiao , et al. August 9, 2	2022-08-09
Ultra-high sensitivity hybrid inspection with full wafer coverage capability Grant 10,545,099 - Chen , et al. Ja	2020-01-28
Array-based characterization tool Grant 10,438,769 - Lipkind , et al. O	2019-10-08
Apparatus And Method Of Detecting Secondary Electrons App 20080054180 - Silver; Charles ; et al.	2008-03-06
Stacked lens structure and method of use thereof for preventing electrical breakdown Grant 7,335,895 - Spallas , et al. February 26, 2	2008-02-26
System and method for multiple electron, ion, and photon beam alignment Grant 7,332,729 - Muray , et al. February 19, 2	2008-02-19
Layered electron beam column and method of use thereof Grant 7,109,486 - Spallas , et al. September 19, 2	2006-09-19
Stacked lens structure and method of use thereof for preventing electrical breakdown Grant 7,045,794 - Spallas , et al. May 16, 2	2006-05-16
Optical signal transmission for electron beam imaging apparatus App 20020145113 - Sullivan, Jeffrey ; et al.	2002-10-10

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