loadpatents
Patent applications and USPTO patent grants for Murakami; Eiichi.The latest application filed is for "ultrasonic flow amount measuring device".
Patent | Date |
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Clamp-on ultrasonic flow measuring device for accurately positioning on an existing flow tube of a specific shape Grant 11,340,101 - Murakami , et al. May 24, 2 | 2022-05-24 |
Clamp-type ultrasonic flow measuring apparatus with a mounter for press tight fit of a transmission/reception unit to the measuring pipe Grant 11,181,405 - Murakami , et al. November 23, 2 | 2021-11-23 |
Ultrasonic Flow Amount Measuring Device App 20200340838 - MURAKAMI; EIICHI ;   et al. | 2020-10-29 |
Ultrasonic Flow Measuring Apparatus App 20200132526 - MURAKAMI; EIICHI ;   et al. | 2020-04-30 |
Method For Manufacturing Measurement Pipeline Portion Of Ultrasonic Flow Meter App 20190353508 - MURAKAMI; EIICHI ;   et al. | 2019-11-21 |
Ultrasonic flowmeter having transceivers driving and radially pressing the flow tube to increase amplitude of the ultrasonic wave Grant 10,197,424 - Sato , et al. Fe | 2019-02-05 |
Ultrasonic flow meter Grant 10,175,076 - Murakami , et al. J | 2019-01-08 |
Coriolis mass flow meter Grant 10,175,078 - Murakami J | 2019-01-08 |
Ultrasonic Flow Meter App 20180283917 - MURAKAMI; EIICHI ;   et al. | 2018-10-04 |
Coriolis Mass Flow Meter App 20180283920 - Murakami; Eiichi | 2018-10-04 |
Coriolis mass flow meter Grant 9,995,612 - Murakami June 12, 2 | 2018-06-12 |
Coriolis mass flow meter Grant 9,921,093 - Murakami , et al. March 20, 2 | 2018-03-20 |
Coriolis Mass Flow Meter App 20170122787 - MURAKAMI; EIICHI | 2017-05-04 |
Coriolis Mass Flow Meter App 20170102257 - MURAKAMI; EIICHI ;   et al. | 2017-04-13 |
Ultrasonic type flowmeter apparatus and method of using the same Grant 9,588,934 - Murakami March 7, 2 | 2017-03-07 |
Ultrasonic Flowmeter App 20170059379 - SATO; Harumichi ;   et al. | 2017-03-02 |
Semiconductor integrated circuit device Grant 9,391,606 - Fukuo , et al. July 12, 2 | 2016-07-12 |
Semiconductor Integrated Circuit Device App 20150109046 - Fukuo; Noritaka ;   et al. | 2015-04-23 |
Flow rate measuring device Grant 8,997,581 - Sato , et al. April 7, 2 | 2015-04-07 |
Ultrasonic flowmeter apparatus having a first and a second housing part with grooves for clamping a resilient conduit Grant 8,919,208 - Murakami December 30, 2 | 2014-12-30 |
Ultrasonic flowmeter apparatus Grant 8,720,280 - Murakami May 13, 2 | 2014-05-13 |
Ultrasonic type flow sensor Grant 8,544,344 - Murakami October 1, 2 | 2013-10-01 |
Ultrasonic Flowmeter Apparatus App 20130180341 - MURAKAMI; Eiichi | 2013-07-18 |
Ultrasonic Type Flow Sensor App 20130118272 - MURAKAMI; Eiichi | 2013-05-16 |
Ultrasonic Type Flowmeter Apparatus And Method Of Using The Same App 20130124131 - MURAKAMI; Eiichi | 2013-05-16 |
Ultrasonic Flowmeter Apparatus App 20120318069 - Murakami; Eiichi | 2012-12-20 |
Flow Rate Measuring Device App 20120272747 - Sato; Harumichi ;   et al. | 2012-11-01 |
Method of manufacturing a semiconductor integrated circuit device Grant 8,093,723 - Funakoshi , et al. January 10, 2 | 2012-01-10 |
Method Of Manufacturing A Semiconductor Integrated Circuit Device App 20110204486 - FUNAKOSHI; Takako ;   et al. | 2011-08-25 |
Method of manufacturing a semiconductor integrated circuit device Grant 7,977,238 - Funakoshi , et al. July 12, 2 | 2011-07-12 |
Semiconductor integrated circuit device Grant 7,786,585 - Funakoshi , et al. August 31, 2 | 2010-08-31 |
Method Of Manufacturing A Semiconductor Integrated Circuit Device App 20100203724 - FUNAKOSHI; Takako ;   et al. | 2010-08-12 |
Fabrication System And Fabrication Method App 20100131093 - YOKOYAMA; Natsuki ;   et al. | 2010-05-27 |
Fabrication system and fabrication method Grant 7,603,194 - Yokoyama , et al. October 13, 2 | 2009-10-13 |
Semiconductor Integrated Circuit Device App 20080303158 - Funakoshi; Takako ;   et al. | 2008-12-11 |
Fabrication system and fabrication method App 20080243293 - Yokoyama; Natsuki ;   et al. | 2008-10-02 |
Semiconductor integrated circuit device Grant 7,411,301 - Funakoshi , et al. August 12, 2 | 2008-08-12 |
Fabrication system and fabrication method Grant 7,392,106 - Yokoyama , et al. June 24, 2 | 2008-06-24 |
Fabrication system and fabrication method Grant 7,310,563 - Yokoyama , et al. December 18, 2 | 2007-12-18 |
Exposure apparatus with interferometer Grant 7,236,254 - Kakuchi , et al. June 26, 2 | 2007-06-26 |
Fabrication system and fabrication method Grant 7,062,344 - Yokoyama , et al. June 13, 2 | 2006-06-13 |
Exposure apparatus with interferometer App 20060114476 - Kakuchi; Osamu ;   et al. | 2006-06-01 |
Fabrication system and fabrication method App 20060111802 - Yokoyama; Natsuki ;   et al. | 2006-05-25 |
Fabrication system and fabrication method App 20060111805 - Yokoyama; Natsuki ;   et al. | 2006-05-25 |
Exposure apparatus Grant 7,046,330 - Murakami May 16, 2 | 2006-05-16 |
Semiconductor integrated circuit device Grant 7,023,091 - Funakoshi , et al. April 4, 2 | 2006-04-04 |
Exposure apparatus with interferometer Grant 7,023,561 - Kakuchi , et al. April 4, 2 | 2006-04-04 |
Semiconductor integrated circuit device App 20060027928 - Funakoshi; Takako ;   et al. | 2006-02-09 |
Exposure apparatus App 20060007416 - Murakami; Eiichi | 2006-01-12 |
Exposure apparatus Grant 6,962,825 - Murakami November 8, 2 | 2005-11-08 |
Semiconductor device and method of manufacturing thereof Grant 6,953,728 - Murakami , et al. October 11, 2 | 2005-10-11 |
Projection exposure apparatus Grant 6,924,881 - Murakami , et al. August 2, 2 | 2005-08-02 |
Exposure apparatus with interferometer App 20050099635 - Kakuchi, Osamu ;   et al. | 2005-05-12 |
Stocker, exposure apparatus, device manufacturing method, semiconductor manufacturing factory, and exposure apparatus maintenance method Grant 6,826,442 - Takeuchi , et al. November 30, 2 | 2004-11-30 |
Semiconductor device and method of manufacturing thereof App 20040198002 - Murakami, Eiichi ;   et al. | 2004-10-07 |
Exposure apparatus, method of manufacturing semiconductor devices and plant therefor Grant 6,795,161 - Ogura , et al. September 21, 2 | 2004-09-21 |
Fabrication system and fabrication method App 20040107020 - Yokoyama, Natsuki ;   et al. | 2004-06-03 |
Semiconductor device and method of manufacturing thereof Grant 6,727,146 - Murakami , et al. April 27, 2 | 2004-04-27 |
Semiconductor integrated circuit device App 20040065961 - Funakoshi, Takako ;   et al. | 2004-04-08 |
Projection exposure apparatus App 20040036883 - Murakami, Eiichi ;   et al. | 2004-02-26 |
Method of manufacturing a semiconductor integrated circuit device Grant 6,677,194 - Yamanaka , et al. January 13, 2 | 2004-01-13 |
Projection exposure apparatus Grant 6,633,362 - Murakami , et al. October 14, 2 | 2003-10-14 |
Exposure apparatus with interferometer Grant 6,614,535 - Kakuchi , et al. September 2, 2 | 2003-09-02 |
Diffractive optical element and method of manufacturing the same Grant 6,611,376 - Murakami , et al. August 26, 2 | 2003-08-26 |
Projection Exposure Apparatus App 20030128346 - Murakami, Eiichi ;   et al. | 2003-07-10 |
Method of manufacturing an element with multiple-level surface Grant 6,569,608 - Tanaka , et al. May 27, 2 | 2003-05-27 |
Semiconductor device and method of manufacturing thereof App 20030054613 - Murakami, Eiichi ;   et al. | 2003-03-20 |
Method of manufacturing a semiconductor integrated circuit device App 20020187596 - Yamanaka, Toshiaki ;   et al. | 2002-12-12 |
Semiconductor device and method of manufacturing thereof App 20020045360 - Murakami, Eiichi ;   et al. | 2002-04-18 |
Method Of Manufacturing An Element With Multiple-level Surface, Such As A Diffractive Optical Element App 20020042024 - TANAKA, ICHIRO ;   et al. | 2002-04-11 |
Exposure apparatus App 20010055100 - Murakami, Eiichi | 2001-12-27 |
Exposure apparatus, method of manufacturing semiconductor devices and plant therefor App 20010052967 - Ogura, Masaya ;   et al. | 2001-12-20 |
Stocker, exposure apparatus, device manufacturing method, semiconductor manufacturing factory, and exposure apparatus maintenance method App 20010027351 - Takeuchi, Seiji ;   et al. | 2001-10-04 |
Fabrication system and fabrication method Grant 6,099,598 - Yokoyama , et al. August 8, 2 | 2000-08-08 |
Fabrication system and method having inter-apparatus transporter Grant 5,858,863 - Yokoyama , et al. January 12, 1 | 1999-01-12 |
Fabrication system and method having inter-apparatus transporter Grant 5,820,679 - Yokoyama , et al. October 13, 1 | 1998-10-13 |
Exposure apparatus and method wherein alignment is carried out by comparing marks which are incident on both reticle stage and wafer stage reference plates Grant 5,751,404 - Murakami , et al. May 12, 1 | 1998-05-12 |
Alignment method and semiconductor exposure method Grant 5,695,897 - Mitome , et al. December 9, 1 | 1997-12-09 |
Surface atom fabrication method and apparatus Grant 5,689,494 - Ichikawa , et al. November 18, 1 | 1997-11-18 |
Wafer transport method Grant 5,601,686 - Kawamura , et al. February 11, 1 | 1997-02-11 |
Wafer transport method Grant 5,562,800 - Kawamura , et al. October 8, 1 | 1996-10-08 |
Surface atom fabrication method and apparatus Grant 5,416,331 - Ichikawa , et al. May 16, 1 | 1995-05-16 |
Semiconductor projections having layers with different lattice constants Grant 5,338,942 - Nishida , et al. August 16, 1 | 1994-08-16 |
Transistor provided with strained germanium layer Grant 5,241,197 - Murakami , et al. August 31, 1 | 1993-08-31 |
Apparatus for effecting massage with water stream Grant 5,083,329 - Murakami January 28, 1 | 1992-01-28 |
Surface examining apparatus for detecting the presence of foreign particles on two or more surfaces Grant 5,017,798 - Murakami , et al. May 21, 1 | 1991-05-21 |
Alignment method in a wafer prober Grant 4,934,064 - Yamaguchi , et al. June 19, 1 | 1990-06-19 |
Wafer prober Grant 4,929,893 - Sato , et al. May 29, 1 | 1990-05-29 |
Fluid flow massaging apparatus Grant 4,903,352 - Murakami February 27, 1 | 1990-02-27 |
Surface examining apparatus for detecting the presence of foreign particles on two or more surfaces Grant 4,886,975 - Murakami , et al. December 12, 1 | 1989-12-12 |
SOI process for forming a thin film transistor using solid phase epitaxy Grant 4,808,546 - Moniwa , et al. February 28, 1 | 1989-02-28 |
Surface examining apparatus for detecting the presence of foreign particles on the surface Grant 4,795,911 - Kohno , et al. January 3, 1 | 1989-01-03 |
Plasma treatment system Grant 4,683,838 - Kimura , et al. August 4, 1 | 1987-08-04 |
Porous membrane Grant 4,459,210 - Murakami , et al. July 10, 1 | 1984-07-10 |
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