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name:-0.053500890731812
name:-0.064264059066772
name:-0.0058329105377197
Murakami; Eiichi Patent Filings

Murakami; Eiichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Murakami; Eiichi.The latest application filed is for "ultrasonic flow amount measuring device".

Company Profile
4.60.38
  • Murakami; Eiichi - Okinawa-ken JP
  • Murakami; Eiichi - Tokyo JP
  • Murakami; Eiichi - Kawasaki JP
  • Murakami; Eiichi - Kawasaki-shi JP
  • Murakami; Eiichi - Katsushika-ku JP
  • Murakami; Eiichi - Saitama JP
  • Murakami; Eiichi - Tokorozawa JP
  • Murakami; Eiichi - Tokorozawa-shi JP
  • Murakami; Eiichi - Utsunomiya JP
  • Murakami; Eiichi - Utsunomiya-shi JP
  • Murakami; Eiichi - Tochigi JP
  • Murakami; Eiichi - Hachioji JP
  • Murakami; Eiichi - Fuchu JP
  • Murakami; Eiichi - Bunkyo-ku Tokyo JP
  • Murakami; Eiichi - Yokohama JP
  • Murakami; Eiichi - Chiba JP
  • Murakami; Eiichi - Kokubunji JP
  • Murakami; Eiichi - Yamaguchi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Clamp-on ultrasonic flow measuring device for accurately positioning on an existing flow tube of a specific shape
Grant 11,340,101 - Murakami , et al. May 24, 2
2022-05-24
Clamp-type ultrasonic flow measuring apparatus with a mounter for press tight fit of a transmission/reception unit to the measuring pipe
Grant 11,181,405 - Murakami , et al. November 23, 2
2021-11-23
Ultrasonic Flow Amount Measuring Device
App 20200340838 - MURAKAMI; EIICHI ;   et al.
2020-10-29
Ultrasonic Flow Measuring Apparatus
App 20200132526 - MURAKAMI; EIICHI ;   et al.
2020-04-30
Method For Manufacturing Measurement Pipeline Portion Of Ultrasonic Flow Meter
App 20190353508 - MURAKAMI; EIICHI ;   et al.
2019-11-21
Ultrasonic flowmeter having transceivers driving and radially pressing the flow tube to increase amplitude of the ultrasonic wave
Grant 10,197,424 - Sato , et al. Fe
2019-02-05
Ultrasonic flow meter
Grant 10,175,076 - Murakami , et al. J
2019-01-08
Coriolis mass flow meter
Grant 10,175,078 - Murakami J
2019-01-08
Ultrasonic Flow Meter
App 20180283917 - MURAKAMI; EIICHI ;   et al.
2018-10-04
Coriolis Mass Flow Meter
App 20180283920 - Murakami; Eiichi
2018-10-04
Coriolis mass flow meter
Grant 9,995,612 - Murakami June 12, 2
2018-06-12
Coriolis mass flow meter
Grant 9,921,093 - Murakami , et al. March 20, 2
2018-03-20
Coriolis Mass Flow Meter
App 20170122787 - MURAKAMI; EIICHI
2017-05-04
Coriolis Mass Flow Meter
App 20170102257 - MURAKAMI; EIICHI ;   et al.
2017-04-13
Ultrasonic type flowmeter apparatus and method of using the same
Grant 9,588,934 - Murakami March 7, 2
2017-03-07
Ultrasonic Flowmeter
App 20170059379 - SATO; Harumichi ;   et al.
2017-03-02
Semiconductor integrated circuit device
Grant 9,391,606 - Fukuo , et al. July 12, 2
2016-07-12
Semiconductor Integrated Circuit Device
App 20150109046 - Fukuo; Noritaka ;   et al.
2015-04-23
Flow rate measuring device
Grant 8,997,581 - Sato , et al. April 7, 2
2015-04-07
Ultrasonic flowmeter apparatus having a first and a second housing part with grooves for clamping a resilient conduit
Grant 8,919,208 - Murakami December 30, 2
2014-12-30
Ultrasonic flowmeter apparatus
Grant 8,720,280 - Murakami May 13, 2
2014-05-13
Ultrasonic type flow sensor
Grant 8,544,344 - Murakami October 1, 2
2013-10-01
Ultrasonic Flowmeter Apparatus
App 20130180341 - MURAKAMI; Eiichi
2013-07-18
Ultrasonic Type Flow Sensor
App 20130118272 - MURAKAMI; Eiichi
2013-05-16
Ultrasonic Type Flowmeter Apparatus And Method Of Using The Same
App 20130124131 - MURAKAMI; Eiichi
2013-05-16
Ultrasonic Flowmeter Apparatus
App 20120318069 - Murakami; Eiichi
2012-12-20
Flow Rate Measuring Device
App 20120272747 - Sato; Harumichi ;   et al.
2012-11-01
Method of manufacturing a semiconductor integrated circuit device
Grant 8,093,723 - Funakoshi , et al. January 10, 2
2012-01-10
Method Of Manufacturing A Semiconductor Integrated Circuit Device
App 20110204486 - FUNAKOSHI; Takako ;   et al.
2011-08-25
Method of manufacturing a semiconductor integrated circuit device
Grant 7,977,238 - Funakoshi , et al. July 12, 2
2011-07-12
Semiconductor integrated circuit device
Grant 7,786,585 - Funakoshi , et al. August 31, 2
2010-08-31
Method Of Manufacturing A Semiconductor Integrated Circuit Device
App 20100203724 - FUNAKOSHI; Takako ;   et al.
2010-08-12
Fabrication System And Fabrication Method
App 20100131093 - YOKOYAMA; Natsuki ;   et al.
2010-05-27
Fabrication system and fabrication method
Grant 7,603,194 - Yokoyama , et al. October 13, 2
2009-10-13
Semiconductor Integrated Circuit Device
App 20080303158 - Funakoshi; Takako ;   et al.
2008-12-11
Fabrication system and fabrication method
App 20080243293 - Yokoyama; Natsuki ;   et al.
2008-10-02
Semiconductor integrated circuit device
Grant 7,411,301 - Funakoshi , et al. August 12, 2
2008-08-12
Fabrication system and fabrication method
Grant 7,392,106 - Yokoyama , et al. June 24, 2
2008-06-24
Fabrication system and fabrication method
Grant 7,310,563 - Yokoyama , et al. December 18, 2
2007-12-18
Exposure apparatus with interferometer
Grant 7,236,254 - Kakuchi , et al. June 26, 2
2007-06-26
Fabrication system and fabrication method
Grant 7,062,344 - Yokoyama , et al. June 13, 2
2006-06-13
Exposure apparatus with interferometer
App 20060114476 - Kakuchi; Osamu ;   et al.
2006-06-01
Fabrication system and fabrication method
App 20060111802 - Yokoyama; Natsuki ;   et al.
2006-05-25
Fabrication system and fabrication method
App 20060111805 - Yokoyama; Natsuki ;   et al.
2006-05-25
Exposure apparatus
Grant 7,046,330 - Murakami May 16, 2
2006-05-16
Semiconductor integrated circuit device
Grant 7,023,091 - Funakoshi , et al. April 4, 2
2006-04-04
Exposure apparatus with interferometer
Grant 7,023,561 - Kakuchi , et al. April 4, 2
2006-04-04
Semiconductor integrated circuit device
App 20060027928 - Funakoshi; Takako ;   et al.
2006-02-09
Exposure apparatus
App 20060007416 - Murakami; Eiichi
2006-01-12
Exposure apparatus
Grant 6,962,825 - Murakami November 8, 2
2005-11-08
Semiconductor device and method of manufacturing thereof
Grant 6,953,728 - Murakami , et al. October 11, 2
2005-10-11
Projection exposure apparatus
Grant 6,924,881 - Murakami , et al. August 2, 2
2005-08-02
Exposure apparatus with interferometer
App 20050099635 - Kakuchi, Osamu ;   et al.
2005-05-12
Stocker, exposure apparatus, device manufacturing method, semiconductor manufacturing factory, and exposure apparatus maintenance method
Grant 6,826,442 - Takeuchi , et al. November 30, 2
2004-11-30
Semiconductor device and method of manufacturing thereof
App 20040198002 - Murakami, Eiichi ;   et al.
2004-10-07
Exposure apparatus, method of manufacturing semiconductor devices and plant therefor
Grant 6,795,161 - Ogura , et al. September 21, 2
2004-09-21
Fabrication system and fabrication method
App 20040107020 - Yokoyama, Natsuki ;   et al.
2004-06-03
Semiconductor device and method of manufacturing thereof
Grant 6,727,146 - Murakami , et al. April 27, 2
2004-04-27
Semiconductor integrated circuit device
App 20040065961 - Funakoshi, Takako ;   et al.
2004-04-08
Projection exposure apparatus
App 20040036883 - Murakami, Eiichi ;   et al.
2004-02-26
Method of manufacturing a semiconductor integrated circuit device
Grant 6,677,194 - Yamanaka , et al. January 13, 2
2004-01-13
Projection exposure apparatus
Grant 6,633,362 - Murakami , et al. October 14, 2
2003-10-14
Exposure apparatus with interferometer
Grant 6,614,535 - Kakuchi , et al. September 2, 2
2003-09-02
Diffractive optical element and method of manufacturing the same
Grant 6,611,376 - Murakami , et al. August 26, 2
2003-08-26
Projection Exposure Apparatus
App 20030128346 - Murakami, Eiichi ;   et al.
2003-07-10
Method of manufacturing an element with multiple-level surface
Grant 6,569,608 - Tanaka , et al. May 27, 2
2003-05-27
Semiconductor device and method of manufacturing thereof
App 20030054613 - Murakami, Eiichi ;   et al.
2003-03-20
Method of manufacturing a semiconductor integrated circuit device
App 20020187596 - Yamanaka, Toshiaki ;   et al.
2002-12-12
Semiconductor device and method of manufacturing thereof
App 20020045360 - Murakami, Eiichi ;   et al.
2002-04-18
Method Of Manufacturing An Element With Multiple-level Surface, Such As A Diffractive Optical Element
App 20020042024 - TANAKA, ICHIRO ;   et al.
2002-04-11
Exposure apparatus
App 20010055100 - Murakami, Eiichi
2001-12-27
Exposure apparatus, method of manufacturing semiconductor devices and plant therefor
App 20010052967 - Ogura, Masaya ;   et al.
2001-12-20
Stocker, exposure apparatus, device manufacturing method, semiconductor manufacturing factory, and exposure apparatus maintenance method
App 20010027351 - Takeuchi, Seiji ;   et al.
2001-10-04
Fabrication system and fabrication method
Grant 6,099,598 - Yokoyama , et al. August 8, 2
2000-08-08
Fabrication system and method having inter-apparatus transporter
Grant 5,858,863 - Yokoyama , et al. January 12, 1
1999-01-12
Fabrication system and method having inter-apparatus transporter
Grant 5,820,679 - Yokoyama , et al. October 13, 1
1998-10-13
Exposure apparatus and method wherein alignment is carried out by comparing marks which are incident on both reticle stage and wafer stage reference plates
Grant 5,751,404 - Murakami , et al. May 12, 1
1998-05-12
Alignment method and semiconductor exposure method
Grant 5,695,897 - Mitome , et al. December 9, 1
1997-12-09
Surface atom fabrication method and apparatus
Grant 5,689,494 - Ichikawa , et al. November 18, 1
1997-11-18
Wafer transport method
Grant 5,601,686 - Kawamura , et al. February 11, 1
1997-02-11
Wafer transport method
Grant 5,562,800 - Kawamura , et al. October 8, 1
1996-10-08
Surface atom fabrication method and apparatus
Grant 5,416,331 - Ichikawa , et al. May 16, 1
1995-05-16
Semiconductor projections having layers with different lattice constants
Grant 5,338,942 - Nishida , et al. August 16, 1
1994-08-16
Transistor provided with strained germanium layer
Grant 5,241,197 - Murakami , et al. August 31, 1
1993-08-31
Apparatus for effecting massage with water stream
Grant 5,083,329 - Murakami January 28, 1
1992-01-28
Surface examining apparatus for detecting the presence of foreign particles on two or more surfaces
Grant 5,017,798 - Murakami , et al. May 21, 1
1991-05-21
Alignment method in a wafer prober
Grant 4,934,064 - Yamaguchi , et al. June 19, 1
1990-06-19
Wafer prober
Grant 4,929,893 - Sato , et al. May 29, 1
1990-05-29
Fluid flow massaging apparatus
Grant 4,903,352 - Murakami February 27, 1
1990-02-27
Surface examining apparatus for detecting the presence of foreign particles on two or more surfaces
Grant 4,886,975 - Murakami , et al. December 12, 1
1989-12-12
SOI process for forming a thin film transistor using solid phase epitaxy
Grant 4,808,546 - Moniwa , et al. February 28, 1
1989-02-28
Surface examining apparatus for detecting the presence of foreign particles on the surface
Grant 4,795,911 - Kohno , et al. January 3, 1
1989-01-03
Plasma treatment system
Grant 4,683,838 - Kimura , et al. August 4, 1
1987-08-04
Porous membrane
Grant 4,459,210 - Murakami , et al. July 10, 1
1984-07-10

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