Mule'Stagno; Luciano

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mule'Stagno; Luciano.The latest application filed is for "process for making silicon wafers with stabilized oxygen precipitate nucleation centers".

Company Profile

0.5.7

Mule'Stagno; Luciano - St. Louis MO
MULE'STAGNO, LUCIANO - ST. PETERS MO

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Process for making silicon wafers with stabilized oxygen precipitate nucleation centers Grant 7,201,800 - Mule'Stagno , et al. April 10, 2	2007-04-10
Single crystal silicon wafer having an epitaxial layer substantially free from grown-in defects Grant 7,097,718 - Mule'Stagno , et al. August 29, 2	2006-08-29
Process for making silicon wafers with stabilized oxygen precipitate nucleation centers App 20050048247 - Mule'Stagno, Luciano ; et al.	2005-03-03
Silicon wafers with stabilized oxygen precipitate nucleation centers and process for making the same Grant 6,808,781 - Mule'Stagno , et al. October 26, 2	2004-10-26
Single crystal silicon wafer having an epitaxial layer substantially free from grown-in defects App 20030205191 - Mule ' Stagno, Luciano ; et al.	2003-11-06
Method for revealing agglomerated intrinsic point defects in semiconductor crystals Grant 6,638,357 - Mule'Stagno , et al. October 28, 2	2003-10-28
Process for suppressing the nucleation and/or growth of interstitial type defects by controlling the cooling rate through nucleation App 20030196587 - McCallum, Kirk D. ; et al.	2003-10-23
Method for producing czochralski silicon free of agglomerated self-interstitial defects Grant 6,635,587 - Mule'Stagno , et al. October 21, 2	2003-10-21
Ideal oxygen precipitating silicon wafers with nitrogen/carbon stabilized oxygen precipitate nucleation centers and process for making the same App 20030136961 - Mule'Stagno, Luciano ; et al.	2003-07-24
Silicon wafers substantially free of oxidation induced stacking faults App 20020084451 - Mohr, Thomas C. ; et al.	2002-07-04
Low Defect Density, Self-interstitial Dominated Silicon App 20020007779 - MULE'STAGNO, LUCIANO ; et al.	2002-01-24
Epitaxial silicon wafers substantially free of grown-in defects App 20010039916 - Mule' Stagno, Luciano ; et al.	2001-11-15

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