Mukundhan; Priya

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mukundhan; Priya.The latest application filed is for "characterization of patterned structures using acoustic metrology".

Company Profile

1.5.8

Mukundhan; Priya - Lake Hopatcong NJ
MUKUNDHAN; Priya - US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Characterization Of Patterned Structures Using Acoustic Metrology App 20210318270 - Mehendale; Manjusha ; et al.	2021-10-14
Calibration of semiconductor metrology systems Grant 10,173,249 - Ding , et al. J	2019-01-08
Non-destructive acoustic metrology for void detection Grant 9,991,176 - Mehendale , et al. June 5, 2	2018-06-05
Non-destructive Acoustic Metrology For Void Detection App 20170221778 - MEHENDALE; Manjusha ; et al.	2017-08-03
Optical acoustic substrate assessment system and method Grant 9,576,862 - Murray , et al. February 21, 2	2017-02-21
Calibration Of Semiconductor Metrology Systems App 20160101445 - Ding; Jian ; et al.	2016-04-14
Optical Acoustic Substrate Assessment System And Method App 20160043008 - MURRAY; Todd ; et al.	2016-02-11
Position Sensitive Detection Optimization App 20140103188 - Mehendale; Manjusha ; et al.	2014-04-17
Characterization with picosecond ultrasonics of metal portions of samples potentially subject to erosion Grant 8,312,772 - Tas , et al. November 20, 2	2012-11-20
Characterization With Picosecond Ultrasonics Of Metal Portions Of Samples Potentially Subject To Erosion App 20100281981 - Tas; Guray ; et al.	2010-11-11

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