Mozumder; Purnendu K.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Mozumder; Purnendu K..The latest application filed is for "system and method for product yield prediction".

Company Profile

0.14.5

Mozumder; Purnendu K. - Plano TX
Mozumder; Purnendu K. - Dallas TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for product yield prediction Grant 7,673,262 - Stine , et al. March 2, 2	2010-03-02
System And Method For Product Yield Prediction App 20080282210 - Stine; Brian E. ; et al.	2008-11-13
System and method for product yield prediction Grant 7,373,625 - Stine , et al. May 13, 2	2008-05-13
System and method for product yield prediction Grant 7,356,800 - Stine , et al. April 8, 2	2008-04-08
System and method for product yield prediction App 20070118242 - Stine; Brian E. ; et al.	2007-05-24
System and method for product yield prediction Grant 7,174,521 - Stine , et al. February 6, 2	2007-02-06
System and method for product yield prediction App 20060277506 - Stine; Brian E. ; et al.	2006-12-07
System and method for product yield prediction App 20050158888 - Stine, Brian E. ; et al.	2005-07-21
System and method for product yield prediction Grant 6,901,564 - Stine , et al. May 31, 2	2005-05-31
System and method for product yield prediction App 20030145292 - Stine, Brian E. ; et al.	2003-07-31
Method and system for using response-surface methodologies to determine optimal tuning parameters for complex simulators Grant 6,381,564 - Davis , et al. April 30, 2	2002-04-30
Design of microelectronic process flows for manufacturability and performance Grant 6,311,096 - Saxena , et al. October 30, 2	2001-10-30
Process flow design at the module effects level through the use of acceptability regions Grant 5,912,678 - Saxena , et al. June 15, 1	1999-06-15
Apparatus and method for model based process control Grant 5,838,595 - Sullivan , et al. November 17, 1	1998-11-17
Controlling process modules using site models and monitor wafer control Grant 5,751,582 - Saxena , et al. May 12, 1	1998-05-12
Use of spatial models for simultaneous control of various non-uniformity metrics Grant 5,546,312 - Mozumder , et al. August 13, 1	1996-08-13
System and method for controlling semiconductor wafer processing Grant 5,526,293 - Mozumder , et al. June 11, 1	1996-06-11
Multi-variable statistical process controller for discrete manufacturing Grant 5,408,405 - Mozumder , et al. April 18, 1	1995-04-18
Apparatus and method for model based process control Grant 5,402,367 - Sullivan , et al. March 28, 1	1995-03-28

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