loadpatents
name:-0.0081009864807129
name:-0.0083589553833008
name:-0.0016069412231445
Motoki; Hiroshi Patent Filings

Motoki; Hiroshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Motoki; Hiroshi.The latest application filed is for "composite and method for manufacturing same".

Company Profile
1.6.7
  • Motoki; Hiroshi - Saitama JP
  • Motoki; Hiroshi - Mie JP
  • Motoki; Hiroshi - Yokohama JP
  • Motoki; Hiroshi - Yokohama-Shi JP
  • Motoki; Hiroshi - Kawasaki JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method of manufacturing a composite
Grant 10,456,965 - Tatsuno , et al. Oc
2019-10-29
Light flux controlling member, light emitting device and method for manufacturing light flux controlling member
Grant 10,203,089 - Tatsuno , et al. Feb
2019-02-12
Composite And Method For Manufacturing Same
App 20180029263 - TATSUNO; Shuji ;   et al.
2018-02-01
Light Flux Controlling Member, Light Emitting Device And Method For Manufacturing Light Flux Controlling Member
App 20180010771 - TATSUNO; Shuji ;   et al.
2018-01-11
Mask Conveying System And Mask Conveying Adapter
App 20120109364 - HARADA; Hisashi ;   et al.
2012-05-03
Pattern inspection method, pattern inspection apparatus, semiconductor device manufacturing method, and program
Grant 7,732,763 - Motoki June 8, 2
2010-06-08
Pattern observation apparatus, pattern observation method, method of manufacturing semiconductor device, and program
Grant 7,554,082 - Motoki June 30, 2
2009-06-30
Charged particle beam apparatus, charged particle beam focusing method, microstructure measuring method, microstructure inspecting method, semiconductor device manufacturing method, and program
Grant 7,521,678 - Abe , et al. April 21, 2
2009-04-21
Pattern inspection method, pattern inspection apparatus, semiconductor device manufacturing method, and program
App 20070194233 - Motoki; Hiroshi
2007-08-23
Charged particle beam apparatus, charged particle beam focusing method, microstructure measuring method, microstructure inspecting method, semiconductor device manufacturing method, and program
App 20070187599 - Abe; Hideaki ;   et al.
2007-08-16
Pattern observation apparatus, pattern observation method, method of manufacturing semiconductor device, and program
App 20070085006 - Motoki; Hiroshi
2007-04-19
Pattern measuring method, pattern measuring apparatus, photo mask manufacturing method, semiconductor device manufacturing method, and computer program product
App 20060039596 - Nojima; Shigeki ;   et al.
2006-02-23
Method and apparatus for processing pattern image data by SEM
Grant 5,887,080 - Tsubusaki , et al. March 23, 1
1999-03-23

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